JPS59102156A - 超音波顕微鏡 - Google Patents

超音波顕微鏡

Info

Publication number
JPS59102156A
JPS59102156A JP57211386A JP21138682A JPS59102156A JP S59102156 A JPS59102156 A JP S59102156A JP 57211386 A JP57211386 A JP 57211386A JP 21138682 A JP21138682 A JP 21138682A JP S59102156 A JPS59102156 A JP S59102156A
Authority
JP
Japan
Prior art keywords
sample
acoustic lens
ultrasonic
signal
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57211386A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0457975B2 (de
Inventor
Fumio Uchino
内野　文雄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Corp
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Corp, Olympus Optical Co Ltd filed Critical Olympus Corp
Priority to JP57211386A priority Critical patent/JPS59102156A/ja
Publication of JPS59102156A publication Critical patent/JPS59102156A/ja
Publication of JPH0457975B2 publication Critical patent/JPH0457975B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4454—Signal recognition, e.g. specific values or portions, signal events, signatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy

Landscapes

  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Acoustics & Sound (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
JP57211386A 1982-12-03 1982-12-03 超音波顕微鏡 Granted JPS59102156A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57211386A JPS59102156A (ja) 1982-12-03 1982-12-03 超音波顕微鏡

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57211386A JPS59102156A (ja) 1982-12-03 1982-12-03 超音波顕微鏡

Publications (2)

Publication Number Publication Date
JPS59102156A true JPS59102156A (ja) 1984-06-13
JPH0457975B2 JPH0457975B2 (de) 1992-09-16

Family

ID=16605094

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57211386A Granted JPS59102156A (ja) 1982-12-03 1982-12-03 超音波顕微鏡

Country Status (1)

Country Link
JP (1) JPS59102156A (de)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS617465A (ja) * 1984-06-20 1986-01-14 Mitsubishi Electric Corp 超音波検査装置
FR2602043A1 (fr) * 1986-07-24 1988-01-29 France Etat Procede de mesure non destructive du profil d'une surface

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS617465A (ja) * 1984-06-20 1986-01-14 Mitsubishi Electric Corp 超音波検査装置
JPH0552461B2 (de) * 1984-06-20 1993-08-05 Mitsubishi Electric Corp
FR2602043A1 (fr) * 1986-07-24 1988-01-29 France Etat Procede de mesure non destructive du profil d'une surface

Also Published As

Publication number Publication date
JPH0457975B2 (de) 1992-09-16

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