DE3500640C2 - Akustisches Abtastmikroskop - Google Patents
Akustisches AbtastmikroskopInfo
- Publication number
- DE3500640C2 DE3500640C2 DE3500640A DE3500640A DE3500640C2 DE 3500640 C2 DE3500640 C2 DE 3500640C2 DE 3500640 A DE3500640 A DE 3500640A DE 3500640 A DE3500640 A DE 3500640A DE 3500640 C2 DE3500640 C2 DE 3500640C2
- Authority
- DE
- Germany
- Prior art keywords
- sample
- acoustic impedance
- cover element
- acoustic
- propagation medium
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 12
- 230000005540 biological transmission Effects 0.000 claims description 5
- 239000007788 liquid Substances 0.000 claims description 2
- 229920006254 polymer film Polymers 0.000 claims description 2
- 238000009826 distribution Methods 0.000 description 4
- 230000002349 favourable effect Effects 0.000 description 4
- 229910000831 Steel Inorganic materials 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000002504 physiological saline solution Substances 0.000 description 2
- 239000010959 steel Substances 0.000 description 2
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- FAPWRFPIFSIZLT-UHFFFAOYSA-M Sodium chloride Chemical compound [Na+].[Cl-] FAPWRFPIFSIZLT-UHFFFAOYSA-M 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 239000011888 foil Substances 0.000 description 1
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 1
- 229910001385 heavy metal Inorganic materials 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 230000000873 masking effect Effects 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000035699 permeability Effects 0.000 description 1
- 229920003223 poly(pyromellitimide-1,4-diphenyl ether) Polymers 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 239000009719 polyimide resin Substances 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 238000001028 reflection method Methods 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000012266 salt solution Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 238000010186 staining Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 238000002604 ultrasonography Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/04—Analysing solids
- G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
-
- G—PHYSICS
- G10—MUSICAL INSTRUMENTS; ACOUSTICS
- G10K—SOUND-PRODUCING DEVICES; METHODS OR DEVICES FOR PROTECTING AGAINST, OR FOR DAMPING, NOISE OR OTHER ACOUSTIC WAVES IN GENERAL; ACOUSTICS NOT OTHERWISE PROVIDED FOR
- G10K11/00—Methods or devices for transmitting, conducting or directing sound in general; Methods or devices for protecting against, or for damping, noise or other acoustic waves in general
- G10K11/02—Mechanical acoustic impedances; Impedance matching, e.g. by horns; Acoustic resonators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/02—Indexing codes associated with the analysed material
- G01N2291/028—Material parameters
- G01N2291/02854—Length, thickness
Landscapes
- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Chemical & Material Sciences (AREA)
- Multimedia (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Engineering & Computer Science (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
- Ultra Sonic Daignosis Equipment (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59001947A JPS60146152A (ja) | 1984-01-11 | 1984-01-11 | 超音波顕微鏡 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE3500640A1 DE3500640A1 (de) | 1985-07-18 |
| DE3500640C2 true DE3500640C2 (de) | 1986-07-03 |
Family
ID=11515804
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE3500640A Expired DE3500640C2 (de) | 1984-01-11 | 1985-01-10 | Akustisches Abtastmikroskop |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US4597293A (en:Method) |
| JP (1) | JPS60146152A (en:Method) |
| CA (1) | CA1225733A (en:Method) |
| DE (1) | DE3500640C2 (en:Method) |
| GB (1) | GB2153997B (en:Method) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2602043B1 (fr) * | 1986-07-24 | 1990-10-12 | France Etat | Procede de mesure non destructive du profil d'une surface |
| US5627320A (en) * | 1988-03-23 | 1997-05-06 | Texas Instruments Incorporated | Apparatus and method for automated non-destructive inspection of integrated circuit packages |
| CN1019919C (zh) * | 1990-03-08 | 1993-02-17 | 清华大学 | 具有新型声镜的反射式声显微镜 |
| US5922961A (en) * | 1996-05-10 | 1999-07-13 | The United States Of America As Represented By The Secretary Of Commerce | Time and polarization resolved acoustic microscope |
| DE10151593A1 (de) * | 2001-10-18 | 2003-04-30 | Contitech Luftfedersyst Gmbh | Abstands- und Druckmessung innerhalb einer Luftfeder |
| US7725167B2 (en) * | 2005-07-13 | 2010-05-25 | Clemson University | Microwave imaging assisted ultrasonically |
| JP5124741B2 (ja) * | 2006-03-13 | 2013-01-23 | 本多電子株式会社 | 音響インピーダンス測定方法、及び音響インピーダンス測定装置 |
| JP5130451B2 (ja) * | 2007-02-27 | 2013-01-30 | 国立大学法人豊橋技術科学大学 | 音響パラメータ測定装置、音響パラメータ測定装置用の試料支持体、音響パラメータ測定方法、及び超音波脳組織観察方法 |
| JP2015090281A (ja) * | 2013-11-05 | 2015-05-11 | パナソニックＩｐマネジメント株式会社 | 超音波測定方法および装置 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4205686A (en) * | 1977-09-09 | 1980-06-03 | Picker Corporation | Ultrasonic transducer and examination method |
| US4503708A (en) * | 1983-02-07 | 1985-03-12 | Board Of Trustees Of The Leland Stanford Junior University | Reflection acoustic microscope for precision differential phase imaging |
-
1984
- 1984-01-11 JP JP59001947A patent/JPS60146152A/ja active Granted
-
1985
- 1985-01-09 CA CA000471796A patent/CA1225733A/en not_active Expired
- 1985-01-09 US US06/689,955 patent/US4597293A/en not_active Expired - Fee Related
- 1985-01-10 DE DE3500640A patent/DE3500640C2/de not_active Expired
- 1985-01-10 GB GB08500641A patent/GB2153997B/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| US4597293A (en) | 1986-07-01 |
| GB2153997A (en) | 1985-08-29 |
| CA1225733A (en) | 1987-08-18 |
| GB2153997B (en) | 1987-06-10 |
| JPH0330105B2 (en:Method) | 1991-04-26 |
| GB8500641D0 (en) | 1985-02-13 |
| DE3500640A1 (de) | 1985-07-18 |
| JPS60146152A (ja) | 1985-08-01 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OP8 | Request for examination as to paragraph 44 patent law | ||
| D2 | Grant after examination | ||
| 8363 | Opposition against the patent | ||
| 8365 | Fully valid after opposition proceedings | ||
| 8339 | Ceased/non-payment of the annual fee |