JPS5827941A - Manufacture of amorphous thin film - Google Patents
Manufacture of amorphous thin filmInfo
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- JPS5827941A JPS5827941A JP56125800A JP12580081A JPS5827941A JP S5827941 A JPS5827941 A JP S5827941A JP 56125800 A JP56125800 A JP 56125800A JP 12580081 A JP12580081 A JP 12580081A JP S5827941 A JPS5827941 A JP S5827941A
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- Prior art keywords
- thin film
- amorphous
- group
- amorphous thin
- magnetic
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Abstract
Description
【発明の詳細な説明】
本発明はスパッタ蒸着法により作製した高い熱゛安定性
を示すZr、Ti、T−1f等の金属元素を基と。DETAILED DESCRIPTION OF THE INVENTION The present invention is based on metal elements such as Zr, Ti, and T-1f that exhibit high thermal stability and are produced by sputter deposition.
した本質的に遷移金属と非金属元素からなる合金組成で
磁歪が小さい非晶質薄膜に関するものであ・る。さらに
詳しくは回転磁場中でスパッタ蒸着す10ろことやスパ
ッタ蒸着膜を該薄膜のキーリ一温度。This invention relates to an amorphous thin film with an alloy composition consisting essentially of transition metals and non-metallic elements and with low magnetostriction. More specifically, the thin film is sputter-deposited in a rotating magnetic field, and the sputter-deposited film is deposited at the temperature of the thin film.
以」二結晶化温度以下で熱処理、あるいは回転磁場。Heat treatment below the crystallization temperature or rotating magnetic field.
中で熱処理することにより低保磁力・高初期透磁。Low coercive force and high initial permeability due to heat treatment inside.
率非晶薄膜を提供するものである。The present invention provides a highly amorphous thin film.
ある種の金属あるいは合金をスパッタ蒸着する11こと
により、原子構造で長範囲規則度のない非晶質構造を得
ることができる。この方法により得られた従来の非晶質
薄膜は、主に13、C,Si等の非金属元素を基とする
金属−非金属系合金が、バブル磁性材料や光磁気磁性材
料に有用な希土類元素を基とする合金系よりなっている
。しかし、これ。By sputter depositing 11 certain metals or alloys, it is possible to obtain an amorphous structure with no long-range order in the atomic structure. Conventional amorphous thin films obtained by this method are mainly metal-nonmetal alloys based on nonmetallic elements such as 13, C, and Si, and rare earth alloys useful for bubble magnetic materials and magneto-optical magnetic materials. It consists of an alloy system based on elements. But this.
らの非晶質合金系は機械的、磁気的、電気的特性。Their amorphous alloy system has excellent mechanical, magnetic, and electrical properties.
の劣化をもたらす熱安定性で未だ実用上十分とは。Thermal stability, which causes deterioration, is still insufficient for practical use.
いえない。さらに13. C,Si等の非金属元素を基
。I can't say that. Further 13. Based on nonmetallic elements such as C and Si.
とする金属−非金属系合金はスパッタ蒸着特に導5人さ
れろ磁気異方性のため高い保磁力と低い透磁。Metal-nonmetallic alloys are sputter-deposited, especially in conductors, and have high coercivity and low permeability due to their magnetic anisotropy.
率を示し実用上問題がある。This is a practical problem.
本発明は、上述の問題点を解消するだめ、ガラス化元素
とl〜て従来の非晶質合金系の構成元素で・ある非金属
元素および希土類元素の少なくとも−11)部をTi
、Zr、 Hf、 Y、 Ge、 sb、 B15Te
等。In order to solve the above-mentioned problems, the present invention replaces at least -11) parts of the non-metallic elements and rare earth elements that are constituent elements of conventional amorphous alloy systems with Ti.
, Zr, Hf, Y, Ge, sb, B15Te
etc.
の金属元素に置き換え、他は主として遷移金属元。Replaced with metal elements, others are mainly transition metal elements.
素を主成分とし、必要に応じてP、13、C,Si、。The main component is P, 13, C, Si, as necessary.
