JPS5819487Y2 - プロ−ブ接触機構 - Google Patents
プロ−ブ接触機構Info
- Publication number
- JPS5819487Y2 JPS5819487Y2 JP11789278U JP11789278U JPS5819487Y2 JP S5819487 Y2 JPS5819487 Y2 JP S5819487Y2 JP 11789278 U JP11789278 U JP 11789278U JP 11789278 U JP11789278 U JP 11789278U JP S5819487 Y2 JPS5819487 Y2 JP S5819487Y2
- Authority
- JP
- Japan
- Prior art keywords
- holes
- group
- adapter
- pins
- probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11789278U JPS5819487Y2 (ja) | 1978-08-28 | 1978-08-28 | プロ−ブ接触機構 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11789278U JPS5819487Y2 (ja) | 1978-08-28 | 1978-08-28 | プロ−ブ接触機構 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5534272U JPS5534272U (cg-RX-API-DMAC7.html) | 1980-03-05 |
| JPS5819487Y2 true JPS5819487Y2 (ja) | 1983-04-21 |
Family
ID=29071742
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11789278U Expired JPS5819487Y2 (ja) | 1978-08-28 | 1978-08-28 | プロ−ブ接触機構 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5819487Y2 (cg-RX-API-DMAC7.html) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6146463Y2 (cg-RX-API-DMAC7.html) * | 1980-04-23 | 1986-12-27 | ||
| JPS59122554U (ja) * | 1983-02-08 | 1984-08-17 | 株式会社フジクラ | プリント回路板検査装置 |
-
1978
- 1978-08-28 JP JP11789278U patent/JPS5819487Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5534272U (cg-RX-API-DMAC7.html) | 1980-03-05 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US6794889B2 (en) | Unified apparatus and method to assure probe card-to-wafer parallelism in semiconductor automatic wafer test, probe card measurement systems, and probe card manufacturing | |
| US7868635B2 (en) | Probe | |
| US20030098681A1 (en) | Meter lead holder device | |
| KR100428782B1 (ko) | 포고 핀 탄성 측정장치 | |
| KR950033507A (ko) | Ic 측정시험장치 및 이것을 사용한 ic 측정시험방법 | |
| JPS5819487Y2 (ja) | プロ−ブ接触機構 | |
| CN111308237A (zh) | 测值针、测值针结构及自动测值机 | |
| JP2971491B2 (ja) | 検査装置 | |
| JP2767291B2 (ja) | 検査装置 | |
| JPH0441342Y2 (cg-RX-API-DMAC7.html) | ||
| JPH05264654A (ja) | バーンイン・ボード検査装置 | |
| JPH0338681Y2 (cg-RX-API-DMAC7.html) | ||
| CN220455425U (zh) | 一种薄板电阻测量装置 | |
| KR102887434B1 (ko) | 고속 rf 부품을 위한 rf 테스트 지그 | |
| CN217110801U (zh) | 一种光缆检测工装 | |
| JPS6222851Y2 (cg-RX-API-DMAC7.html) | ||
| PL73499Y1 (pl) | Uchwyt metrologiczny do długościomierzy | |
| KR100285606B1 (ko) | 웨이퍼 프로버의 카드체인저 | |
| JPH0639450Y2 (ja) | Lsiテスタ | |
| JPS6244328Y2 (cg-RX-API-DMAC7.html) | ||
| JPS59225538A (ja) | 半導体装置の検査方法 | |
| KR20220144555A (ko) | 간이 프로브 고정지그 | |
| JPH0237683A (ja) | 半導体装置測定用ソケット | |
| JPH04127581U (ja) | ポゴピン | |
| JPH02122645A (ja) | Ic製造用トレー |