JPS58218132A - 半導体ウエ−ハ特性検査処理方法 - Google Patents
半導体ウエ−ハ特性検査処理方法Info
- Publication number
- JPS58218132A JPS58218132A JP8695682A JP8695682A JPS58218132A JP S58218132 A JPS58218132 A JP S58218132A JP 8695682 A JP8695682 A JP 8695682A JP 8695682 A JP8695682 A JP 8695682A JP S58218132 A JPS58218132 A JP S58218132A
- Authority
- JP
- Japan
- Prior art keywords
- memory
- inspection
- semiconductor
- marking
- recording medium
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 40
- 238000000034 method Methods 0.000 title claims abstract description 15
- 230000002950 deficient Effects 0.000 claims abstract description 16
- 230000006870 function Effects 0.000 claims abstract description 8
- 230000006386 memory function Effects 0.000 claims abstract description 6
- 238000012360 testing method Methods 0.000 claims description 11
- 230000007547 defect Effects 0.000 claims description 2
- 235000012431 wafers Nutrition 0.000 abstract description 28
- 238000007689 inspection Methods 0.000 abstract description 27
- 238000013507 mapping Methods 0.000 abstract description 3
- 238000005070 sampling Methods 0.000 abstract 1
- 238000012805 post-processing Methods 0.000 description 3
- 241000219793 Trifolium Species 0.000 description 2
- 239000003550 marker Substances 0.000 description 2
- 239000011295 pitch Substances 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 235000017788 Cydonia oblonga Nutrition 0.000 description 1
- 238000004501 airglow Methods 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 235000009508 confectionery Nutrition 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000004242 micellar liquid chromatography Methods 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8695682A JPS58218132A (ja) | 1982-05-21 | 1982-05-21 | 半導体ウエ−ハ特性検査処理方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8695682A JPS58218132A (ja) | 1982-05-21 | 1982-05-21 | 半導体ウエ−ハ特性検査処理方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58218132A true JPS58218132A (ja) | 1983-12-19 |
| JPH0312463B2 JPH0312463B2 (cg-RX-API-DMAC7.html) | 1991-02-20 |
Family
ID=13901319
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8695682A Granted JPS58218132A (ja) | 1982-05-21 | 1982-05-21 | 半導体ウエ−ハ特性検査処理方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58218132A (cg-RX-API-DMAC7.html) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60211956A (ja) * | 1984-04-06 | 1985-10-24 | Tokyo Seimitsu Co Ltd | プロ−ビングマシン |
| JPS62293124A (ja) * | 1986-06-12 | 1987-12-19 | Matsushita Electric Ind Co Ltd | プリント基板の検査装置 |
-
1982
- 1982-05-21 JP JP8695682A patent/JPS58218132A/ja active Granted
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60211956A (ja) * | 1984-04-06 | 1985-10-24 | Tokyo Seimitsu Co Ltd | プロ−ビングマシン |
| JPS62293124A (ja) * | 1986-06-12 | 1987-12-19 | Matsushita Electric Ind Co Ltd | プリント基板の検査装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0312463B2 (cg-RX-API-DMAC7.html) | 1991-02-20 |
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