N等の元素を少量添加することによって、スパン。By adding small amounts of elements such as N, span.
夕蒸着法による非晶質合金薄膜の作製を容易にす1゜ろ
と共に熱安定性の改善をはかったものである。The aim is to improve thermal stability as well as to facilitate the production of amorphous alloy thin films by evening evaporation.
さらに金属−非金属系合金では強磁性元素Fe、Ni、
Coで磁歪、飽和磁化の値を調整し、V、Cr、Mn、
Nb、Mo、W、希土類を少量添加して結晶化温度、硬
度を向上させることにより磁歪が小さくて、しかも熱安
定性、耐摩耗性の改善をはかっ゛たものである。さらに
、強磁性を示す非晶質薄膜。Furthermore, in metal-nonmetal alloys, ferromagnetic elements Fe, Ni,
Adjust the values of magnetostriction and saturation magnetization with Co, and adjust the values of V, Cr, Mn,
By adding small amounts of Nb, Mo, W, and rare earth elements to improve the crystallization temperature and hardness, the magnetostriction is small and the thermal stability and wear resistance are improved. Additionally, amorphous thin films exhibit ferromagnetism.
においては、回転磁場中でスパッタ蒸着するか、。In the case of sputter deposition in a rotating magnetic field, or
スパッタ蒸着によって非晶質磁性薄膜を得た後、。After obtaining the amorphous magnetic thin film by sputter deposition.
該膜をそのギーリ一温度以上、結晶化温度以下の5温度
で熱処理することにより、磁気異方性の小さ゛い、低保
磁力、高透磁率の磁性薄膜を得られるよ。By heat-treating the film at temperatures above its Giel temperature and below its crystallization temperature, a magnetic thin film with small magnetic anisotropy, low coercive force, and high magnetic permeability can be obtained.
うにしたものである。It was made by sea urchin.
以下、本発明を実施例により詳細に説明する。・実施例
1. 用合金組成が
C0TIZrCoZr1Co8o。Hereinafter, the present invention will be explained in detail with reference to Examples.・Example 1. The alloy composition is C0TIZrCoZr1Co8o.
79 13 8箋 8416
T113FeZr1Co81Mo78m2Zr1o(C
oo、3゜18 2 % 90 10
F e o、7 )90 T I 2 Z r a、P
e so N I i o Z r 1oの母合金を
ア。79 13 8 paper 8416 T113FeZr1Co81Mo78m2Zr1o (C
oo, 3゜18 2 % 90 10 Fe o, 7) 90 T I 2 Z r a, P
The mother alloy of e so N I i o Z r 1o is a.
−り溶解により作製し、直径5Qmm、厚さ約1゜mm
のターゲットを作製した。薄膜作製は二極高1゜周波ス
パッタ装置を用い、約1〜5 m Torr のアル
ゴン圧力下で、ターゲットと基板の間隔を5〜10cm
として、厚さ数μm以下の薄膜を作製した。得られた薄
膜のX線ディフラクトメーターによる回折曲線はすべて
、なだらがなメインピークと二三のザブピークからなる
非晶質構造特有の回゛折曲線を示し、非晶質薄膜が得ら
れていることが。- Produced by melting, diameter 5Qmm, thickness approximately 1mm
A target was created. Thin film production was performed using a two-pole height 1° frequency sputtering device under an argon pressure of approximately 1 to 5 m Torr, with a distance between the target and the substrate of 5 to 10 cm.
A thin film with a thickness of several μm or less was prepared as follows. All the diffraction curves of the obtained thin films measured with an X-ray diffractometer showed diffraction curves characteristic of an amorphous structure consisting of a gentle main peak and a few sub-peaks, indicating that an amorphous thin film was obtained. To be there.
確認された。confirmed.
