JPH0427506B2 - - Google Patents

Info

Publication number
JPH0427506B2
JPH0427506B2 JP57058550A JP5855082A JPH0427506B2 JP H0427506 B2 JPH0427506 B2 JP H0427506B2 JP 57058550 A JP57058550 A JP 57058550A JP 5855082 A JP5855082 A JP 5855082A JP H0427506 B2 JPH0427506 B2 JP H0427506B2
Authority
JP
Japan
Prior art keywords
circuit
signal
memory
variable filter
signals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57058550A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58174864A (ja
Inventor
Shizuo Akyama
Katsushi Hayama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP57058550A priority Critical patent/JPS58174864A/ja
Publication of JPS58174864A publication Critical patent/JPS58174864A/ja
Publication of JPH0427506B2 publication Critical patent/JPH0427506B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2837—Characterising or performance testing, e.g. of frequency response

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Time-Division Multiplex Systems (AREA)
JP57058550A 1982-04-08 1982-04-08 回路診断装置 Granted JPS58174864A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57058550A JPS58174864A (ja) 1982-04-08 1982-04-08 回路診断装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57058550A JPS58174864A (ja) 1982-04-08 1982-04-08 回路診断装置

Publications (2)

Publication Number Publication Date
JPS58174864A JPS58174864A (ja) 1983-10-13
JPH0427506B2 true JPH0427506B2 (enrdf_load_html_response) 1992-05-12

Family

ID=13087560

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57058550A Granted JPS58174864A (ja) 1982-04-08 1982-04-08 回路診断装置

Country Status (1)

Country Link
JP (1) JPS58174864A (enrdf_load_html_response)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1783504A1 (en) * 2004-08-26 2007-05-09 Test Research Laboratories Inc. Semiconductor test system

Also Published As

Publication number Publication date
JPS58174864A (ja) 1983-10-13

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