JPS5847777U - Test head for testing printed wiring boards - Google Patents

Test head for testing printed wiring boards

Info

Publication number
JPS5847777U
JPS5847777U JP14437581U JP14437581U JPS5847777U JP S5847777 U JPS5847777 U JP S5847777U JP 14437581 U JP14437581 U JP 14437581U JP 14437581 U JP14437581 U JP 14437581U JP S5847777 U JPS5847777 U JP S5847777U
Authority
JP
Japan
Prior art keywords
printed wiring
test head
wiring boards
testing printed
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14437581U
Other languages
Japanese (ja)
Inventor
岩沢　光男
Original Assignee
三菱電機株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 三菱電機株式会社 filed Critical 三菱電機株式会社
Priority to JP14437581U priority Critical patent/JPS5847777U/en
Publication of JPS5847777U publication Critical patent/JPS5847777U/en
Pending legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Abstract] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of drawings]

第１図は従来の試験用テストヘッドによる印刷配線板の
パターン検査要領を示す説明図、第２図はこの考案の一
実施例によるテストヘッドのテストプローブの配置を示
す平面図である。 図面中、１は印刷配線板、２はパターン、３１はテスト
プローブ、Ｂはジグザグ軌跡線である。 なお、図中同一符号は同一または相当部分を示す。FIG. 1 is an explanatory diagram showing a pattern inspection procedure for a printed wiring board using a conventional test head, and FIG. 2 is a plan view showing the arrangement of test probes of a test head according to an embodiment of the present invention. In the drawing, 1 is a printed wiring board, 2 is a pattern, 31 is a test probe, and B is a zigzag trajectory line. Note that the same reference numerals in the figures indicate the same or corresponding parts.

Claims (2)

【実用新案登録請求の範囲】[Scope of utility model registration request] （１）　　印刷配線板に形成した複数のパターン上の所
定位置において互いにジグザグ軌跡線上でテストヘッド
のテストプローブを接触させるようにしたことを特徴と
する印刷配線板の試験用テストヘッド。(1) A test head for testing a printed wiring board, characterized in that the test probes of the test head are brought into contact with each other on a zigzag trajectory line at predetermined positions on a plurality of patterns formed on the printed wiring board. （２）ジグザグ軌跡線上の各頂点にテストヘッドのテス
トロープを接触させるようにしたことを特徴とする実用
新案登録請求の範囲第１項記載の印刷配線板の試験用テ
ストヘッド。(2) The test head for testing a printed wiring board according to claim 1, which is a utility model registration, characterized in that a test rope of the test head is brought into contact with each vertex on the zigzag trajectory line.
JP14437581U 1981-09-29 1981-09-29 Test head for testing printed wiring boards Pending JPS5847777U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14437581U JPS5847777U (en) 1981-09-29 1981-09-29 Test head for testing printed wiring boards

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14437581U JPS5847777U (en) 1981-09-29 1981-09-29 Test head for testing printed wiring boards

Publications (1)

Publication Number Publication Date
JPS5847777U true JPS5847777U (en) 1983-03-31

Family

ID=29937339

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14437581U Pending JPS5847777U (en) 1981-09-29 1981-09-29 Test head for testing printed wiring boards

Country Status (1)

Country Link
JP (1) JPS5847777U (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5291646A (en) * 1976-01-29 1977-08-02 Toshiba Corp Array probe card for testing ic wafer

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5291646A (en) * 1976-01-29 1977-08-02 Toshiba Corp Array probe card for testing ic wafer

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