JPS5941851A - 半導体装置の製造方法 - Google Patents
半導体装置の製造方法Info
- Publication number
- JPS5941851A JPS5941851A JP57152052A JP15205282A JPS5941851A JP S5941851 A JPS5941851 A JP S5941851A JP 57152052 A JP57152052 A JP 57152052A JP 15205282 A JP15205282 A JP 15205282A JP S5941851 A JPS5941851 A JP S5941851A
- Authority
- JP
- Japan
- Prior art keywords
- region
- oxide film
- film
- silicon nitride
- insulating film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H10W10/0128—
-
- H10W10/13—
Landscapes
- Local Oxidation Of Silicon (AREA)
- Bipolar Transistors (AREA)
- Element Separation (AREA)
- Semiconductor Integrated Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57152052A JPS5941851A (ja) | 1982-09-01 | 1982-09-01 | 半導体装置の製造方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57152052A JPS5941851A (ja) | 1982-09-01 | 1982-09-01 | 半導体装置の製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5941851A true JPS5941851A (ja) | 1984-03-08 |
| JPS6322613B2 JPS6322613B2 (cg-RX-API-DMAC10.html) | 1988-05-12 |
Family
ID=15531992
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57152052A Granted JPS5941851A (ja) | 1982-09-01 | 1982-09-01 | 半導体装置の製造方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5941851A (cg-RX-API-DMAC10.html) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4994407A (en) * | 1988-09-20 | 1991-02-19 | Rockwell International Corporation | Radiation hardened field oxides for NMOS and CMOS-bulk and process for forming |
| US6610581B1 (en) | 1999-06-01 | 2003-08-26 | Sanyo Electric Co., Ltd. | Method of forming isolation film in semiconductor device |
-
1982
- 1982-09-01 JP JP57152052A patent/JPS5941851A/ja active Granted
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4994407A (en) * | 1988-09-20 | 1991-02-19 | Rockwell International Corporation | Radiation hardened field oxides for NMOS and CMOS-bulk and process for forming |
| US6610581B1 (en) | 1999-06-01 | 2003-08-26 | Sanyo Electric Co., Ltd. | Method of forming isolation film in semiconductor device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6322613B2 (cg-RX-API-DMAC10.html) | 1988-05-12 |
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