JPS5973761A - エネルギ分散型ｘ線分析装置 - Google Patents

エネルギ分散型ｘ線分析装置

Info

Publication number
JPS5973761A
JPS5973761A JP57184329A JP18432982A JPS5973761A JP S5973761 A JPS5973761 A JP S5973761A JP 57184329 A JP57184329 A JP 57184329A JP 18432982 A JP18432982 A JP 18432982A JP S5973761 A JPS5973761 A JP S5973761A
Authority
JP
Japan
Prior art keywords
calibration
ray
window
rays
ray source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57184329A
Other languages
English (en)
Japanese (ja)
Other versions
JPH046902B2 (OSRAM
Inventor
Masayuki Taira
平　正之
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
NTT Inc
Original Assignee
Jeol Ltd
Nihon Denshi KK
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Nihon Denshi KK, Nippon Telegraph and Telephone Corp filed Critical Jeol Ltd
Priority to JP57184329A priority Critical patent/JPS5973761A/ja
Publication of JPS5973761A publication Critical patent/JPS5973761A/ja
Publication of JPH046902B2 publication Critical patent/JPH046902B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/2209—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using wavelength dispersive spectroscopy [WDS]

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Electron Tubes For Measurement (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
JP57184329A 1982-10-20 1982-10-20 エネルギ分散型ｘ線分析装置 Granted JPS5973761A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57184329A JPS5973761A (ja) 1982-10-20 1982-10-20 エネルギ分散型ｘ線分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57184329A JPS5973761A (ja) 1982-10-20 1982-10-20 エネルギ分散型ｘ線分析装置

Publications (2)

Publication Number Publication Date
JPS5973761A true JPS5973761A (ja) 1984-04-26
JPH046902B2 JPH046902B2 (OSRAM) 1992-02-07

Family

ID=16151408

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57184329A Granted JPS5973761A (ja) 1982-10-20 1982-10-20 エネルギ分散型ｘ線分析装置

Country Status (1)

Country Link
JP (1) JPS5973761A (OSRAM)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4675527A (en) * 1984-05-17 1987-06-23 United Kingdom Atomic Energy Authority Corrosion monitoring probe
JP2007040945A (ja) * 2005-08-01 2007-02-15 Chiyoda Technol Corp 放射線などの線量測定装置の校正装置
JP2013186014A (ja) * 2012-03-09 2013-09-19 Hitachi Ltd 放射線検出器の校正方法および放射線監視装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5794847U (OSRAM) * 1972-12-21 1982-06-11

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5794847U (OSRAM) * 1972-12-21 1982-06-11

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4675527A (en) * 1984-05-17 1987-06-23 United Kingdom Atomic Energy Authority Corrosion monitoring probe
JP2007040945A (ja) * 2005-08-01 2007-02-15 Chiyoda Technol Corp 放射線などの線量測定装置の校正装置
JP2013186014A (ja) * 2012-03-09 2013-09-19 Hitachi Ltd 放射線検出器の校正方法および放射線監視装置

Also Published As

Publication number Publication date
JPH046902B2 (OSRAM) 1992-02-07

Similar Documents

Publication Publication Date Title
US10514346B2 (en) X-ray fluorescence spectrometer
CN101231256B (zh) X射线分析设备和x射线分析方法
KR20150143339A (ko) 형광 x 선 분석 장치
JP2008309807A (ja) Ｘ線エネルギースペクトルの放射線量子の背景補正された計数を決定する方法
Johnston et al. Proton-proton scattering at 40 MeV
US6173037B1 (en) Method of and apparatus for X-ray fluorescent analysis of thin layers
Tran et al. Quantitative determination of major systematics in synchrotron x‐ray experiments: seeing through harmonic components
US2908821A (en) Apparatus for spectrochemical analysis and structural analysis of solids, fluids andgases by means of x-rays
JP2005513478A5 (OSRAM)
US3351755A (en) Method of and apparatus for spectroscopic analysis having compensating means for uncontrollable variables
JPS5973761A (ja) エネルギ分散型ｘ線分析装置
JPH1048161A (ja) Ｘ線分析装置
JPS6411295B2 (OSRAM)
US6310937B1 (en) X-ray diffraction apparatus with an x-ray optical reference channel
US20060034418A1 (en) Tomography appliance, and method for a tomography appliance
JPH08136479A (ja) 全反射蛍光ｘ線分析装置
US20190204462A1 (en) Method for calibrating a high voltage generator of an x-ray tube in a radiographic system
US6477237B1 (en) X-ray shielding mechanism for off-axis X-rays
JP6990460B2 (ja) 蛍光ｘ線分析装置、判定方法及び判定プログラム
JP2001133420A (ja) 全反射蛍光ｘ線分析方法および装置
JP3333940B2 (ja) Ｘ線を使用して層の厚みを測定する装置の較正装置および較正方法
JPH07253472A (ja) 放射線検出器用ヘリウム３クライオスタットおよび分析装置
Hahn et al. Measurements of emittance and absolute spectral flux of the PETRA undulator at DESY Hamburg
JPH0949809A (ja) メスバウアー分光測定装置及び測定方法
US20250283842A1 (en) Systems and methods for x-ray fluorescence spectrometry optics alignment