JPS59200763A - Sputtering device - Google Patents

Sputtering device

Info

Publication number
JPS59200763A
JPS59200763A JP7656983A JP7656983A JPS59200763A JP S59200763 A JPS59200763 A JP S59200763A JP 7656983 A JP7656983 A JP 7656983A JP 7656983 A JP7656983 A JP 7656983A JP S59200763 A JPS59200763 A JP S59200763A
Authority
JP
Japan
Prior art keywords
target
sputtering
plate
pole
efficiency
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7656983A
Other languages
Japanese (ja)
Other versions
JPS6357502B2 (en
Inventor
Toru Takeuchi
竹内 透
Yasuhisa Sato
泰久 佐藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP7656983A priority Critical patent/JPS59200763A/en
Publication of JPS59200763A publication Critical patent/JPS59200763A/en
Publication of JPS6357502B2 publication Critical patent/JPS6357502B2/ja
Granted legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/35Sputtering by application of a magnetic field, e.g. magnetron sputtering
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/34Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3402Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
    • H01J37/3405Magnetron sputtering
    • H01J37/3408Planar magnetron sputtering

Abstract

PURPOSE:To provide a titled device having high sputtering efficiency and the utilizing efficiency of a target by disposing plate- or bar-shaped magnets of which the end parts formed with N and S poles are curved respectively diagonally upward toward the outside with respect to the S-N axis beneath the target. CONSTITUTION:A target electrode 16 constituting a sputtering gun 13 in a sputtering devce of a planar magnetron type is constituted, for example, in the following way: Plate- or bar-shaped magnets 3 of which the respective ends formed with an N or S pole are curved upward by, for example, about 45 deg., with respect to the S-N axis are disposed in the cavity formed of a backing plate 2 and a bottom plate 1 consisting of copper, etc. A target 5 consisting of a metal such as Al, Mo or the like or the silicide, etc. thereof is disposed above the plate 2. The magnetic flux phi obtd. by such constitution is formed mainly in the upper part of the target 5 and therefore almost all the magnetic force possessed by the magnets 3 is concentrated onto the target 5, by which the plasma generating efficiency is improved and the growing rate by sputtering is consequently improved.

Description

【発明の詳細な説明】 (a)  発明の技術分野 マ 不発明はプレーナ次グネトロン方式のスパッタリング装
置に係り、特に該スパッタリング装置に用いるスパッタ
リング嗜ガンに配設される磁石の構造に関する。
DETAILED DESCRIPTION OF THE INVENTION (a) Technical Field of the Invention The invention relates to a planar order gnetron type sputtering apparatus, and particularly to the structure of a magnet disposed in a sputtering gun used in the sputtering apparatus.

(b)  従来技術と問題点 従来プレーナマグネトロン方式のスパッタリング装置が
具備していたスパッタリング−ガンに於ける磁石の配置
は、ターゲット面即ちバッキング・プレートの上面に対
して直角又は平行のいずれかであった。第1図(イ)は
磁石がバッキング・グレートの上面に対して直角に配設
された構造、第1図(ロ)は平行に配設された構造をそ
れぞれ模式的に示したもので、これらの図に於て、1は
底板、2はバッキング・グレート、3は磁石、417:
ヨーク、5は使用後のターゲット、6は使用前の形状を
示す点線、7及び7′はターゲットの消費領域、Φは磁
束を衣わしている。
(b) Prior Art and Problems Conventional planar magnetron sputtering equipment has a sputtering gun in which the magnets are arranged either at right angles or parallel to the target surface, that is, the upper surface of the backing plate. Ta. Figure 1 (a) schematically shows a structure in which the magnets are arranged perpendicular to the top surface of the backing grating, and Figure 1 (b) schematically shows a structure in which the magnets are arranged in parallel. In the diagram, 1 is the bottom plate, 2 is the backing grate, 3 is the magnet, 417:
yoke, 5 is the target after use, 6 is a dotted line showing the shape before use, 7 and 7' are consumption areas of the target, and Φ is the magnetic flux.