実施例 2゜
組成がCOas 、 s MOs Z r 9 、 s
、 CO82MQ a、 s Z r 9. s 、
’C075,5Mo2S Zr9.5になるように、
直径5Qmmのコバルト円板上にl’vfo 、 Zr
の小塊を均一に配置した複合ターゲットを用い、実施例
1の条件で同時・スパッタ蒸着ずろことにより非晶質薄
膜を作製し・た。得られた非晶質薄膜の結晶化温度(西
端1法10電気抵抗測定により決定)は約500℃と高
く、。Example 2゜Composition is COas, s MOs Z r 9 , s
, CO82MQ a, s Z r 9. s,
'C075,5Mo2S Zr9.5,
l'vfo, Zr on a cobalt disk with a diameter of 5Qmm
An amorphous thin film was fabricated by simultaneous sputter deposition and sequential deposition under the conditions of Example 1 using a composite target in which small lumps were uniformly arranged. The crystallization temperature of the obtained amorphous thin film (determined by electrical resistance measurement using Nishiendi method 10) was as high as approximately 500°C.
100℃、100時間の熱処理後でも電気抵抗値。Electrical resistance value even after heat treatment at 100℃ for 100 hours.
はほとんど変らず、高い熱安定性を示しだ。壕だ。remains almost unchanged, indicating high thermal stability. It's a trench.
飽和磁化はMO量が減少するとともに約6Qemu。The saturation magnetization decreases to about 6 Qemu as the amount of MO decreases.
7gから100 emu 7gと変化し、高い値が得ら
れ、。It varied from 7g to 100 emu 7g, and a high value was obtained.
ろことかわかった。これらの膜の保磁力は約1〜50e
であった。磁歪が一8X10 (半導体歪ケージを用
いて測定)と低い値を示すCOs2 MOa、 s
。I found out that it was Rokoto. The coercivity of these films is approximately 1-50e
Met. COs2 MOa, s exhibiting a low magnetostriction of 18X10 (measured using a semiconductor strain cage)
.
Z r q、 5非晶質薄膜を膜面内方向に2kGの外
部磁。Z r q, 5 An external magnet of 2 kG is applied to the amorphous thin film in the in-plane direction.
場を印加し、1200 r、 I)、 m、の回転数で
回転させ0
ながら、400℃で20分間熱処理すると、保磁力83
m0e、初透磁率(20kllZ )約6000の 。Applying a field and rotating at a rotation speed of 1200 r, I), m, and heat treatment at 400 °C for 20 minutes, the coercive force was 83
m0e, initial permeability (20kllZ) of approximately 6000.
軟磁特性が得られた。Soft magnetic properties were obtained.
実施例 6゜
合金組成が(COO,3Fe o、 7)91 ZI”
9 、 (Re 0.7 ’Ni ) Z
r Co Ni Fe Zr (Coo
、72 。Example 6゜Alloy composition is (COO, 3Fe o, 7)91 ZI''
9, (Re 0.7'Ni)Z
r Co Ni Fe Zr (Coo
, 72.
0、ろ 90 10’ 72 16
2 10+N I o、 1b Peo、
02 Zr o、 1) 98 B2 、 C085
Cr4RL12 Zrq ’CoWZr (Co
Mo Zr8659・ 0.82 0.08
5 0.095 )98132の直径53mmの焼結体
をターゲットとして用い、゛実施例1と同様々製造条件
でスパッタ蒸着して非10品質薄膜を作製した。(CO
O,3Fe0.7 )91 Z’9 ’ −(Fe0
.7”0.3 )90Zr10 の非晶質薄膜の飽和磁
化。0, ro 90 10' 72 16
2 10+N Io, 1b Peo,
02 Zro, 1) 98 B2, C085
Cr4RL12 Zrq 'CoWZr (Co
Mo Zr8659・0.82 0.08
A non-10 quality thin film was produced by sputter deposition using a sintered body of 53 mm in diameter of 5 0.095 ) 98132 as a target under the same manufacturing conditions as in Example 1. (C.O.
O,3Fe0.7 )91 Z'9' -(Fe0
.. 7”0.3) Saturation magnetization of an amorphous thin film of 90Zr10.
はそれぞれ160emu/g、120 emu/g
と高い。are 160 emu/g and 120 emu/g, respectively.
That's high.
