JPH0346946B2 - - Google Patents

Info

Publication number
JPH0346946B2
JPH0346946B2 JP57230158A JP23015882A JPH0346946B2 JP H0346946 B2 JPH0346946 B2 JP H0346946B2 JP 57230158 A JP57230158 A JP 57230158A JP 23015882 A JP23015882 A JP 23015882A JP H0346946 B2 JPH0346946 B2 JP H0346946B2
Authority
JP
Japan
Prior art keywords
ions
analysis tube
ion
flight
axis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57230158A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59123154A (ja
Inventor
Keiichi Yoshida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP57230158A priority Critical patent/JPS59123154A/ja
Publication of JPS59123154A publication Critical patent/JPS59123154A/ja
Publication of JPH0346946B2 publication Critical patent/JPH0346946B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • H01J49/405—Time-of-flight spectrometers characterised by the reflectron, e.g. curved field, electrode shapes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP57230158A 1982-12-29 1982-12-29 飛行時間型質量分析装置 Granted JPS59123154A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57230158A JPS59123154A (ja) 1982-12-29 1982-12-29 飛行時間型質量分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57230158A JPS59123154A (ja) 1982-12-29 1982-12-29 飛行時間型質量分析装置

Publications (2)

Publication Number Publication Date
JPS59123154A JPS59123154A (ja) 1984-07-16
JPH0346946B2 true JPH0346946B2 (enExample) 1991-07-17

Family

ID=16903498

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57230158A Granted JPS59123154A (ja) 1982-12-29 1982-12-29 飛行時間型質量分析装置

Country Status (1)

Country Link
JP (1) JPS59123154A (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0334831Y2 (enExample) * 1985-08-19 1991-07-24
US4742224A (en) * 1986-12-22 1988-05-03 American Telephone And Telegraph Company At&T Bell Laboratories Charged particle energy filter
US8664592B2 (en) 2010-09-08 2014-03-04 Shimadzu Corporation Time-of-flight mass spectrometer
JP6160472B2 (ja) * 2013-12-20 2017-07-12 株式会社島津製作所 飛行時間型質量分析装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5939852B2 (ja) * 1982-05-17 1984-09-26 株式会社東芝 イオン発生収束装置

Also Published As

Publication number Publication date
JPS59123154A (ja) 1984-07-16

Similar Documents

Publication Publication Date Title
JPH0468740B2 (enExample)
US6661001B2 (en) Extended bradbury-nielson gate
US6576895B1 (en) Coaxial multiple reflection time-of-flight mass spectrometer
JP6256557B2 (ja) 飛行時間型質量分析装置
USRE38861E1 (en) Multideflector
EP0408288B1 (en) An ion mirror for a time-of-flight mass spectrometer
WO2013076307A2 (en) High duty cycle ion spectrometer
JPH07500448A (ja) 分解能と伝達効率との間の性能配分を可能とする開口を備えた飛行時間型質量分析計
US20040232327A1 (en) Mass spectrometer
JP2006049273A (ja) 垂直加速型飛行時間型質量分析計
US3576992A (en) Time-of-flight mass spectrometer having both linear and curved drift regions whose energy dispersions with time are mutually compensatory
JP3392345B2 (ja) 飛行時間型質量分析装置
EP0456516B1 (en) Ion buncher
JPH0346946B2 (enExample)
CN103531432A (zh) 一种脉冲式离子源、质谱仪及产生离子的方法
US20060163473A1 (en) Ion optics systems
US7388193B2 (en) Time-of-flight spectrometer with orthogonal pulsed ion detection
US20150155154A1 (en) Miniature time-of-flight mass spectrometer
Geno et al. 252Cf plasma desorption mass spectrometry using a Mamyrin reflectron in a low voltage regime
US20030127582A1 (en) Method for enhancing photomultiplier tube speed
RU2239910C2 (ru) Времяпролетный масс-спектрометр
JP5243977B2 (ja) 垂直加速型飛行時間型質量分析計
CN114175210B (zh) 多重环绕飞行时间型质量分析装置
RU2769377C1 (ru) Времяпролетный масс-спектрометр
CN203481184U (zh) 一种脉冲式离子源及质谱仪