そして上記従来構造の前者即ち磁石3がバッキング・プ
レート2上面に対して直角に配設される構造に於ては、
同図(イ)に示すように磁束ΦがN極面から垂直に出て
、S極面に垂直に入るために、プラズマが閉じ込められ
る領域が狭くなり、ターゲット5に於けるターゲット消
費領域7が狭い面積に限られる0そのため該構造に於て
はクーゲットの使用効率が悪いという問題があった〇又
後者即ち磁石3がバッキング・プレート2上面に対して
平行に配設される構造に於ては、同図(ロンに示すよう
に、磁束Φが外側に向って広がるためプラズマが閉じ込
められる領域が広がり、ターゲット消合繊域7′が広く
なるのでターゲットの使用効率は向上するが、一方凶に
示すように磁束Φが磁石の上方と下方に二方されるため
にスパッタ効率が低下するという問題があった。
In the former conventional structure, that is, the structure in which the magnet 3 is disposed perpendicular to the upper surface of the backing plate 2,
As shown in the figure (a), since the magnetic flux Φ exits perpendicularly from the north pole face and enters perpendicularly to the south pole face, the area where the plasma is confined becomes narrower, and the target consumption area 7 of the target 5 becomes smaller. Therefore, in this structure, there was a problem that the usage efficiency of the cuget was poor.In addition, in the latter structure, that is, in the structure where the magnet 3 is arranged parallel to the upper surface of the backing plate 2, , the same figure (as shown in Ron), as the magnetic flux Φ spreads outward, the area where the plasma is confined expands, and the target quenching fiber region 7' becomes wider, improving the efficiency of target use. Since the magnetic flux Φ is directed in two directions, one above and one below the magnet, there is a problem in that the sputtering efficiency decreases.

(e)  発明の目的 本発明の目的とするところは、上記問題点を解決し、ス
パッタ効率及びターゲットの使用効率の冒いプレーナマ
グネトロン方式のスパッタリング・ガンを提供するにあ
る。
(e) Object of the Invention An object of the present invention is to solve the above-mentioned problems and provide a planar magnetron type sputtering gun that improves sputtering efficiency and target usage efficiency.

(由 発明の構成 即ち本発明はプレーナマグネトロン方式のスパッタリン
グ装置に於て、一端面にN極を他端面にS極を有し、且
つN極若しくはS極が形成されたそれぞれの端部が、該
磁石のS−N軸に沿ったそれぞれの極の外側斜め上方に
同って屈曲せしめられた板状若しくは棒状の磁石が、タ
ーゲットの下部に配設されてなることを特徴とする。
(The structure of the invention, that is, the present invention is a planar magnetron type sputtering apparatus, which has an N pole on one end face and an S pole on the other end face, and each end where the N pole or the S pole is formed. The present invention is characterized in that a plate-shaped or bar-shaped magnet is disposed below the target, and is bent diagonally upward to the outside of each pole along the SN axis of the magnet.

(e)  発明の実施例 以下本発明を実施例について、図を参照しながら説明す
る。
(e) Embodiments of the Invention The present invention will be described below with reference to the drawings.

なお第2区はプレーナマグネトロン方式のスパッタリン
グ装置に於ける一例の模式断面図、第3図は不発明の構
造を有するスパッタリング・ガンに於ける一実施例の要
部模式fffr面図、2−a4崗ばスパッタリング・ガ
/に於ける池の一実施例の要部模式平面1凶(イ)及び
要部模式l3fr面図(ロ)である。
The second section is a schematic sectional view of an example of a planar magnetron type sputtering apparatus, and FIG. 3 is a schematic fffr cross-sectional view of the main part of an embodiment of a sputtering gun having an uninvented structure. FIG. 1 is a schematic plan view of the main part of an embodiment of the pond in the granite sputtering process (A) and a schematic plan view of the main part of the pond is shown in FIG.

