JPS59106125A - ボンデイング面接触検出装置 - Google Patents
ボンデイング面接触検出装置Info
- Publication number
- JPS59106125A JPS59106125A JP57217213A JP21721382A JPS59106125A JP S59106125 A JPS59106125 A JP S59106125A JP 57217213 A JP57217213 A JP 57217213A JP 21721382 A JP21721382 A JP 21721382A JP S59106125 A JPS59106125 A JP S59106125A
- Authority
- JP
- Japan
- Prior art keywords
- current
- circuit
- bonding
- capillary
- ultrasonic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/0711—Apparatus therefor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/0711—Apparatus therefor
- H10W72/07141—Means for applying energy, e.g. ovens or lasers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/756—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked lead frame, conducting package substrate or heat sink
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Wire Bonding (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57217213A JPS59106125A (ja) | 1982-12-10 | 1982-12-10 | ボンデイング面接触検出装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57217213A JPS59106125A (ja) | 1982-12-10 | 1982-12-10 | ボンデイング面接触検出装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59106125A true JPS59106125A (ja) | 1984-06-19 |
| JPS64811B2 JPS64811B2 (enExample) | 1989-01-09 |
Family
ID=16700630
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57217213A Granted JPS59106125A (ja) | 1982-12-10 | 1982-12-10 | ボンデイング面接触検出装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59106125A (enExample) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0231439A (ja) * | 1988-07-21 | 1990-02-01 | Texas Instr Japan Ltd | ボンディング方法及びその装置 |
| JP2011117925A (ja) * | 2009-12-02 | 2011-06-16 | Samsung Electro-Mechanics Co Ltd | 回路パターンの欠陥検査装置およびその検査方法 |
| CN115206825A (zh) * | 2021-04-12 | 2022-10-18 | 东莞触点智能装备有限公司 | 一种芯片贴合的接触确定方法、系统、固晶机及存储介质 |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02101311U (enExample) * | 1989-01-24 | 1990-08-13 |
-
1982
- 1982-12-10 JP JP57217213A patent/JPS59106125A/ja active Granted
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0231439A (ja) * | 1988-07-21 | 1990-02-01 | Texas Instr Japan Ltd | ボンディング方法及びその装置 |
| JP2011117925A (ja) * | 2009-12-02 | 2011-06-16 | Samsung Electro-Mechanics Co Ltd | 回路パターンの欠陥検査装置およびその検査方法 |
| CN115206825A (zh) * | 2021-04-12 | 2022-10-18 | 东莞触点智能装备有限公司 | 一种芯片贴合的接触确定方法、系统、固晶机及存储介质 |
| CN115206825B (zh) * | 2021-04-12 | 2023-06-09 | 东莞触点智能装备有限公司 | 一种芯片贴合的接触确定方法、系统、固晶机及存储介质 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS64811B2 (enExample) | 1989-01-09 |
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