JPS5838812A - Data processing device - Google Patents

Abstract

PURPOSE:To obtain a frequency distribution state for every performance grade of a product group directly, by providing a memory means which stores the upper limit and lower limit of the performance of the product in advance, a comparing and judging means, and a counter. CONSTITUTION:With respect to a relay 1, whih is an object to be measured and whose adjustment is finished, an adjustment sensitivity value X, an open adjustment value Y, and the difference Z therebetween are inputted. Then the total number (n) of the grade number, by which the performance of the products is classified, is individually inputted with respect to the X-Z processing. Then, the lower performance value is loaded from an RAM8 with respect to each grade number (n), and comparison as to whether the measured value is larger than the lower limit or not is performed by a CPU7. When this condition is satisfied, the upper performance limit with respect to the number (n) is loaded from the RAM8, and the comparison as to whether the measured value is smaller than the upper limit or not is compared and judged by the CPU7. When this condition is satisfied, the frequency counter is counted up by 1. If this condition is not satisfied, it is counted down by 1. In this way, the frequency distribution of each grade of the product can be automatically obtained.

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a data processing device that is capable of determining the grade of a product according to measured performance values of the product and outputting the frequency distribution of each grade.

Conventionally, when measuring the performance of a product, the measured values were printed out one by one by a precipitator, and after the measurement was completed, the measured values were manually classified to create a frequency distribution table of the measured values. This method is designed to judge the performance of products for each test, but when classifying in this way, a large amount of time and effort is spent on inspection and classification.
Particularly when the number of samples is large, there is a problem that the possibility of errors occurring increases.

This memorandum was created in order to solve these problems of the conventional example, and the purpose is to provide a data processing device that can easily and quickly perform the data processing described above. That is.

The configuration of the present invention will be described below with reference to illustrated embodiments. 11
Figure 1 shows the configuration of the data processing device of the present invention, and as shown in the figure, the excitation coil (K is the output voltage of the DC amplifier (31) is applied to the relay +1, which is the object to be measured, The input side of this DC amplifier (31) is
) A triangular wave generation circuit that outputs a triangular wave signal as shown in (
4) is connected. The output of this main angle wave generation circuit (4) is also input to the AD converter (6), and is passed through the digitized measurement eater FiI10 port (6) to the CP
It is designed to be supplied to the U17+ side. (8) is RAM for storing various eta and measured values;
f9) This is a ROM for storing the Fi program a-j, and it is connected to the CPU via the address bus (10) and data bus (such as
(It is connected to 71. Furthermore, +121
is the precipitator that outputs the result. However, the CPU
(When a start signal as shown in Fig. 2 (a) is output from 71 to the triangular wave generation circuit (4) via the I10 boat (6), the relay (1) which is the object to be measured is outputted as shown in Fig. 2 (6). )
A voltage as shown in is applied, and at time t1, relay contact +11 closes and is connected to I10 boat (6) via resistor -.
) is input with a contact closing signal as shown in FIG. 2(c). As a result, the relay voltage v1 is measured, and in the same way, the relay open voltage v1 is measured at time t3.

Next, Figure 1Ja and Figure 4 are flowcharts showing the data processing procedure, in which the first Eta processing A is performed at the end of the adjustment process involved in assembly, and the final inspection after completing the product. In the process, a second data processing B is performed, and the data can be output as required. First, for the relay (1) that has been fully adjusted in the process of Eta processing A, after inputting the adjusted emotional value x1 - the adjusted opening value Y, and the difference z = x - y, the X processing, Y processing, and 2 processing. It jumps to each subroutine. The subroutine has an algorithm as shown in Figure 4, and processes the total number of station numbers n, which determines how many grades the product's performance is classified into.
Enter information for each of the two processes separately. Total number of station numbers nt
i. It also serves as a rule counter that determines how many times the comparison is to be made. When the total number of station numbers n is set,
Measured values to be eta-processed, such as X~2, are 0-coded. After this, for each grade number n, the performance lower limit value is first read from RAM f87, and it is compared and judged by CPU (71) whether the measured value is larger than the lower limit value, and if this condition is satisfied. In addition, the performance upper limit for the grade n is loaded from the RAM (8), and the CPU checks whether the measured value is smaller than the upper limit.
(If the condition is satisfied, the frequency counter D (El) is incremented by 1 and returned to Meishiruchishi. Also, if one of these two conditions is satisfied. If there was not,
It is checked whether or not the process is completed, that is, whether n=1, and if the value is not 1, the grade n is decreased by 1 and the comparison is made again. Therefore, the grade n gradually decreases from a high value to a low value, and at the stage when the condition is satisfied, the value of n of each frequency counter D(1) to D(B) when taken out of the loop becomes the value of n. If only the corresponding frequency counter D(6) is counted up, it becomes K, so it is possible to automatically know the frequency distribution of each grade of the product. If the measured value is not between the performance upper limit value and the performance lower limit value at any stage from grade n to grade 1, abnormal value processing is performed when the loop ends at the stage n = 1. If the product is determined to be particularly defective, the product is removed and returned to the main retailer. Such data processing is performed in exactly the same procedure as shown in Eta processing B in FIG. 3 in the final inspection step after the product is finally completed. Therefore, finally the frequency counter D(1) for each grade is
By outputting only the data stored in D(n), it is possible to easily know the frequency distribution by grade of a group of products manufactured by one manufacturing unit.

The present invention is configured as described above, and includes a storage means for storing the upper and lower performance limits of the product in advance for each grade, and an AD converter that converts the measured performance values of the product into digital signals. The corresponding grade of the measured product is determined by comparing the output of the AD converter and the AD converter in descending order of the performance upper limit and lower performance limit for each grade. It is equipped with a comparative judgment means for making a judgment and a frequency counter which is provided individually for each grade and counts up the frequency of the corresponding grade based on the output of the comparison judgment means, so that the performance measurement values of each product can be classified. There is no need to carry out such complicated work, and at the end of all measurement work, the frequency distribution situation by performance grade of a product group manufactured by one production lot can be immediately known from the output of the frequency calashita. It has advantages.

[Brief explanation of the drawing]

FIG. 1 is a circuit diagram of one embodiment of the present invention, and FIG. 2 (1 to (c)
) is an operation waveform diagram of the same as above, and FIGS. 3 and 4 are flowcharts showing the processing procedure of the above. +! il is an AD converter, (7) is a CPU, (gj company RA
It is M. Agent Patent Attorney Ishi 1) Chief Figure 7 2

Claims (1)

[Claims] (1) A storage means for pre-memorizing the product's performance upper limit and performance lower limit for each grade, and the product's performance measurement values are stored in IIT! : Compare the output of the AD converter that converts to the I-tal signal and the AD converter in order from the highest grade to see whether it exists between the performance upper limit value and the performance lower limit value for each grade. , a comparative judgment means for judging the applicable grade of the measured product, and a frequency calculator provided individually for each grade and counting up the frequency of the corresponding grade based on the output of the comparative judgment means. A data processing device characterized by: