JPS59174737A - 粒径測定装置 - Google Patents

粒径測定装置

Info

Publication number
JPS59174737A
JPS59174737A JP58049923A JP4992383A JPS59174737A JP S59174737 A JPS59174737 A JP S59174737A JP 58049923 A JP58049923 A JP 58049923A JP 4992383 A JP4992383 A JP 4992383A JP S59174737 A JPS59174737 A JP S59174737A
Authority
JP
Japan
Prior art keywords
measured
terminals
light
scattering angle
particles
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58049923A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0237977B2 (enrdf_load_stackoverflow
Inventor
Kyoichi Tatsuno
恭市 辰野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP58049923A priority Critical patent/JPS59174737A/ja
Priority to US06/541,023 priority patent/US4595291A/en
Priority to DE8383306227T priority patent/DE3381178D1/de
Priority to EP83306227A priority patent/EP0106684B1/en
Publication of JPS59174737A publication Critical patent/JPS59174737A/ja
Publication of JPH0237977B2 publication Critical patent/JPH0237977B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4711—Multiangle measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4711—Multiangle measurement
    • G01N2021/4716—Using a ring of sensors, or a combination of diaphragm and sensors; Annular sensor

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP58049923A 1982-10-15 1983-03-25 粒径測定装置 Granted JPS59174737A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP58049923A JPS59174737A (ja) 1983-03-25 1983-03-25 粒径測定装置
US06/541,023 US4595291A (en) 1982-10-15 1983-10-12 Particle diameter measuring device
DE8383306227T DE3381178D1 (de) 1982-10-15 1983-10-14 Teilchendurchmesser-messvorrichtung.
EP83306227A EP0106684B1 (en) 1982-10-15 1983-10-14 Particle diameter measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58049923A JPS59174737A (ja) 1983-03-25 1983-03-25 粒径測定装置

Publications (2)

Publication Number Publication Date
JPS59174737A true JPS59174737A (ja) 1984-10-03
JPH0237977B2 JPH0237977B2 (enrdf_load_stackoverflow) 1990-08-28

Family

ID=12844531

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58049923A Granted JPS59174737A (ja) 1982-10-15 1983-03-25 粒径測定装置

Country Status (1)

Country Link
JP (1) JPS59174737A (enrdf_load_stackoverflow)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61270639A (ja) * 1985-05-25 1986-11-29 Japan Spectroscopic Co フロ−サイトメ−タ
JPS6288905A (ja) * 1985-10-09 1987-04-23 コムビナ−ト・フアウ・エ−・ベ−・ナルバ 細い線材等の無接触直径測定方法及びその装置
JPH01503178A (ja) * 1987-06-29 1989-10-26 クールター　エレクトロニクス　オブ　ニュー　イングランド，インコーポレイテッド 流体中に分散される粒子の粒子サイズ分布測定方法および装置
JPH03115950A (ja) * 1989-09-29 1991-05-16 Shimadzu Corp 粒度分布測定装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61270639A (ja) * 1985-05-25 1986-11-29 Japan Spectroscopic Co フロ−サイトメ−タ
JPS6288905A (ja) * 1985-10-09 1987-04-23 コムビナ−ト・フアウ・エ−・ベ−・ナルバ 細い線材等の無接触直径測定方法及びその装置
JPH01503178A (ja) * 1987-06-29 1989-10-26 クールター　エレクトロニクス　オブ　ニュー　イングランド，インコーポレイテッド 流体中に分散される粒子の粒子サイズ分布測定方法および装置
JPH03115950A (ja) * 1989-09-29 1991-05-16 Shimadzu Corp 粒度分布測定装置

Also Published As

Publication number Publication date
JPH0237977B2 (enrdf_load_stackoverflow) 1990-08-28

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