プレーナマグネトロン方式のスパッタリング装ヤー11
とによって形成された処理室12内の下部にプレーナマ
グネトロン方式のスパッタリング・ガン13が配設され
、上部に該スパッタリング・て上記スパッタリング・ガ
ン13は、バッキング書に グレート2と、その下fiバッキング・グレート2に平
行して配設された例えば円板状の磁石3と、バッキング
会プレート2上に載設されたターゲット5とより主とし
てなるターゲット電極16と、訊ターゲット屯ジグ16
のfil1面を取f)囲むシールド電(グ17によりて
主として構成されている。なお図中18a、18b、1
8c、18dは気密絶縁体、19は冷却水口を示してい
る。
Planar magnetron type sputtering equipment 11
A planar magnetron type sputtering gun 13 is disposed in the lower part of the processing chamber 12 formed by the sputtering gun 13. For example, a disc-shaped magnet 3 disposed in parallel to the grating 2, a target electrode 16 mainly consisting of a target 5 mounted on the backing plate 2, and a target jig 16.
It is mainly composed of a shield cable (g 17) that surrounds the fil1 side of the fil1 side (f).
8c and 18d are airtight insulators, and 19 is a cooling water port.

スパッタ処理に除しては、前記ガス導入口10から所疋
流−15のしUえはアルゴン(Ar)k流入し1、i℃
空排気口8から所廻の排気を行い、処理室12内のA>
圧f 10−3〜1O−2(Torr)程度に維持した
状jと2でシールドil極17とターゲット電極16間
に例えば−4oocv〕<p−ゲ、y トate)程度
の訂苑電圧金印加し、Ar中にプラズマを発生させ、該
プラズマによってターゲット材料の彼粒子全叩き出し、
彼処理基板14上にスパッタ膜を被せ 着さがる。
During the sputtering process, argon (Ar) flows in through the gas inlet 10 at 1°C.
The area is evacuated from the air exhaust port 8, and the inside of the processing chamber 12 is
For example, a voltage of about -4oocv]<p-ge, y-ate) is applied between the shield IL pole 17 and the target electrode 16 with the pressure f maintained at about 10-3 to 1 O-2 (Torr). by applying Ar, generating plasma in Ar, and driving out all the particles of the target material by the plasma,
A sputtered film is then deposited on the substrate 14 to be processed.

本発明に於ては、このようなプレーナマグネトロン方式
のスパッタリング装置に於けるスパッタリング・ガン1
3を構成するターゲット電極16が、例えば第3図に示
すような構造に形成される。
In the present invention, the sputtering gun 1 in such a planar magnetron type sputtering apparatus is
The target electrode 16 constituting the target electrode 3 is formed in a structure as shown in FIG. 3, for example.

即ち銅(Cu)等よりなるバッキング・プレート2と底
板1とで形成される空洞部にN、己又はS極が形成され
たそれぞれの端部がS−N軸に沿ったそれぞれの極の外
側斜め上方に例えば45〔度〕程度屈曲せしめられた形
状の磁石3(棒状又は板状)が配設され、バッキング・
グレート2の上部にアルミニウム(At)、モリブデン
(Mo)、モリブデン・シリサイド(Mo S iz 
)等の金属着しくけその珪化物等からなるターゲット5
が載設されてなっている。
That is, the ends of each of the N, self, or S poles formed in the cavity formed by the backing plate 2 made of copper (Cu), etc., and the bottom plate 1 are located outside the respective poles along the S-N axis. A magnet 3 (rod-shaped or plate-shaped) bent by about 45 degrees, for example, is arranged diagonally upward, and the backing
Aluminum (At), molybdenum (Mo), and molybdenum silicide (Mo Si
) and other metal-plated targets 5 made of silicide, etc.
is included.

