JPS58160807A - β線透過式粉塵計 - Google Patents

β線透過式粉塵計

Info

Publication number
JPS58160807A
JPS58160807A JP4233482A JP4233482A JPS58160807A JP S58160807 A JPS58160807 A JP S58160807A JP 4233482 A JP4233482 A JP 4233482A JP 4233482 A JP4233482 A JP 4233482A JP S58160807 A JPS58160807 A JP S58160807A
Authority
JP
Japan
Prior art keywords
measured
dust
flow path
ray
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4233482A
Other languages
English (en)
Japanese (ja)
Other versions
JPH025244B2 (cg-RX-API-DMAC10.html
Inventor
Someyoshi Arai
新井　染吉
Masaki Mori
正樹 森
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
DKK TOA Corp
Original Assignee
DKK Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by DKK Corp filed Critical DKK Corp
Priority to JP4233482A priority Critical patent/JPS58160807A/ja
Publication of JPS58160807A publication Critical patent/JPS58160807A/ja
Publication of JPH025244B2 publication Critical patent/JPH025244B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/06—Investigating concentration of particle suspensions
    • G01N15/0606—Investigating concentration of particle suspensions by collecting particles on a support
    • G01N15/0618—Investigating concentration of particle suspensions by collecting particles on a support of the filter type

Landscapes

  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP4233482A 1982-03-17 1982-03-17 β線透過式粉塵計 Granted JPS58160807A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4233482A JPS58160807A (ja) 1982-03-17 1982-03-17 β線透過式粉塵計

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4233482A JPS58160807A (ja) 1982-03-17 1982-03-17 β線透過式粉塵計

Publications (2)

Publication Number Publication Date
JPS58160807A true JPS58160807A (ja) 1983-09-24
JPH025244B2 JPH025244B2 (cg-RX-API-DMAC10.html) 1990-02-01

Family

ID=12633104

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4233482A Granted JPS58160807A (ja) 1982-03-17 1982-03-17 β線透過式粉塵計

Country Status (1)

Country Link
JP (1) JPS58160807A (cg-RX-API-DMAC10.html)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61241640A (ja) * 1985-04-19 1986-10-27 Denki Kagaku Keiki Co Ltd ろ過捕集形粒子状物質濃度測定方法及びその装置
CN104359816A (zh) * 2014-11-19 2015-02-18 武汉怡特环保科技有限公司 β射线大气颗粒物监测装置
CN105043822A (zh) * 2014-12-31 2015-11-11 江苏天瑞仪器股份有限公司 一种大气颗粒物采集测量装置
CN109164118A (zh) * 2018-08-08 2019-01-08 北京雪迪龙科技股份有限公司 一种β吸收式测尘仪的定标系统及其方法
CN112098285A (zh) * 2020-09-10 2020-12-18 天津同阳科技发展有限公司 基于β射线法的挥发性颗粒物补偿测量装置及方法

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100526854C (zh) * 2007-07-03 2009-08-12 武汉市天虹仪表有限责任公司 一种β射线烟尘浓度直读监测仪及其确认有效样本的方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54137095U (cg-RX-API-DMAC10.html) * 1978-03-15 1979-09-22

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54137095U (cg-RX-API-DMAC10.html) * 1978-03-15 1979-09-22

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61241640A (ja) * 1985-04-19 1986-10-27 Denki Kagaku Keiki Co Ltd ろ過捕集形粒子状物質濃度測定方法及びその装置
CN104359816A (zh) * 2014-11-19 2015-02-18 武汉怡特环保科技有限公司 β射线大气颗粒物监测装置
CN105043822A (zh) * 2014-12-31 2015-11-11 江苏天瑞仪器股份有限公司 一种大气颗粒物采集测量装置
CN105043822B (zh) * 2014-12-31 2018-03-27 江苏天瑞仪器股份有限公司 一种大气颗粒物采集测量装置
CN109164118A (zh) * 2018-08-08 2019-01-08 北京雪迪龙科技股份有限公司 一种β吸收式测尘仪的定标系统及其方法
CN112098285A (zh) * 2020-09-10 2020-12-18 天津同阳科技发展有限公司 基于β射线法的挥发性颗粒物补偿测量装置及方法
CN112098285B (zh) * 2020-09-10 2021-04-06 天津同阳科技发展有限公司 基于β射线法的挥发性颗粒物补偿测量装置及方法

Also Published As

Publication number Publication date
JPH025244B2 (cg-RX-API-DMAC10.html) 1990-02-01

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