JPH0468740B2 - - Google Patents

Info

Publication number
JPH0468740B2
JPH0468740B2 JP58227393A JP22739383A JPH0468740B2 JP H0468740 B2 JPH0468740 B2 JP H0468740B2 JP 58227393 A JP58227393 A JP 58227393A JP 22739383 A JP22739383 A JP 22739383A JP H0468740 B2 JPH0468740 B2 JP H0468740B2
Authority
JP
Japan
Prior art keywords
ion
analysis tube
electric field
ions
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58227393A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60119067A (ja
Inventor
Keiichi Yoshida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP58227393A priority Critical patent/JPS60119067A/ja
Priority to GB08415521A priority patent/GB2153139B/en
Priority to US06/622,845 priority patent/US4625112A/en
Priority to DE3423394A priority patent/DE3423394C2/de
Publication of JPS60119067A publication Critical patent/JPS60119067A/ja
Publication of JPH0468740B2 publication Critical patent/JPH0468740B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • H01J49/405—Time-of-flight spectrometers characterised by the reflectron, e.g. curved field, electrode shapes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP58227393A 1983-11-30 1983-11-30 飛行時間型質量分析装置 Granted JPS60119067A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP58227393A JPS60119067A (ja) 1983-11-30 1983-11-30 飛行時間型質量分析装置
GB08415521A GB2153139B (en) 1983-11-30 1984-06-18 Time of flight mass spectrometer
US06/622,845 US4625112A (en) 1983-11-30 1984-06-21 Time of flight mass spectrometer
DE3423394A DE3423394C2 (de) 1983-11-30 1984-06-25 Laufzeit-Massenspektrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58227393A JPS60119067A (ja) 1983-11-30 1983-11-30 飛行時間型質量分析装置

Publications (2)

Publication Number Publication Date
JPS60119067A JPS60119067A (ja) 1985-06-26
JPH0468740B2 true JPH0468740B2 (enExample) 1992-11-04

Family

ID=16860115

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58227393A Granted JPS60119067A (ja) 1983-11-30 1983-11-30 飛行時間型質量分析装置

Country Status (4)

Country Link
US (1) US4625112A (enExample)
JP (1) JPS60119067A (enExample)
DE (1) DE3423394C2 (enExample)
GB (1) GB2153139B (enExample)