このような構造に子ると、N極及びS極が」ニガに持ち
上がり且つその磁極面が斜め上方に同っているために、
磁束Φは主としてターゲット5の上部に形成されるので
、磁石3の持つている殆んど全磁力をターゲット5上に
集中することができ、プラズマ発生効率が高められ、従
ってスノ(ツタ成長速度も向上する0 又該磁石の磁極を有する端面がターゲット5の縁部より
外に回っているために、磁束Φは凶に示すようにターゲ
ツト5全面上をぼって広く形成されるので、プラズマの
閉じ込められる領域が広がるために、ターゲット5は広
い面’JjでrP費きれ(7は消費領域)、ターゲット
5の使用効率が向上する0 なお上記構造に於て、バッキング・プレート2と底部1
により形成され磁石3が収容されている空洞部には通常
冷却水が流通される。又磁石3端部の屈曲角度は30〜
60〔度〕程度の範囲で所望の角度に選ばれる。更に又
屈曲部の寸法比率もスパッタリング・ガン全体の形状を
考慮して種々に選ばれる。
In such a structure, the N and S poles are raised upwards and the magnetic pole faces are aligned diagonally upward, so
Since the magnetic flux Φ is mainly formed on the upper part of the target 5, almost all the magnetic force of the magnet 3 can be concentrated on the target 5, increasing the plasma generation efficiency and reducing the growth rate of vines. In addition, since the end face with the magnetic pole of the magnet is turned outside the edge of the target 5, the magnetic flux Φ is formed broadly over the entire surface of the target 5 as shown in the figure, which improves the confinement of the plasma. Since the area covered by the target 5 is expanded, the target 5 can consume rP on the wide surface 'Jj (7 is the consumption area), and the usage efficiency of the target 5 is improved.0 In the above structure, the backing plate 2 and the bottom
Cooling water normally flows through the cavity formed by the magnet 3 and in which the magnet 3 is housed. Also, the bending angle of the magnet 3 end is 30~
A desired angle is selected within a range of about 60 degrees. Furthermore, the dimensional ratio of the bent portion is also selected in various ways, taking into consideration the overall shape of the sputtering gun.

第4図は円板状の磁石を用いた一実施例を示したもので
、同図(イ)は上面から透視した状態を示したターゲッ
ト電極の模式平面図で、同図(ロ)はそのA−’A’矢
視模式断面図である。そしてこれらの図に於て、1は底
板、2はバッキング・プレート、3′はドーナッツ凰円
板状磁石、5はターゲット、19は屈曲部、20はN極
面、21はS極面を示している。該実施例は真円状のド
ーナッツ型でちるが、実際には隋円状のドーナツ型も多
く用いられる。
Fig. 4 shows an example using a disc-shaped magnet, and Fig. 4 (A) is a schematic plan view of the target electrode seen from above, and Fig. 4 (B) is a schematic plan view of the target electrode. It is a schematic sectional view taken along the line A-'A'. In these figures, 1 is the bottom plate, 2 is the backing plate, 3' is the donut disc magnet, 5 is the target, 19 is the bent part, 20 is the N-pole surface, and 21 is the S-pole surface. ing. In this embodiment, a perfectly circular donut shape is used, but in reality, a perfectly circular donut shape is also often used.

(f)  発明の詳細 な説明したように不発明によればプレーナマグネトロン
方式のスパッタリング・ガンに於て、該スパックリング
φガンの内蔵する磁石によって形成される磁場が、該ス
パッタリング・ガンの表面のみに王として形成されるの
で、プラズマの発生効率が高まり、スパッタの成長速匿
が向上する。
(f) As described in the detailed description of the invention, according to the invention, in a planar magnetron type sputtering gun, the magnetic field formed by the magnet built in the sputtering φ gun is applied only to the surface of the sputtering gun. Since the plasma is formed as a king, the efficiency of plasma generation is increased and the speed and speed of sputter growth is improved.

