JPS59123154A - 飛行時間型質量分析装置 - Google Patents

飛行時間型質量分析装置

Info

Publication number
JPS59123154A
JPS59123154A JP57230158A JP23015882A JPS59123154A JP S59123154 A JPS59123154 A JP S59123154A JP 57230158 A JP57230158 A JP 57230158A JP 23015882 A JP23015882 A JP 23015882A JP S59123154 A JPS59123154 A JP S59123154A
Authority
JP
Japan
Prior art keywords
ions
analysis tube
ion
electric field
analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57230158A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0346946B2 (enExample
Inventor
Keiichi Yoshida
佳一 吉田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Shimazu Seisakusho KK
Original Assignee
Shimadzu Corp
Shimazu Seisakusho KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp, Shimazu Seisakusho KK filed Critical Shimadzu Corp
Priority to JP57230158A priority Critical patent/JPS59123154A/ja
Publication of JPS59123154A publication Critical patent/JPS59123154A/ja
Publication of JPH0346946B2 publication Critical patent/JPH0346946B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • H01J49/40Time-of-flight spectrometers
    • H01J49/405Time-of-flight spectrometers characterised by the reflectron, e.g. curved field, electrode shapes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP57230158A 1982-12-29 1982-12-29 飛行時間型質量分析装置 Granted JPS59123154A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57230158A JPS59123154A (ja) 1982-12-29 1982-12-29 飛行時間型質量分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57230158A JPS59123154A (ja) 1982-12-29 1982-12-29 飛行時間型質量分析装置

Publications (2)

Publication Number Publication Date
JPS59123154A true JPS59123154A (ja) 1984-07-16
JPH0346946B2 JPH0346946B2 (enExample) 1991-07-17

Family

ID=16903498

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57230158A Granted JPS59123154A (ja) 1982-12-29 1982-12-29 飛行時間型質量分析装置

Country Status (1)

Country Link
JP (1) JPS59123154A (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6234755U (enExample) * 1985-08-19 1987-02-28
US4742224A (en) * 1986-12-22 1988-05-03 American Telephone And Telegraph Company At&T Bell Laboratories Charged particle energy filter
US8664592B2 (en) 2010-09-08 2014-03-04 Shimadzu Corporation Time-of-flight mass spectrometer
JP2015118887A (ja) * 2013-12-20 2015-06-25 株式会社島津製作所 飛行時間型質量分析装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58198844A (ja) * 1982-05-17 1983-11-18 Toshiba Corp イオン発生収束装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58198844A (ja) * 1982-05-17 1983-11-18 Toshiba Corp イオン発生収束装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6234755U (enExample) * 1985-08-19 1987-02-28
US4742224A (en) * 1986-12-22 1988-05-03 American Telephone And Telegraph Company At&T Bell Laboratories Charged particle energy filter
US8664592B2 (en) 2010-09-08 2014-03-04 Shimadzu Corporation Time-of-flight mass spectrometer
JP2015118887A (ja) * 2013-12-20 2015-06-25 株式会社島津製作所 飛行時間型質量分析装置

Also Published As

Publication number Publication date
JPH0346946B2 (enExample) 1991-07-17

Similar Documents

Publication Publication Date Title
JPH0468740B2 (enExample)
US6974957B2 (en) Ionization device for aerosol mass spectrometer and method of ionization
US6781121B1 (en) Time-of-flight mass spectrometer
US5300774A (en) Time-of-flight mass spectrometer with an aperture enabling tradeoff of transmission efficiency and resolution
US7141785B2 (en) Ion detector
US8461521B2 (en) Linear time-of-flight mass spectrometry with simultaneous space and velocity focusing
US8674292B2 (en) Reflector time-of-flight mass spectrometry with simultaneous space and velocity focusing
US4267448A (en) Ion detector with bipolar accelerating electrode
US3576992A (en) Time-of-flight mass spectrometer having both linear and curved drift regions whose energy dispersions with time are mutually compensatory
JP3392345B2 (ja) 飛行時間型質量分析装置
JPS59123154A (ja) 飛行時間型質量分析装置
JP3830344B2 (ja) 垂直加速型飛行時間型質量分析装置
US10128098B2 (en) System and methodology for expressing ion path in a time-of-flight mass spectrometer
US7388193B2 (en) Time-of-flight spectrometer with orthogonal pulsed ion detection
RU2122257C1 (ru) Пылеударный масс-спектрометр
RU2239910C2 (ru) Времяпролетный масс-спектрометр
JPS58172854A (ja) 飛行時間型イオン質量分析装置
JP3133394B2 (ja) パルスビーム発生装置
CN203481184U (zh) 一种脉冲式离子源及质谱仪
CN114175210B (zh) 多重环绕飞行时间型质量分析装置
SU1462521A1 (ru) Ионизационный датчик распределени плотности пучка зар женных частиц по поперечному сечению
Burke Ice Particle Impact Phenomena and Hypervelocity Impact Ionization Mass Spectra
JPH0665022B2 (ja) 飛行時間型質量分析計
JPH0548575B2 (enExample)
JPH0548576B2 (enExample)