値を示17た。一方、CO72N I 1 b P e
2 Z r i o非晶質薄。The value was 17. On the other hand, CO72N I 1 b P e
2 Zr io amorphous thin.
膜では磁歪λ8はぼ0、飽和磁化σ5110emu/1
゜” (COO,72”0.16FeO,02Z’0
.1 )98B2 非晶質薄膜ではλ はぼO+ ’
105 e””/ g + Co65 Cr45
Ru2Zr、非晶質薄膜ではλ8はぼQ 、 σ、9
6 emu。In the film, the magnetostriction λ8 is almost 0, and the saturation magnetization σ5110emu/1
゜"(COO,72"0.16FeO,02Z'0
.. 1) 98B2 In an amorphous thin film, λ is approximately O+'
105 e””/ g + Co65 Cr45 Ru2Zr, in an amorphous thin film, λ8 is approximately Q, σ, 9
6 emu.
7gといずれも高い飽和磁化をもつ磁歪零材が得られた
。Zero magnetostrictive materials with a high saturation magnetization of 7g were obtained in each case.
0
・ 7 ・
実施例 4゜
実施例1の条件により作製された”75.5 Mo2S
Z r cp 、 s非晶質薄膜をそのキ・−り一
温度(約400゛℃)以上、結晶化温度(505℃)以
下の温度で゛熱処理後、水冷しだところ、保磁力53m
0e、初5透磁率(5kHz ) 10000の磁気異
方性の小さい。0 ・ 7 ・ Example 4゜"75.5 Mo2S produced under the conditions of Example 1
Z r cp , s When the amorphous thin film was heat-treated at a temperature above its key temperature (approximately 400°C) and below its crystallization temperature (505°C), it was water-cooled and had a coercive force of 53 m.
0e, initial 5 magnetic permeability (5kHz) 10000, small magnetic anisotropy.
すぐれた軟磁特性が得られた。Excellent soft magnetic properties were obtained.
実施例 5゜
組成がCOao MO9Z r 11の刊合金をアーク
溶解によ。Example 5 An alloy having the composition COao MO9Z r 11 was melted by arc melting.
り作製し、直径5Qmm、厚さ約1mmのターゲノ10
1・を作製した。このターゲットを用い、約3m。Targeno 10 with a diameter of 5Qmm and a thickness of about 1mm
1. was produced. Approximately 3m using this target.
TorrのA、r圧力下で、基板面に平行に5QOe以
上。5QOe or more parallel to the substrate surface under A, r pressure of Torr.
の磁場を印加し、基板を回転しながら、スパッタ族。While applying a magnetic field and rotating the substrate, sputter the group.
着することにより非晶質薄膜を作製した。得られ。An amorphous thin film was prepared by depositing the same. Obtained.
た非晶質薄膜の磁気特性は膜によってバラツキは1゜あ
るが、その保磁力は0.10e 以下、初透磁率(。The magnetic properties of the amorphous thin film vary by 1 degree depending on the film, but the coercive force is less than 0.10e, and the initial permeability (.
20 kHz )は6100以」二の実用に適した磁気
特性が得られた。このことは、この作製法により誘導磁
気異方性が小さくなったことを示すものと思われろ。At 20 kHz), magnetic properties suitable for practical use of 6100 or higher were obtained. This seems to indicate that the induced magnetic anisotropy was reduced by this manufacturing method.
・ 8 ・
実施例 6゜
合金組成が(COO,96FeO,04)73Cr2
””10 B15 ’ 。・ 8 ・ Example 6゜Alloy composition is (COO,96FeO,04)73Cr2
""10B15'.
(Co Pe ) Mn Si B 、
(Coo、、6Feo、。QO,960,047321
015
)73 N1〕2 S’10 B15 ’ C045
,9Fe10.1 ”24 ””2 B18の母。(Co Pe ) Mn Si B ,
(Coo,,6Feo,.QO,960,047321
015 )73 N1]2 S'10 B15' C045
,9Fe10.1 ``24 ''''2 Mother of B18.
