JPH0237977B2 - - Google Patents

Info

Publication number
JPH0237977B2
JPH0237977B2 JP58049923A JP4992383A JPH0237977B2 JP H0237977 B2 JPH0237977 B2 JP H0237977B2 JP 58049923 A JP58049923 A JP 58049923A JP 4992383 A JP4992383 A JP 4992383A JP H0237977 B2 JPH0237977 B2 JP H0237977B2
Authority
JP
Japan
Prior art keywords
particle size
measured
scattering angle
intensity distribution
particles
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58049923A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59174737A (ja
Inventor
Kyoichi Tatsuno
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP58049923A priority Critical patent/JPS59174737A/ja
Priority to US06/541,023 priority patent/US4595291A/en
Priority to EP83306227A priority patent/EP0106684B1/en
Priority to DE8383306227T priority patent/DE3381178D1/de
Publication of JPS59174737A publication Critical patent/JPS59174737A/ja
Publication of JPH0237977B2 publication Critical patent/JPH0237977B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4711—Multiangle measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4711—Multiangle measurement
    • G01N2021/4716—Using a ring of sensors, or a combination of diaphragm and sensors; Annular sensor

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP58049923A 1982-10-15 1983-03-25 粒径測定装置 Granted JPS59174737A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP58049923A JPS59174737A (ja) 1983-03-25 1983-03-25 粒径測定装置
US06/541,023 US4595291A (en) 1982-10-15 1983-10-12 Particle diameter measuring device
EP83306227A EP0106684B1 (en) 1982-10-15 1983-10-14 Particle diameter measuring device
DE8383306227T DE3381178D1 (de) 1982-10-15 1983-10-14 Teilchendurchmesser-messvorrichtung.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58049923A JPS59174737A (ja) 1983-03-25 1983-03-25 粒径測定装置

Publications (2)

Publication Number Publication Date
JPS59174737A JPS59174737A (ja) 1984-10-03
JPH0237977B2 true JPH0237977B2 (enrdf_load_stackoverflow) 1990-08-28

Family

ID=12844531

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58049923A Granted JPS59174737A (ja) 1982-10-15 1983-03-25 粒径測定装置

Country Status (1)

Country Link
JP (1) JPS59174737A (enrdf_load_stackoverflow)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61270639A (ja) * 1985-05-25 1986-11-29 Japan Spectroscopic Co フロ−サイトメ−タ
DD241643A1 (de) * 1985-10-09 1986-12-17 Narva Rosa Luxemburg K Messverfahren und vorrichtung zur beruehrungslosen durchmesserbestimmung duenner draehte
US4781460A (en) * 1986-01-08 1988-11-01 Coulter Electronics Of New England, Inc. System for measuring the size distribution of particles dispersed in a fluid
JPH0643950B2 (ja) * 1989-09-29 1994-06-08 株式会社島津製作所 粒度分布測定装置

Also Published As

Publication number Publication date
JPS59174737A (ja) 1984-10-03

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