JPS58209138A - 電子ビ−ムを用いたｉｃテスタ - Google Patents

電子ビ−ムを用いたｉｃテスタ

Info

Publication number
JPS58209138A
JPS58209138A JP57092885A JP9288582A JPS58209138A JP S58209138 A JPS58209138 A JP S58209138A JP 57092885 A JP57092885 A JP 57092885A JP 9288582 A JP9288582 A JP 9288582A JP S58209138 A JPS58209138 A JP S58209138A
Authority
JP
Japan
Prior art keywords
sample chamber
sample
electron beam
tester
card
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57092885A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6226179B2 (enExample
Inventor
Kazuyoshi Sugihara
和佳 杉原
Toru Tojo
東条　徹
Mitsuo Tabata
光雄 田畑
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP57092885A priority Critical patent/JPS58209138A/ja
Publication of JPS58209138A publication Critical patent/JPS58209138A/ja
Publication of JPS6226179B2 publication Critical patent/JPS6226179B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP57092885A 1982-05-31 1982-05-31 電子ビ−ムを用いたｉｃテスタ Granted JPS58209138A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57092885A JPS58209138A (ja) 1982-05-31 1982-05-31 電子ビ−ムを用いたｉｃテスタ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57092885A JPS58209138A (ja) 1982-05-31 1982-05-31 電子ビ−ムを用いたｉｃテスタ

Publications (2)

Publication Number Publication Date
JPS58209138A true JPS58209138A (ja) 1983-12-06
JPS6226179B2 JPS6226179B2 (enExample) 1987-06-08

Family

ID=14066905

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57092885A Granted JPS58209138A (ja) 1982-05-31 1982-05-31 電子ビ−ムを用いたｉｃテスタ

Country Status (1)

Country Link
JP (1) JPS58209138A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62276848A (ja) * 1985-11-15 1987-12-01 フエアチヤイルド　セミコンダクタコ−ポレ−シヨン 電子ビームテストプローブ方法及び装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62276848A (ja) * 1985-11-15 1987-12-01 フエアチヤイルド　セミコンダクタコ−ポレ−シヨン 電子ビームテストプローブ方法及び装置

Also Published As

Publication number Publication date
JPS6226179B2 (enExample) 1987-06-08

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