合金をアーク溶解により作製し、直径5Qmm、”厚さ
約1mmのターゲットを作製した。薄膜作製。The alloy was produced by arc melting, and a target with a diameter of 5Qmm and a thickness of about 1mm was produced.Thin film production.
は二極高周波スパッタ装置を用い、約1〜5m ’T
orr のアルゴン圧力下で、ターゲットと基板と。using a two-pole high-frequency sputtering device, approximately 1 to 5 m'T
target and substrate under argon pressure of orr.
の間隔を5〜13cmとして厚さ数μmη以下の非。A non-woven fabric with a thickness of several μmη or less with an interval of 5 to 13 cm.
晶質薄膜を作製した。得られた薄膜の膜面上に半10導
体歪ゲージをはりつけ、4kGの外部磁場で磁。A crystalline thin film was prepared. A semi-conductor strain gauge was attached to the surface of the obtained thin film and magnetized with an external magnetic field of 4 kG.
歪を測定したところ、C045,9Fe10.1 ”
24 S’ 21318 ’は+lX10 、他の合
金組成のものは10−7オ、−ダーの低い磁歪値を示し
た。作製されたままの。When I measured the strain, it was C045,9Fe10.1”
24S'21318' exhibited a low magnetostriction value of +1X10, and those of other alloy compositions exhibited a low magnetostriction value of 10-7 degrees. As made.
薄膜の保磁力は0.5〜10eであった。 1
゜実施例 7゜
実施例6で得た(COo、、6Feo、。4)73Cr
2S11oB15゜非晶質磁性薄膜の結晶化温度(四端
子性電気抵抗。The coercive force of the thin film was 0.5-10e. 1
゜Example 7゜(COo,,6Feo,.4)73Cr obtained in Example 6
2S11oB15° Crystallization temperature of amorphous magnetic thin film (four-terminal electrical resistance).
測定により決定)は約510℃、キー−り一温度(。The temperature (determined by measurement) is approximately 510°C, the key temperature (.
磁気天秤により測定)は約440℃、飽和磁化は。。(measured using a magnetic balance) is approximately 440°C, and the saturation magnetization is approximately 440°C. .
3Qemu/g であった。この非晶質薄膜を真空中
、470℃、10分間熱処理後、水冷すると、保磁力ば
Q、 50eから7QmOeに減少し、スムースな13
− H曲線が得られた。その時の初透磁率け20゜kH
zで9000という高い値を示した。It was 3Qemu/g. When this amorphous thin film is heat treated in vacuum at 470°C for 10 minutes and then cooled with water, the coercive force Q decreases from 50e to 7QmOe, resulting in a smooth 13
-H curve was obtained. The initial permeability at that time was 20゜kHz
It showed a high value of 9000 in z.
実施例 8゜
合金組成力” C00,96FeO,04)77”2
””10 B11 ”非゛晶質薄膜を実施例6と同様な
条件で作製した。こ。Example 8゜Alloy composition strength "C00,96FeO,04)77"2
A "10 B11" amorphous thin film was produced under the same conditions as in Example 6.
の非晶質薄膜の結晶化温度は450℃、飽和磁化“は1
00 emu / g、保磁力・は約B)Oe であ
った。lO得られだ円板状(直径10mm)非晶質薄膜
を4゜kGの静磁場中で膜面が磁場の方向と平行になる
。The crystallization temperature of the amorphous thin film is 450℃, and the saturation magnetization is 1.
00 emu/g, the coercive force was approximately B) Oe. The amorphous thin film obtained in the form of a disk (10 mm in diameter) was placed in a static magnetic field of 4° kG so that the film surface became parallel to the direction of the magnetic field.
ようにして720 r、 p、 m、 の回転数で回
転させな。Rotate it at a speed of 720 r, p, m.
がら、昇温、急冷速度が20℃/minになるように。while keeping the temperature increase and quenching rate at 20°C/min.
して400℃で20分間の熱処理を行なった。熱、。Then, heat treatment was performed at 400° C. for 20 minutes. heat,.
処理後のこの非晶質薄膜の保磁力は63m0eと低。The coercive force of this amorphous thin film after treatment is as low as 63m0e.
