JPS58174864A - 回路診断装置 - Google Patents

回路診断装置

Info

Publication number
JPS58174864A
JPS58174864A JP57058550A JP5855082A JPS58174864A JP S58174864 A JPS58174864 A JP S58174864A JP 57058550 A JP57058550 A JP 57058550A JP 5855082 A JP5855082 A JP 5855082A JP S58174864 A JPS58174864 A JP S58174864A
Authority
JP
Japan
Prior art keywords
variable filter
signal
time
circuit
signals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57058550A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0427506B2 (enrdf_load_html_response
Inventor
Shizuo Akiyama
鎮男 秋山
Katsushi Hayama
端山　克司
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP57058550A priority Critical patent/JPS58174864A/ja
Publication of JPS58174864A publication Critical patent/JPS58174864A/ja
Publication of JPH0427506B2 publication Critical patent/JPH0427506B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2837—Characterising or performance testing, e.g. of frequency response

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Time-Division Multiplex Systems (AREA)
JP57058550A 1982-04-08 1982-04-08 回路診断装置 Granted JPS58174864A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57058550A JPS58174864A (ja) 1982-04-08 1982-04-08 回路診断装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57058550A JPS58174864A (ja) 1982-04-08 1982-04-08 回路診断装置

Publications (2)

Publication Number Publication Date
JPS58174864A true JPS58174864A (ja) 1983-10-13
JPH0427506B2 JPH0427506B2 (enrdf_load_html_response) 1992-05-12

Family

ID=13087560

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57058550A Granted JPS58174864A (ja) 1982-04-08 1982-04-08 回路診断装置

Country Status (1)

Country Link
JP (1) JPS58174864A (enrdf_load_html_response)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006022026A1 (ja) * 2004-08-26 2006-03-02 Test Research Laboratories Inc. 半導体のテストシステム

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006022026A1 (ja) * 2004-08-26 2006-03-02 Test Research Laboratories Inc. 半導体のテストシステム
JPWO2006022026A1 (ja) * 2004-08-26 2008-05-08 テスト・リサーチ・ラボラトリーズ株式会社 半導体のテストシステム

Also Published As

Publication number Publication date
JPH0427506B2 (enrdf_load_html_response) 1992-05-12

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