JPS5958000A - 無転位単結晶半導体材料の製造方法 - Google Patents
無転位単結晶半導体材料の製造方法Info
- Publication number
- JPS5958000A JPS5958000A JP58155693A JP15569383A JPS5958000A JP S5958000 A JPS5958000 A JP S5958000A JP 58155693 A JP58155693 A JP 58155693A JP 15569383 A JP15569383 A JP 15569383A JP S5958000 A JPS5958000 A JP S5958000A
- Authority
- JP
- Japan
- Prior art keywords
- silicon
- doped
- substance
- compensated
- doping
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B31/00—Diffusion or doping processes for single crystals or homogeneous polycrystalline material with defined structure; Apparatus therefor
- C30B31/06—Diffusion or doping processes for single crystals or homogeneous polycrystalline material with defined structure; Apparatus therefor by contacting with diffusion material in the gaseous state
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/02—Single-crystal growth by pulling from a melt, e.g. Czochralski method adding crystallising materials or reactants forming it in situ to the melt
- C30B15/04—Single-crystal growth by pulling from a melt, e.g. Czochralski method adding crystallising materials or reactants forming it in situ to the melt adding doping materials, e.g. for n-p-junction
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Light Receiving Elements (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE32322593 | 1982-08-30 | ||
DE19823232259 DE3232259A1 (de) | 1982-08-30 | 1982-08-30 | Verfahren zum herstellen von halbleitermaterial hoher dotierung |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5958000A true JPS5958000A (ja) | 1984-04-03 |
Family
ID=6172078
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP58155693A Pending JPS5958000A (ja) | 1982-08-30 | 1983-08-25 | 無転位単結晶半導体材料の製造方法 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JPS5958000A (it) |
DE (1) | DE3232259A1 (it) |
FR (1) | FR2532335A1 (it) |
IT (1) | IT1163932B (it) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101028443B1 (ko) | 2008-03-10 | 2011-04-14 | 실트로닉 아게 | 단결정 규소로 구성된 반도체 웨이퍼 및 그 제조 방법 |
CN114262231A (zh) * | 2021-12-16 | 2022-04-01 | 江苏诺明高温材料股份有限公司 | 一种石灰窑用的内衬耐火材料及其制备方法 |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0350845A3 (en) * | 1988-07-12 | 1991-05-29 | Seiko Epson Corporation | Semiconductor device with doped regions and method for manufacturing it |
US5553566A (en) * | 1995-06-22 | 1996-09-10 | Motorola Inc. | Method of eliminating dislocations and lowering lattice strain for highly doped N+ substrates |
DE19953883A1 (de) * | 1999-11-09 | 2001-05-23 | Infineon Technologies Ag | Anordnung zur Reduzierung des Einschaltwiderstandes von p- oder n-Kanal-Feldeffekttransistoren |
DE102004039197B4 (de) * | 2004-08-12 | 2010-06-17 | Siltronic Ag | Verfahren zur Herstellung von dotierten Halbleiterscheiben aus Silizium |
JP4516096B2 (ja) | 2007-05-31 | 2010-08-04 | Sumco Techxiv株式会社 | シリコン単結晶の製造方法 |
-
1982
- 1982-08-30 DE DE19823232259 patent/DE3232259A1/de not_active Withdrawn
-
1983
- 1983-08-25 IT IT22636/83A patent/IT1163932B/it active
- 1983-08-25 JP JP58155693A patent/JPS5958000A/ja active Pending
- 1983-08-25 FR FR8313713A patent/FR2532335A1/fr not_active Withdrawn
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101028443B1 (ko) | 2008-03-10 | 2011-04-14 | 실트로닉 아게 | 단결정 규소로 구성된 반도체 웨이퍼 및 그 제조 방법 |
CN114262231A (zh) * | 2021-12-16 | 2022-04-01 | 江苏诺明高温材料股份有限公司 | 一种石灰窑用的内衬耐火材料及其制备方法 |
Also Published As
Publication number | Publication date |
---|---|
FR2532335A1 (fr) | 1984-03-02 |
IT8322636A0 (it) | 1983-08-25 |
IT1163932B (it) | 1987-04-08 |
DE3232259A1 (de) | 1984-03-01 |
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