JPS60135805A - パタ−ン検出方法及びその装置 - Google Patents
パタ−ン検出方法及びその装置Info
- Publication number
- JPS60135805A JPS60135805A JP24384783A JP24384783A JPS60135805A JP S60135805 A JPS60135805 A JP S60135805A JP 24384783 A JP24384783 A JP 24384783A JP 24384783 A JP24384783 A JP 24384783A JP S60135805 A JPS60135805 A JP S60135805A
- Authority
- JP
- Japan
- Prior art keywords
- light
- fluorescence
- printed circuit
- circuit board
- base material
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP24384783A JPS60135805A (ja) | 1983-12-26 | 1983-12-26 | パタ−ン検出方法及びその装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP24384783A JPS60135805A (ja) | 1983-12-26 | 1983-12-26 | パタ−ン検出方法及びその装置 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15473092A Division JPH0676884B2 (ja) | 1992-06-15 | 1992-06-15 | パターン検出方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS60135805A true JPS60135805A (ja) | 1985-07-19 |
JPH0476042B2 JPH0476042B2 (enrdf_load_stackoverflow) | 1992-12-02 |
Family
ID=17109832
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP24384783A Granted JPS60135805A (ja) | 1983-12-26 | 1983-12-26 | パタ−ン検出方法及びその装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60135805A (enrdf_load_stackoverflow) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62207904A (ja) * | 1986-03-07 | 1987-09-12 | Mitsubishi Monsanto Chem Co | ウエハ−発光波長及び面積測定装置 |
US6187417B1 (en) | 1998-02-18 | 2001-02-13 | International Business Machines Corporation | Substrate having high optical contrast and method of making same |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS52114483A (en) * | 1976-03-18 | 1977-09-26 | Agfa Gevaert Nv | Improvement for radioactiveeray conversion screens |
JPS5447579A (en) * | 1977-09-22 | 1979-04-14 | Hitachi Ltd | Develping condiction inspecting method in photoetching |
-
1983
- 1983-12-26 JP JP24384783A patent/JPS60135805A/ja active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS52114483A (en) * | 1976-03-18 | 1977-09-26 | Agfa Gevaert Nv | Improvement for radioactiveeray conversion screens |
JPS5447579A (en) * | 1977-09-22 | 1979-04-14 | Hitachi Ltd | Develping condiction inspecting method in photoetching |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62207904A (ja) * | 1986-03-07 | 1987-09-12 | Mitsubishi Monsanto Chem Co | ウエハ−発光波長及び面積測定装置 |
US6187417B1 (en) | 1998-02-18 | 2001-02-13 | International Business Machines Corporation | Substrate having high optical contrast and method of making same |
Also Published As
Publication number | Publication date |
---|---|
JPH0476042B2 (enrdf_load_stackoverflow) | 1992-12-02 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4816686A (en) | Method and apparatus for detecting wiring patterns | |
US5216479A (en) | Optical inspection system for distinguishing between first and second components in a laminate | |
JP3617547B2 (ja) | 配線パターンを観察する方法および加工装置 | |
JPS60135805A (ja) | パタ−ン検出方法及びその装置 | |
JPS6061648A (ja) | パタ−ン検出装置 | |
US6590657B1 (en) | Semiconductor structures and manufacturing methods | |
JPS5950518A (ja) | 投影プリント方法 | |
JPS6150003A (ja) | パタ−ン検知方法 | |
JP2519363B2 (ja) | プリント基板における配線パタ―ンの欠陥検査方法 | |
JPH05196435A (ja) | パターン検出方法 | |
JPS59218937A (ja) | パタ−ン検出装置 | |
JPS6439543A (en) | Defective inspection device | |
JPH05296746A (ja) | クリーム半田の外観検査方法 | |
JPS603507A (ja) | 配線パタ−ン検出装置 | |
JPS608705A (ja) | パタ−ン検出装置 | |
JP3827999B2 (ja) | 赤外線撮像装置とその光源装置とバンドパスフィルタ | |
JP2808850B2 (ja) | 基板の観察装置 | |
JPH037881B2 (enrdf_load_stackoverflow) | ||
JP2002168795A (ja) | レジスト・パターン検査装置及び検査方法 | |
JPH04254707A (ja) | 板体の外観検査装置 | |
JPS6128810A (ja) | マスク・パタ−ン観測方式 | |
JPH03239954A (ja) | パターン部材の検査方法および検査装置 | |
JPS62276442A (ja) | プリント基板検査装置 | |
JPH0476405B2 (enrdf_load_stackoverflow) | ||
JP2830430B2 (ja) | 異物検査装置 |