JPS5910834A - レ−ザ・ラマン・マイクロプロ−ブ - Google Patents

レ−ザ・ラマン・マイクロプロ−ブ

Info

Publication number
JPS5910834A
JPS5910834A JP11851482A JP11851482A JPS5910834A JP S5910834 A JPS5910834 A JP S5910834A JP 11851482 A JP11851482 A JP 11851482A JP 11851482 A JP11851482 A JP 11851482A JP S5910834 A JPS5910834 A JP S5910834A
Authority
JP
Japan
Prior art keywords
laser
sample
light
raman
objective lens
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11851482A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0465335B2 (enExample
Inventor
Kenji Tochigi
栃木　憲治
Yoshiaki Haniyu
羽生　孔昭
Yutaka Hiratsuka
豊 平塚
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP11851482A priority Critical patent/JPS5910834A/ja
Priority to US06/510,912 priority patent/US4586819A/en
Priority to FR8311469A priority patent/FR2530024B1/fr
Publication of JPS5910834A publication Critical patent/JPS5910834A/ja
Publication of JPH0465335B2 publication Critical patent/JPH0465335B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65—Raman scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65—Raman scattering
    • G01N2021/653—Coherent methods [CARS]
    • G01N2021/656—Raman microprobe

Landscapes

  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP11851482A 1982-07-09 1982-07-09 レ−ザ・ラマン・マイクロプロ−ブ Granted JPS5910834A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP11851482A JPS5910834A (ja) 1982-07-09 1982-07-09 レ−ザ・ラマン・マイクロプロ−ブ
US06/510,912 US4586819A (en) 1982-07-09 1983-07-05 Laser Raman microprobe
FR8311469A FR2530024B1 (fr) 1982-07-09 1983-07-08 Microsonde a effet raman a laser

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11851482A JPS5910834A (ja) 1982-07-09 1982-07-09 レ−ザ・ラマン・マイクロプロ−ブ

Publications (2)

Publication Number Publication Date
JPS5910834A true JPS5910834A (ja) 1984-01-20
JPH0465335B2 JPH0465335B2 (enExample) 1992-10-19

Family

ID=14738510

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11851482A Granted JPS5910834A (ja) 1982-07-09 1982-07-09 レ−ザ・ラマン・マイクロプロ−ブ

Country Status (1)

Country Link
JP (1) JPS5910834A (enExample)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0373198A (ja) * 1990-07-23 1991-03-28 Toshiba Corp 脱水兼用洗濯機
JPH0745110A (ja) * 1993-07-31 1995-02-14 Morimura Kosan Kk 照明カバー及びその製造方法
US5424825A (en) * 1991-10-01 1995-06-13 Dilor Spectral-band filtration spectrometry apparatus
EP0751382A3 (en) * 1995-06-28 1997-05-07 Kyoto Daiichi Kagaku Kk Method and device for measuring spectra
US7245426B2 (en) 2001-11-06 2007-07-17 Olympus Optical Co., Ltd. Total internal reflection illumination apparatus and microscope using this total internal reflection illumination apparatus

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8077309B2 (en) * 2007-01-29 2011-12-13 Applied Instrument Technologies, Inc. Chemical analyzer for industrial process control

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4030827A (en) * 1973-12-03 1977-06-21 Institut National De La Sante Et De La Recherche Medicale (Inserm) Apparatus for the non-destructive examination of heterogeneous samples
JPS52152780A (en) * 1976-05-18 1977-12-19 Gen Electric Method of and spectrometer for measuring light intensity

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4030827A (en) * 1973-12-03 1977-06-21 Institut National De La Sante Et De La Recherche Medicale (Inserm) Apparatus for the non-destructive examination of heterogeneous samples
JPS52152780A (en) * 1976-05-18 1977-12-19 Gen Electric Method of and spectrometer for measuring light intensity

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0373198A (ja) * 1990-07-23 1991-03-28 Toshiba Corp 脱水兼用洗濯機
US5424825A (en) * 1991-10-01 1995-06-13 Dilor Spectral-band filtration spectrometry apparatus
JPH0745110A (ja) * 1993-07-31 1995-02-14 Morimura Kosan Kk 照明カバー及びその製造方法
EP0751382A3 (en) * 1995-06-28 1997-05-07 Kyoto Daiichi Kagaku Kk Method and device for measuring spectra
US7245426B2 (en) 2001-11-06 2007-07-17 Olympus Optical Co., Ltd. Total internal reflection illumination apparatus and microscope using this total internal reflection illumination apparatus

Also Published As

Publication number Publication date
JPH0465335B2 (enExample) 1992-10-19

Similar Documents

Publication Publication Date Title
US4251129A (en) Photoelectric detecting device
US4406546A (en) Photoelectric detecting device
US4831276A (en) Apparatus for measuring reflectivity
US4933541A (en) Method and apparatus for active vision image enhancement with wavelength matching
JPS5910834A (ja) レ−ザ・ラマン・マイクロプロ−ブ
JP3413967B2 (ja) 蛍光顕微鏡
JPS62121335A (ja) フイルムまたはコ−テイングの厚さ、含水量、その他のパラメ−タの測定装置
JP7509575B2 (ja) 熱輻射光検出装置及びレーザ加工装置
US11016023B1 (en) Far-infrared spectroscopic device and far-infrared spectroscopic method
JPH0465336B2 (enExample)
JPH01188816A (ja) 分光型走査顕微鏡
CN105758842B (zh) 一种激光诱导击穿光谱分析仪的滤波系统
JP2016114532A (ja) 光熱変換分光分析装置
JPH02304332A (ja) 粒子計測装置
CN205656135U (zh) 一种激光诱导击穿光谱分析仪
KR920006391B1 (ko) 레이저 가공기에서 레이저와 가공물체간의 상호작용 상태에 대한 실시간(real time)감시 장치
EP0162973A1 (en) Distance measuring device
JPS59220634A (ja) レ−ザラマンマイクロプロ−ブ用レ−ザ光照射装置
JPS62245942A (ja) 粒子解析装置
JPS58154642A (ja) レ−ザラマンマイクロプロ−ブ用光学装置
JPS55124008A (en) Defect inspecting apparatus
JPS59107243A (ja) レ−ザ・ラマン・マイクロプロ−ブ
JP2895021B2 (ja) 光源変化監視方法および装置
JPS61165637A (ja) 粒子解析装置
JP2558202Y2 (ja) 顕微赤外スペクトル測定装置