JPS5970974A - 半導体レーザ劣化検出装置 - Google Patents

半導体レーザ劣化検出装置

Info

Publication number
JPS5970974A
JPS5970974A JP17984082A JP17984082A JPS5970974A JP S5970974 A JPS5970974 A JP S5970974A JP 17984082 A JP17984082 A JP 17984082A JP 17984082 A JP17984082 A JP 17984082A JP S5970974 A JPS5970974 A JP S5970974A
Authority
JP
Japan
Prior art keywords
semiconductor laser
deterioration
signal
circuit
power
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP17984082A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0544627B2 (enrdf_load_stackoverflow
Inventor
Hiromi Senoo
妹尾　広美
Yasumitsu Mizoguchi
溝口　康充
Masahiro Takasago
高砂　昌弘
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP17984082A priority Critical patent/JPS5970974A/ja
Publication of JPS5970974A publication Critical patent/JPS5970974A/ja
Publication of JPH0544627B2 publication Critical patent/JPH0544627B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Semiconductor Lasers (AREA)
JP17984082A 1982-10-15 1982-10-15 半導体レーザ劣化検出装置 Granted JPS5970974A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17984082A JPS5970974A (ja) 1982-10-15 1982-10-15 半導体レーザ劣化検出装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17984082A JPS5970974A (ja) 1982-10-15 1982-10-15 半導体レーザ劣化検出装置

Publications (2)

Publication Number Publication Date
JPS5970974A true JPS5970974A (ja) 1984-04-21
JPH0544627B2 JPH0544627B2 (enrdf_load_stackoverflow) 1993-07-06

Family

ID=16072812

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17984082A Granted JPS5970974A (ja) 1982-10-15 1982-10-15 半導体レーザ劣化検出装置

Country Status (1)

Country Link
JP (1) JPS5970974A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60231183A (ja) * 1984-04-28 1985-11-16 Fujitsu Ltd 半導体発光装置の特性測定方法
JP2012018067A (ja) * 2010-07-07 2012-01-26 Fujitsu Ltd 半導体レーザの判定装置、および、半導体レーザの判定方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5558069U (enrdf_load_stackoverflow) * 1978-10-13 1980-04-19
JPS5710991A (en) * 1980-06-24 1982-01-20 Fujitsu Ltd Laser diode control circuit

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5558069U (enrdf_load_stackoverflow) * 1978-10-13 1980-04-19
JPS5710991A (en) * 1980-06-24 1982-01-20 Fujitsu Ltd Laser diode control circuit

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60231183A (ja) * 1984-04-28 1985-11-16 Fujitsu Ltd 半導体発光装置の特性測定方法
JP2012018067A (ja) * 2010-07-07 2012-01-26 Fujitsu Ltd 半導体レーザの判定装置、および、半導体レーザの判定方法

Also Published As

Publication number Publication date
JPH0544627B2 (enrdf_load_stackoverflow) 1993-07-06

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