JPS59228105A - フイルムの厚さ測定装置 - Google Patents

フイルムの厚さ測定装置

Info

Publication number
JPS59228105A
JPS59228105A JP58102842A JP10284283A JPS59228105A JP S59228105 A JPS59228105 A JP S59228105A JP 58102842 A JP58102842 A JP 58102842A JP 10284283 A JP10284283 A JP 10284283A JP S59228105 A JPS59228105 A JP S59228105A
Authority
JP
Japan
Prior art keywords
film
light
thickness
measurement
measuring device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58102842A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0519081B2 (Direct
Inventor
Kazuo Imose
妹背　和男
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teijin Ltd
Original Assignee
Teijin Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teijin Ltd filed Critical Teijin Ltd
Priority to JP58102842A priority Critical patent/JPS59228105A/ja
Publication of JPS59228105A publication Critical patent/JPS59228105A/ja
Publication of JPH0519081B2 publication Critical patent/JPH0519081B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP58102842A 1983-06-10 1983-06-10 フイルムの厚さ測定装置 Granted JPS59228105A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58102842A JPS59228105A (ja) 1983-06-10 1983-06-10 フイルムの厚さ測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58102842A JPS59228105A (ja) 1983-06-10 1983-06-10 フイルムの厚さ測定装置

Publications (2)

Publication Number Publication Date
JPS59228105A true JPS59228105A (ja) 1984-12-21
JPH0519081B2 JPH0519081B2 (Direct) 1993-03-15

Family

ID=14338219

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58102842A Granted JPS59228105A (ja) 1983-06-10 1983-06-10 フイルムの厚さ測定装置

Country Status (1)

Country Link
JP (1) JPS59228105A (Direct)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0298609A (ja) * 1988-10-06 1990-04-11 Dainippon Printing Co Ltd 合成樹脂製容器の肉厚検査装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5134754A (ja) * 1974-09-18 1976-03-24 Oki Electric Ind Co Ltd Setsuchakuzainoatsusakenshutsusochi
JPS52153468A (en) * 1976-06-15 1977-12-20 Fujitsu Ltd Thickness measuring method of substrates

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5134754A (ja) * 1974-09-18 1976-03-24 Oki Electric Ind Co Ltd Setsuchakuzainoatsusakenshutsusochi
JPS52153468A (en) * 1976-06-15 1977-12-20 Fujitsu Ltd Thickness measuring method of substrates

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0298609A (ja) * 1988-10-06 1990-04-11 Dainippon Printing Co Ltd 合成樹脂製容器の肉厚検査装置

Also Published As

Publication number Publication date
JPH0519081B2 (Direct) 1993-03-15

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