Families Citing this family (41)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3524536A1 (de) * 1985-07-10 1987-01-22 Bruker Analytische Messtechnik Flugzeit-massenspektrometer mit einem ionenreflektor
JP2523781B2 (ja) * 1988-04-28 1996-08-14 日本電子株式会社 飛行時間型／偏向二重収束型切換質量分析装置
DE3842044A1 (de) * 1988-12-14 1990-06-21 Forschungszentrum Juelich Gmbh Flugzeit(massen)spektrometer mit hoher aufloesung und transmission
GB8915972D0 (en) * 1989-07-12 1989-08-31 Kratos Analytical Ltd An ion mirror for a time-of-flight mass spectrometer
US5026988A (en) * 1989-09-19 1991-06-25 Vanderbilt University Method and apparatus for time of flight medium energy particle scattering
US5017780A (en) * 1989-09-20 1991-05-21 Roland Kutscher Ion reflector
US5180914A (en) * 1990-05-11 1993-01-19 Kratos Analytical Limited Mass spectrometry systems
GB9010619D0 (en) * 1990-05-11 1990-07-04 Kratos Analytical Ltd Ion storage device
US5300774A (en) * 1991-04-25 1994-04-05 Applied Biosystems, Inc. Time-of-flight mass spectrometer with an aperture enabling tradeoff of transmission efficiency and resolution
US5605798A (en) 1993-01-07 1997-02-25 Sequenom, Inc. DNA diagnostic based on mass spectrometry
US5770859A (en) * 1994-07-25 1998-06-23 The Perkin-Elmer Corporation Time of flight mass spectrometer having microchannel plate and modified dynode for improved sensitivity
EP0704879A1 (en) * 1994-09-30 1996-04-03 Hewlett-Packard Company Charged particle mirror
US5998215A (en) * 1995-05-01 1999-12-07 The Regents Of The University Of California Portable analyzer for determining size and chemical composition of an aerosol
US6002127A (en) 1995-05-19 1999-12-14 Perseptive Biosystems, Inc. Time-of-flight mass spectrometry analysis of biomolecules
US5625184A (en) * 1995-05-19 1997-04-29 Perseptive Biosystems, Inc. Time-of-flight mass spectrometry analysis of biomolecules
US5742049A (en) * 1995-12-21 1998-04-21 Bruker-Franzen Analytik Gmbh Method of improving mass resolution in time-of-flight mass spectrometry
JPH10134764A (ja) * 1996-11-01 1998-05-22 Jeol Ltd 質量分析装置
US5814813A (en) * 1996-07-08 1998-09-29 The Johns Hopkins University End cap reflection for a time-of-flight mass spectrometer and method of using the same
US5864137A (en) * 1996-10-01 1999-01-26 Genetrace Systems, Inc. Mass spectrometer
EP1164203B1 (en) 1996-11-06 2007-10-10 Sequenom, Inc. DNA Diagnostics based on mass spectrometry
JP2001524808A (ja) 1996-12-10 2001-12-04 ジーントレイス・システムズ・インコーポレイテッド 放出可能な不揮発性の質量標識分子
US6107625A (en) * 1997-05-30 2000-08-22 Bruker Daltonics, Inc. Coaxial multiple reflection time-of-flight mass spectrometer
US6365892B1 (en) 1997-11-24 2002-04-02 Robert J. Cotter Method and apparatus for correction of initial ion velocity in a reflectron time-of-flight mass spectrometer
GB9802115D0 (en) 1998-01-30 1998-04-01 Shimadzu Res Lab Europe Ltd Time-of-flight mass spectrometer
US6518569B1 (en) 1999-06-11 2003-02-11 Science & Technology Corporation @ Unm Ion mirror
WO2001013405A1 (en) 1999-08-16 2001-02-22 The Johns Hopkins University Ion reflectron comprising a flexible printed circuit board
US6627874B1 (en) 2000-03-07 2003-09-30 Agilent Technologies, Inc. Pressure measurement using ion beam current in a mass spectrometer
ATE423221T1 (de) 2000-06-13 2009-03-15 Univ Boston Verwendung von mass-matched nukleotide in der analyse von oligonukleotidmischungen sowie in der hoch-multiplexen nukleinsäuresequenzierung
JP3797200B2 (ja) 2001-11-09 2006-07-12 株式会社島津製作所 飛行時間型質量分析装置
US6791079B2 (en) * 2002-01-29 2004-09-14 Yuri Glukhoy Mass spectrometer based on the use of quadrupole lenses with angular gradient of the electrostatic field
US7605377B2 (en) * 2006-10-17 2009-10-20 Zyvex Corporation On-chip reflectron and ion optics
GB0624677D0 (en) * 2006-12-11 2007-01-17 Shimadzu Corp A co-axial time-of-flight mass spectrometer
JP5259169B2 (ja) * 2007-01-10 2013-08-07 日本電子株式会社 タンデム型飛行時間型質量分析装置および方法
GB0712252D0 (en) * 2007-06-22 2007-08-01 Shimadzu Corp A multi-reflecting ion optical device
CN101800151A (zh) * 2010-02-24 2010-08-11 方向 非对称场反射式飞行时间质谱仪
US8664592B2 (en) 2010-09-08 2014-03-04 Shimadzu Corporation Time-of-flight mass spectrometer
CN102074449B (zh) * 2010-11-18 2015-09-02 上海华质生物技术有限公司 电极矩阵及其制作方法
EP2669930B1 (en) 2010-12-20 2018-02-14 Shimadzu Corporation Time-of-flight mass spectrometer
GB2499587B (en) 2012-02-21 2016-06-01 Thermo Fisher Scient (Bremen) Gmbh Apparatus and methods for ion mobility spectrometry
US9995712B2 (en) 2014-06-10 2018-06-12 Micromass Uk Limited Segmented linear ion mobility spectrometer driver
CN112435914B (zh) * 2020-12-28 2024-10-11 安图实验仪器(郑州)有限公司 离子质量分析器

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB594344A (en) * 1942-12-15 1947-11-10 Western Electric Co Improvements in electric discharge devices
NL86953C (enExample) * 1950-12-02
US3258591A (en) * 1961-12-22 1966-06-28 Pulse type mass spectrometer wherein ions are separated by oscillations in an electrostatic field
US3258592A (en) * 1961-12-23 1966-06-28 Dynamic mass spectrometer wherein ions are periodically oscillated until se- lectively accelerated to a detector
US3626181A (en) * 1969-02-11 1971-12-07 Franklin Gno Corp Gas detecting apparatus with means to record detection signals in superposition for improved signal-to-noise ratios
US3727047A (en) * 1971-07-22 1973-04-10 Avco Corp Time of flight mass spectrometer comprising a reflecting means which equalizes time of flight of ions having same mass to charge ratio
DE2540505A1 (de) * 1975-09-11 1977-03-24 Leybold Heraeus Gmbh & Co Kg Flugzeit-massenspektrometer fuer ionen mit unterschiedlichen energien

Also Published As

Publication number Publication date
DE3423394C2 (de) 1994-01-20
US4625112A (en) 1986-11-25
GB8415521D0 (en) 1984-07-25
JPS60119067A (ja) 1985-06-26
DE3423394A1 (de) 1985-06-05
GB2153139A (en) 1985-08-14
GB2153139B (en) 1987-11-25

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