JPS5852755A - スキャンイン方式 - Google Patents

スキャンイン方式

Info

Publication number
JPS5852755A
JPS5852755A JP56151045A JP15104581A JPS5852755A JP S5852755 A JPS5852755 A JP S5852755A JP 56151045 A JP56151045 A JP 56151045A JP 15104581 A JP15104581 A JP 15104581A JP S5852755 A JPS5852755 A JP S5852755A
Authority
JP
Japan
Prior art keywords
scan
latch
data processing
distributor
screen
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56151045A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6143740B2 (enrdf_load_stackoverflow
Inventor
Hiroshi Yonemasu
米増　弘
Hidekiyo Ozawa
小沢　秀清
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP56151045A priority Critical patent/JPS5852755A/ja
Publication of JPS5852755A publication Critical patent/JPS5852755A/ja
Publication of JPS6143740B2 publication Critical patent/JPS6143740B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318558—Addressing or selecting of subparts of the device under test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Digital Computer Display Output (AREA)
JP56151045A 1981-09-24 1981-09-24 スキャンイン方式 Granted JPS5852755A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56151045A JPS5852755A (ja) 1981-09-24 1981-09-24 スキャンイン方式

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56151045A JPS5852755A (ja) 1981-09-24 1981-09-24 スキャンイン方式

Publications (2)

Publication Number Publication Date
JPS5852755A true JPS5852755A (ja) 1983-03-29
JPS6143740B2 JPS6143740B2 (enrdf_load_stackoverflow) 1986-09-29

Family

ID=15510088

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56151045A Granted JPS5852755A (ja) 1981-09-24 1981-09-24 スキャンイン方式

Country Status (1)

Country Link
JP (1) JPS5852755A (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPS6143740B2 (enrdf_load_stackoverflow) 1986-09-29

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