JPS594063A - 多端子リ−ドの検査方法 - Google Patents

多端子リ−ドの検査方法

Info

Publication number
JPS594063A
JPS594063A JP11283082A JP11283082A JPS594063A JP S594063 A JPS594063 A JP S594063A JP 11283082 A JP11283082 A JP 11283082A JP 11283082 A JP11283082 A JP 11283082A JP S594063 A JPS594063 A JP S594063A
Authority
JP
Japan
Prior art keywords
lead
mask
pitch
minimum
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11283082A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6322612B2 (enrdf_load_stackoverflow
Inventor
Shuji Takeshita
修二 竹下
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP11283082A priority Critical patent/JPS594063A/ja
Publication of JPS594063A publication Critical patent/JPS594063A/ja
Publication of JPS6322612B2 publication Critical patent/JPS6322612B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Lead Frames For Integrated Circuits (AREA)
JP11283082A 1982-06-30 1982-06-30 多端子リ−ドの検査方法 Granted JPS594063A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11283082A JPS594063A (ja) 1982-06-30 1982-06-30 多端子リ−ドの検査方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11283082A JPS594063A (ja) 1982-06-30 1982-06-30 多端子リ−ドの検査方法

Publications (2)

Publication Number Publication Date
JPS594063A true JPS594063A (ja) 1984-01-10
JPS6322612B2 JPS6322612B2 (enrdf_load_stackoverflow) 1988-05-12

Family

ID=14596599

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11283082A Granted JPS594063A (ja) 1982-06-30 1982-06-30 多端子リ−ドの検査方法

Country Status (1)

Country Link
JP (1) JPS594063A (enrdf_load_stackoverflow)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60213041A (ja) * 1984-04-09 1985-10-25 Sanwa Electron Kk Ｉｃのピンの状態検出装置
JPS60229356A (ja) * 1984-04-27 1985-11-14 Sanwa Electron Kk Ｉｃのピンの曲がり検出方法
JPS6174346A (ja) * 1984-09-19 1986-04-16 Kokusai Syst Sci Kk Ｄｉｐタイプのデバイス検査方法
JPS6371534U (enrdf_load_stackoverflow) * 1986-10-29 1988-05-13
JPH03223612A (ja) * 1989-09-18 1991-10-02 Ono Sokki Co Ltd スリットのピッチむら測定方法

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60213041A (ja) * 1984-04-09 1985-10-25 Sanwa Electron Kk Ｉｃのピンの状態検出装置
JPS60229356A (ja) * 1984-04-27 1985-11-14 Sanwa Electron Kk Ｉｃのピンの曲がり検出方法
JPS6174346A (ja) * 1984-09-19 1986-04-16 Kokusai Syst Sci Kk Ｄｉｐタイプのデバイス検査方法
JPS6371534U (enrdf_load_stackoverflow) * 1986-10-29 1988-05-13
JPH03223612A (ja) * 1989-09-18 1991-10-02 Ono Sokki Co Ltd スリットのピッチむら測定方法

Also Published As

Publication number Publication date
JPS6322612B2 (enrdf_load_stackoverflow) 1988-05-12

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