下し、2[]kHzで約8000という高い透磁率を得
た。これらの軟磁気特性の改善は磁気異方性の。A high magnetic permeability of approximately 8000 was obtained at 2[]kHz. These improvements in soft magnetic properties are due to magnetic anisotropy.
減少、内部応力の除去によるものと思われる。This is thought to be due to the removal of internal stress.
実施例 9.2゜
合金組成が(C00,96FeO,04)77 Mn2
S’40 B11 の゛直径5Qn1m、厚さ約i
mm のターゲットを用い:約3 mTorrのアルゴ
ン圧力下で基板面に平行に約。Example 9.2゜Alloy composition is (C00,96FeO,04)77 Mn2
S'40 B11 ゛diameter 5Qn1m, thickness about i
Using a target of mm: approximately parallel to the substrate plane under an argon pressure of approximately 3 mTorr.
1000eの磁場を印加し、基板を回転しなからス゛バ
ッタ蒸着することにより上記組成の非晶質薄膜5を作製
した。得られた非晶質磁性薄膜の保磁力は9QmOeと
低く、透磁率も1kHzで7000とい。An amorphous thin film 5 having the above composition was fabricated by applying a magnetic field of 1000 e and performing sweeper deposition without rotating the substrate. The obtained amorphous magnetic thin film had a low coercive force of 9 QmOe and a magnetic permeability of 7000 at 1 kHz.
う高い値が得られ、通常の作製法と比べて顕著な差が認
められた。A significantly higher value was obtained, and a remarkable difference was observed compared to the conventional production method.
以上の説明から明らかなように、本発明の非晶10質薄
膜は、従来の非晶質合金薄膜の合金組成とは。As is clear from the above description, the alloy composition of the amorphous 10-based thin film of the present invention is different from that of conventional amorphous alloy thin films.
異なった新規な合金組成よりなり、高い熱安定性。High thermal stability due to different new alloy composition.
をもつとともに磁性薄膜においてはすぐれた磁気。It has excellent magnetism among magnetic thin films.
特性、すなわち、低い保磁力と高い透磁率を示し、磁気
コア材等の電気音響変換素子材料、磁歪素子、。Electroacoustic transducer materials, magnetostrictive elements, such as magnetic core materials, exhibiting characteristics, namely low coercive force and high magnetic permeability.
材料、インバー、エリンバ−材料等に有効に用い。Effectively used for materials such as Invar and Elinvar.
ることかできる。I can do that.
代理人弁理士 中村純之助Representative Patent Attorney Junnosuke Nakamura
Claims (1)
Fe、”Ni、COの群の中から選ばれた少なくとも1
種の元素、TがMOlCr、W、V、Nl)、Ta、M
n、’A−1、Cu 、 Zn、■)1]、8n、 P
d、 Pt、Au、Ag・、Ru 、 Os 、 R,
h、Ir 、 Be 、 Mg 、 La 1Nd 、
5ITI−1Eu、 Gd、 ’rb、 Dy、 E
r5yb、 Lu O群の中が11)ら選ばれた少な
