JPS5839649U - test circuit - Google Patents
test circuitInfo
- Publication number
- JPS5839649U JPS5839649U JP13435281U JP13435281U JPS5839649U JP S5839649 U JPS5839649 U JP S5839649U JP 13435281 U JP13435281 U JP 13435281U JP 13435281 U JP13435281 U JP 13435281U JP S5839649 U JPS5839649 U JP S5839649U
- Authority
- JP
- Japan
- Prior art keywords
- test
- input function
- scan
- microprogram
- storage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Abstract] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第1図は従来のテスト回路の構成図、第2図は本考案の
テスト回路の実施例のブロック図、第3図は第2図を構
成する各要素の論理値の説明図である。
201.202・・・選択回路、210,211・・・
記憶部、240・・・テスト・フィールド、241・・
・ディストネーションフィールド。FIG. 1 is a block diagram of a conventional test circuit, FIG. 2 is a block diagram of an embodiment of the test circuit of the present invention, and FIG. 3 is an explanatory diagram of the logical values of each element constituting FIG. 201.202...Selection circuit, 210,211...
Storage section, 240...Test field, 241...
・Destination field.
Claims (1)
において、被テスト・デ、−夕ののマスク・パターンを
格納し、且つマイクロ・プログラムの書き込み命令及び
スキャン・インによる入力機能を有する第1の記憶部と
、目的とするテストの成立条件を示す期待値パターンを
格納し、且つマイクロ・プログラムの書き込み命令及び
スキャン・インによる入力機能を有する第2の記憶部と
、マイクロ拳プログラムのテスト・フィールド及びディ
ストネーション・フィールドによって、前記第1並びに
第2の記憶部をアドレスする手段と、前記第1の記憶部
の出力データで被テスト・データをマスクする機能を有
するゲート回路と、上記ゲート回路の出力と前記第2の
記憶部の出力とを比較して、テスチ結果を出力する比較
回路と、で構成され、前記第1並びに第2の記憶部に対
して、マイクロ・プログラムの書き込み命令あるいはス
キャン・インによる入力機能を用いて任意のパターンを
入力することによって、任意のテスト条件を設定できる
ように構成されてなることを特徴と −したテスト
回路。In an arithmetic processing unit controlled by a microprogram, a first storage unit stores a mask pattern of a device to be tested and has an input function by a microprogram write command and scan-in; , a second storage unit that stores an expected value pattern indicating the conditions for establishing the target test, and has an input function by a micro program write command and scan-in, and a test field and destination of the micro fist program. - means for addressing the first and second storage sections by fields; a gate circuit having a function of masking the data under test with the output data of the first storage section; a comparison circuit that compares the output of the second storage section and outputs a test result; A test circuit characterized in that it is configured such that arbitrary test conditions can be set by inputting an arbitrary pattern using an input function.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13435281U JPS5839649U (en) | 1981-09-11 | 1981-09-11 | test circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13435281U JPS5839649U (en) | 1981-09-11 | 1981-09-11 | test circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5839649U true JPS5839649U (en) | 1983-03-15 |
Family
ID=29927780
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13435281U Pending JPS5839649U (en) | 1981-09-11 | 1981-09-11 | test circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5839649U (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61134755U (en) * | 1985-02-09 | 1986-08-22 | ||
JPH0294751U (en) * | 1989-01-11 | 1990-07-27 | ||
JPH0611642U (en) * | 1991-12-05 | 1994-02-15 | 有限会社森井 | Portable insulation box |
-
1981
- 1981-09-11 JP JP13435281U patent/JPS5839649U/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61134755U (en) * | 1985-02-09 | 1986-08-22 | ||
JPH0243312Y2 (en) * | 1985-02-09 | 1990-11-19 | ||
JPH0294751U (en) * | 1989-01-11 | 1990-07-27 | ||
JPH0611642U (en) * | 1991-12-05 | 1994-02-15 | 有限会社森井 | Portable insulation box |
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