JPS5932131A - X線露光転写法および転写用マスク - Google Patents

X線露光転写法および転写用マスク

Info

Publication number
JPS5932131A
JPS5932131A JP57142117A JP14211782A JPS5932131A JP S5932131 A JPS5932131 A JP S5932131A JP 57142117 A JP57142117 A JP 57142117A JP 14211782 A JP14211782 A JP 14211782A JP S5932131 A JPS5932131 A JP S5932131A
Authority
JP
Japan
Prior art keywords
mask
ray
exposure
thin film
distance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57142117A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0368531B2 (en, 2012
Inventor
Shoichi Tanimoto
谷本 昭一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nikon Corp
Original Assignee
Nikon Corp
Nippon Kogaku KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corp, Nippon Kogaku KK filed Critical Nikon Corp
Priority to JP57142117A priority Critical patent/JPS5932131A/ja
Publication of JPS5932131A publication Critical patent/JPS5932131A/ja
Publication of JPH0368531B2 publication Critical patent/JPH0368531B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058Mask illumination systems

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
JP57142117A 1982-08-18 1982-08-18 X線露光転写法および転写用マスク Granted JPS5932131A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57142117A JPS5932131A (ja) 1982-08-18 1982-08-18 X線露光転写法および転写用マスク

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57142117A JPS5932131A (ja) 1982-08-18 1982-08-18 X線露光転写法および転写用マスク

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP61109500A Division JPS621231A (ja) 1986-05-15 1986-05-15 X線露光転写用マスク

Publications (2)

Publication Number Publication Date
JPS5932131A true JPS5932131A (ja) 1984-02-21
JPH0368531B2 JPH0368531B2 (en, 2012) 1991-10-28

Family

ID=15307797

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57142117A Granted JPS5932131A (ja) 1982-08-18 1982-08-18 X線露光転写法および転写用マスク

Country Status (1)

Country Link
JP (1) JPS5932131A (en, 2012)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60198726A (ja) * 1984-03-23 1985-10-08 Hitachi Ltd X線露光装置の露光量調整方法と装置
JPH04263416A (ja) * 1991-02-18 1992-09-18 Nippon Telegr & Teleph Corp <Ntt> X線マスク
US6403475B1 (en) * 1999-06-18 2002-06-11 Hitachi, Ltd. Fabrication method for semiconductor integrated device
US11156123B2 (en) 2017-10-30 2021-10-26 Mitsubishi Heavy Industries Engine & Turbocharger, Ltd. Turbocharger

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5720434A (en) * 1980-07-11 1982-02-02 Mitsubishi Electric Corp X-ray exposure transferring method and transferring apparatus therefor
JPS5745235A (en) * 1980-09-02 1982-03-15 Fujitsu Ltd Exposure by x-ray

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5720434A (en) * 1980-07-11 1982-02-02 Mitsubishi Electric Corp X-ray exposure transferring method and transferring apparatus therefor
JPS5745235A (en) * 1980-09-02 1982-03-15 Fujitsu Ltd Exposure by x-ray

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60198726A (ja) * 1984-03-23 1985-10-08 Hitachi Ltd X線露光装置の露光量調整方法と装置
JPH04263416A (ja) * 1991-02-18 1992-09-18 Nippon Telegr & Teleph Corp <Ntt> X線マスク
US6403475B1 (en) * 1999-06-18 2002-06-11 Hitachi, Ltd. Fabrication method for semiconductor integrated device
US11156123B2 (en) 2017-10-30 2021-10-26 Mitsubishi Heavy Industries Engine & Turbocharger, Ltd. Turbocharger

Also Published As

Publication number Publication date
JPH0368531B2 (en, 2012) 1991-10-28

Similar Documents

Publication Publication Date Title
US8625073B2 (en) Exposure apparatus and device manufacturing method
JP2751718B2 (ja) 露出マスク
JP5789135B2 (ja) 露光装置及びデバイスの製造方法
JPS5932131A (ja) X線露光転写法および転写用マスク
US6453000B1 (en) Exposure method, exposure device and semiconductor device manufacturing method
JPS6219055B2 (en, 2012)
JP2002222750A (ja) 電子ビーム転写用マスク
JP2861642B2 (ja) 半導体装置の製造方法
JPS5962855A (ja) X線露光用マスク
US6791668B2 (en) Semiconductor manufacturing apparatus and method
JP3267498B2 (ja) マスク及びこれを用いたデバイス生産方法や露光装置
JPH03235321A (ja) X線露光用マスク
JPH01175730A (ja) 露光装置
JP2003322952A (ja) 高透過率型ハーフトーン位相シフトマスクおよび半導体装置の製造方法
JP3516667B2 (ja) マスク、半導体装置の製造方法および露光装置
JP2908100B2 (ja) 投影露光装置及び半導体装置の製造方法
US4641921A (en) Optical adjusting process
JP3905877B2 (ja) リアプロジェクションディスプレイ用スクリーンに用いるマイクロレンズアレイ用母型の製造方法
TW200300961A (en) Multiple photolithographic exposures with different clear patterns
JPS62262428A (ja) リソグラフイ−用マスク
KR20060029593A (ko) 전사 마스크 블랭크, 전사 마스크 및 그 전사 마스크를이용한 전사 방법
JPH06333804A (ja) X線露光方法及びx線マスク製造方法
JPH0527413A (ja) 露光装置用ホトマスク
JPH03274718A (ja) X線露光用マスクの支持膜及びx線露光用マスク
JPH04372111A (ja) 投影露光装置