くとも1種の元素、XがZr、Ti、Y、 Hf 、
Ge 、 Sb、13i 、Te (7)群の中から
選は。 れた少なくとも1種の元素、ZがP、B、C1。 Si、N の群の中から選ばれた少なくとも1種の。 元素であり、かつ、a+b+c+d=100なる1゜条
件下で0≦b≦95.60≦a+1)≦95.0゜≦C
≦70.0≦d≦60を満足する優位的に非晶質である
非晶質薄膜をスパッタ蒸着法によって。 遣方法において、前記Cおよびdがそれぞれ5≦゛C≦
50.0≦d≦10であることを特徴とする。 非晶質薄膜の製造方法。 (ろ)組成式がMaTl)XcZdで示され、MがFe
、。 N1、COの群の中から選ばれた少なくとも1種の5元
素、T、 カMo 、 Cr 、 Mn 、 W、 V
、Nb 、 La 、。 Nd、 Sm、 Bu、 Gd1’rb、 Dy、
Er、 Yl)、Lu’の群の中から選ばれた少なくと
も1種の元素、X・がZr 、 TI 、 Hf 、
Y 、 Ge0群の中から選ばれた・少なくとも1種の
元素、ZがP%13、C,Si、1゜S、N、kl
の群の中から選ばれた少なくとも1゜種の元素であり、
かつ、a+b+c=100なる。 条件下で1≦1]≦20.5≦C≦20.0≦d≦。 10である優位的に非晶質である非晶質磁性薄膜。 をスパッタ蒸着法によって作製することを特徴と1゜す
る非晶質薄膜の製造方法。 (4)組成式がCOeFefNigTbZd で示され
、TがMo、Cr、W、V%Mn、klSLa、Nd、
sm。 IE:u 、 Gd 、 TI)、DY 、 Er 、
yb 、 Lu O群の中から選ばれた少なくとも1
種の元素、Zが13、C1Sl の群の中から選ばわ
た少なくども1種の元素であり、かつ、e 十f +
g 十b −)−d = i Q Qなろ。 条件下で、25≦e≦9012≦f≦20.0≦。 g≦50.0≦1)≦10.5≦d≦60を満足し:飽
和磁束密度が71(6以上、磁歪が一6×10−65か
ら+6×10 である優位的に非晶質である非。 晶質磁性薄膜をスパッタ蒸着法によって作製ずろ。 ことを特徴とする非晶質薄膜の製造方法。 (5)特許請求の範囲第6項捷たけ第4項記載の・非晶
質薄膜の製造方法において、前記非晶質薄膜1゜に該薄
膜面に平行で回転する1000以上の磁場を印加しなが
ら前記スパッタ蒸着することを特徴。 とする非晶質薄膜の製造方法。 (6)特許請求の範囲第6項せたは第4項記載の。 非晶質薄膜の製造方法において、前記方法によっ1゜て
得られた非晶質磁性薄膜を該薄膜のキーーリ一温度以上
、結晶化温度以下の温度で熱処理することを特徴とする
非晶質薄膜の製造方法。 (7)特許請求の範囲第6項または第4項記載の非晶質
薄膜の製造方法において、前記方法によって州られた非
晶質磁(9−薄膜に該薄膜面に平行で回。 転する11(6以上の磁場を印加しながら200℃”以
上、該薄膜の結晶化温度以下の温度で熱処理ず。 ろことを特徴とずろ非晶質薄膜の製造方法。 ゛[Claims] (1) The compositional formula is Ma Tl)XCZd, and M is at least one selected from the group of Fe, Ni, and CO.
Seed element, T is MOlCr, W, V, Nl), Ta, M
n, 'A-1, Cu, Zn, ■)1], 8n, P
d, Pt, Au, Ag・, Ru, Os, R,
h, Ir, Be, Mg, La 1Nd,
5ITI-1Eu, Gd, 'rb, Dy, E
r5yb, Lu At least one element selected from the O group 11), X is Zr, Ti, Y, Hf,
Select from the group Ge, Sb, 13i, Te (7). Z is P, B, C1. At least one species selected from the group of Si and N. element, and under the 1° condition where a+b+c+d=100, 0≦b≦95.60≦a+1)≦95.0°≦C
A predominantly amorphous amorphous thin film satisfying ≦70.0≦d≦60 is formed by sputter deposition. In the transfer method, the above C and d are each 5≦゛C≦
It is characterized in that 50.0≦d≦10. A method for producing an amorphous thin film. (b) The compositional formula is MaTl)XcZd, and M is Fe.