又不発明によれば磁場がターゲット全面を覆って広く形
成されるので、プラズマが閉じ込められる領域が広が9
、スパッタが広い面積でなされるので、ターゲットの使
用効率が向上する。
Further, according to the invention, the magnetic field is formed widely covering the entire surface of the target, so the area where plasma is confined is expanded9.
Since sputtering is performed over a wide area, the target usage efficiency is improved.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図(イ)及び(ロ)は従来のスパックリング・ガン
の要部模式断面図、第21はプレーナマグネトロン方式
のスパッタリング装置の模式断面図、第3図は本発明の
構造を有するスパッタリング・ガンの一実施例に於ける
要部模式断面図で、第4図は他の一実施例に於ける要部
模式断面図(イ)及び要部模式断面図(ロ)である。 図に於て、1は底部、2はバッキング・グレート、3及
び3′は磁石、5はターゲット、7は消費領域、19は
屈曲部、20はN極面、21はS極面、Φは磁束を示す
。 第 I 閤 第2 日 lV 算3聞 第4因
Figures 1 (a) and (b) are schematic sectional views of main parts of a conventional sputtering gun, Figure 21 is a schematic sectional view of a planar magnetron sputtering device, and Figure 3 is a sputtering gun having the structure of the present invention. FIG. 4 is a schematic cross-sectional view of the main part in one embodiment of the gun, and FIG. 4 is a schematic cross-sectional view of the main part (A) and a schematic cross-sectional view (B) of the main part in another embodiment. In the figure, 1 is the bottom, 2 is the backing grade, 3 and 3' are the magnets, 5 is the target, 7 is the consumption area, 19 is the bending part, 20 is the N-pole surface, 21 is the S-pole surface, and Φ is the Indicates magnetic flux. Part I, 2nd day, lV, arithmetic, 3rd sentence, 4th factor

Claims (1)

【特許請求の範囲】[Claims] 一端面にN極を他端面にS極を有し、且っN極若しくは
S極が形成されたそれぞれの端部が、磁石のS−N軸に
沿ったそれぞれの極の外側斜め上方に同って屈曲せしめ
られた板状若しくは棒状の磁石が、ターゲットの下部に
配設されてなることを特徴とするスパッタリング装置。
It has an N pole on one end face and an S pole on the other end face, and each end where the N pole or S pole is formed is located diagonally above the outside of each pole along the S-N axis of the magnet. 1. A sputtering apparatus characterized in that a bent plate-shaped or rod-shaped magnet is disposed below a target.
JP7656983A 1983-04-30 1983-04-30 Sputtering device Granted JPS59200763A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7656983A JPS59200763A (en) 1983-04-30 1983-04-30 Sputtering device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7656983A JPS59200763A (en) 1983-04-30 1983-04-30 Sputtering device

Publications (2)

Publication Number Publication Date
JPS59200763A true JPS59200763A (en) 1984-11-14
JPS6357502B2 JPS6357502B2 (en) 1988-11-11

Family

ID=13608859

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7656983A Granted JPS59200763A (en) 1983-04-30 1983-04-30 Sputtering device

Country Status (1)

Country Link
JP (1) JPS59200763A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0980090A3 (en) * 1998-08-10 2004-12-01 Applied Films GmbH & Co. KG Sputtering device with a cathode comprising a permanent magnet assembly
WO2013115030A1 (en) * 2012-01-30 2013-08-08 日立金属株式会社 Magnetic field generator for magnetron sputtering
CN103668096A (en) * 2013-12-26 2014-03-26 京东方科技集团股份有限公司 Bar magnet, magnetic target and magnetron sputtering equipment

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5980925A (en) 1997-12-30 1999-11-09 Ethicon, Inc. High glycerin containing anti-microbial cleansers

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5337588A (en) * 1976-09-21 1978-04-06 Toshiba Corp Sputtering electrode

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5337588A (en) * 1976-09-21 1978-04-06 Toshiba Corp Sputtering electrode

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0980090A3 (en) * 1998-08-10 2004-12-01 Applied Films GmbH & Co. KG Sputtering device with a cathode comprising a permanent magnet assembly
WO2013115030A1 (en) * 2012-01-30 2013-08-08 日立金属株式会社 Magnetic field generator for magnetron sputtering
CN103668096A (en) * 2013-12-26 2014-03-26 京东方科技集团股份有限公司 Bar magnet, magnetic target and magnetron sputtering equipment

Also Published As

Publication number Publication date
JPS6357502B2 (en) 1988-11-11

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