JPS5850480A - Ｍｏｓ集積回路 - Google Patents

Ｍｏｓ集積回路

Info

Publication number
JPS5850480A
JPS5850480A JP56149023A JP14902381A JPS5850480A JP S5850480 A JPS5850480 A JP S5850480A JP 56149023 A JP56149023 A JP 56149023A JP 14902381 A JP14902381 A JP 14902381A JP S5850480 A JPS5850480 A JP S5850480A
Authority
JP
Japan
Prior art keywords
potential
circuit
integrated circuit
terminal
outside
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56149023A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0232590B2 (cg-RX-API-DMAC7.html
Inventor
Masami Hashimoto
正美 橋本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Suwa Seikosha KK
Original Assignee
Seiko Epson Corp
Suwa Seikosha KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp, Suwa Seikosha KK filed Critical Seiko Epson Corp
Priority to JP56149023A priority Critical patent/JPS5850480A/ja
Publication of JPS5850480A publication Critical patent/JPS5850480A/ja
Publication of JPH0232590B2 publication Critical patent/JPH0232590B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP56149023A 1981-09-21 1981-09-21 Ｍｏｓ集積回路 Granted JPS5850480A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56149023A JPS5850480A (ja) 1981-09-21 1981-09-21 Ｍｏｓ集積回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56149023A JPS5850480A (ja) 1981-09-21 1981-09-21 Ｍｏｓ集積回路

Publications (2)

Publication Number Publication Date
JPS5850480A true JPS5850480A (ja) 1983-03-24
JPH0232590B2 JPH0232590B2 (cg-RX-API-DMAC7.html) 1990-07-20

Family

ID=15465975

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56149023A Granted JPS5850480A (ja) 1981-09-21 1981-09-21 Ｍｏｓ集積回路

Country Status (1)

Country Link
JP (1) JPS5850480A (cg-RX-API-DMAC7.html)

Also Published As

Publication number Publication date
JPH0232590B2 (cg-RX-API-DMAC7.html) 1990-07-20

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