,. N1, at least one five elements selected from the group of CO, T, Mo, Cr, Mn, W, V
, Nb, La,. Nd, Sm, Bu, Gd1'rb, Dy,
At least one element selected from the group of Er, Yl), Lu', and X is Zr, TI, Hf,
Y, at least one element selected from the Ge0 group, Z is P%13, C, Si, 1°S, N, kl
At least 1° element selected from the group of
And a+b+c=100. 1≦1]≦20.5≦C≦20.0≦d≦. Amorphous magnetic thin film that is predominantly amorphous. 1. A method for producing an amorphous thin film with a temperature of 1° by sputter deposition. (4) The compositional formula is shown as COeFefNigTbZd, where T is Mo, Cr, W, V%Mn, klSLa, Nd,
sm. IE: u, Gd, TI), DY, Er,
At least one selected from the yb, Lu O group
The seed element, Z, is at least one element selected from the group of 13, C1Sl, and e 10f +
g ten b -) - d = i Q Q Naro. Under the conditions, 25≦e≦9012≦f≦20.0≦. satisfies g≦50.0≦1)≦10.5≦d≦60: predominantly amorphous with saturation magnetic flux density of 71 (6 or more, magnetostriction of 16×10−65 to +6×10); A method for producing an amorphous thin film, characterized in that a crystalline magnetic thin film is produced by a sputter deposition method. (5) The amorphous thin film according to claim 6. A method for producing an amorphous thin film, characterized in that the sputter deposition is performed while applying a magnetic field of 1000 degrees or more that rotates parallel to the thin film surface to the amorphous thin film at 1°. (6) Claim 6 or 4 provides a method for producing an amorphous thin film, wherein the amorphous magnetic thin film obtained by the above method is heated to a temperature higher than the Keeling temperature of the thin film to crystallize the thin film. (7) In the method for producing an amorphous thin film according to claim 6 or 4, the method The amorphous magnetic (9-thin film) rotated parallel to the plane of the thin film (11) while applying a magnetic field of 6 or more and heat-treated at a temperature of 200° C. or higher and below the crystallization temperature of the thin film. A method for producing an amorphous thin film.゛
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56125800A JPH06104870B2 (en) | 1981-08-11 | 1981-08-11 | Method for producing amorphous thin film |
JP19805788A JPH0192358A (en) | 1981-08-11 | 1988-08-10 | Manufacture of thin amorphous film |
JP19805888A JPH0192359A (en) | 1981-08-11 | 1988-08-10 | Manufacture of thin amorphous film |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56125800A JPH06104870B2 (en) | 1981-08-11 | 1981-08-11 | Method for producing amorphous thin film |
Related Child Applications (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP19805888A Division JPH0192359A (en) | 1981-08-11 | 1988-08-10 | Manufacture of thin amorphous film |
JP19805788A Division JPH0192358A (en) | 1981-08-11 | 1988-08-10 | Manufacture of thin amorphous film |
JP3136315A Division JPH072990B2 (en) | 1991-06-07 | 1991-06-07 | Method for producing amorphous thin film |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5827941A true JPS5827941A (en) | 1983-02-18 |
JPH06104870B2 JPH06104870B2 (en) | 1994-12-21 |
Family
ID=14919204
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56125800A Expired - Lifetime JPH06104870B2 (en) | 1981-08-11 | 1981-08-11 | Method for producing amorphous thin film |
Country Status (1)
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JP (1) | JPH06104870B2 (en) |
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JPS58123850A (en) * | 1982-01-19 | 1983-07-23 | Olympus Optical Co Ltd | Amorphous magnetic alloy |
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JPS58123850A (en) * | 1982-01-19 | 1983-07-23 | Olympus Optical Co Ltd | Amorphous magnetic alloy |
JPS58157940A (en) * | 1982-03-12 | 1983-09-20 | Olympus Optical Co Ltd | Amorphous magnetic alloy |
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CN110079750A (en) * | 2019-04-26 | 2019-08-02 | 北京科技大学 | A kind of Ni-based amorphous nano peritectic alloy of low melting point and preparation method |
CN110079750B (en) * | 2019-04-26 | 2020-10-02 | 北京科技大学 | Low-melting-point nickel-based amorphous nanocrystalline alloy and preparation method thereof |
CN114134473A (en) * | 2020-12-24 | 2022-03-04 | 佛山市中研非晶科技股份有限公司 | Nickel-iron-based amorphous alloy film, preparation method thereof, electromagnetic shielding film and equipment applying nickel-iron-based amorphous alloy film |
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