JPS58158544A - 光学的検査器 - Google Patents

光学的検査器

Info

Publication number
JPS58158544A
JPS58158544A JP4018382A JP4018382A JPS58158544A JP S58158544 A JPS58158544 A JP S58158544A JP 4018382 A JP4018382 A JP 4018382A JP 4018382 A JP4018382 A JP 4018382A JP S58158544 A JPS58158544 A JP S58158544A
Authority
JP
Japan
Prior art keywords
capsule
light
inspection device
axis
optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4018382A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0142371B2 (enExample
Inventor
Noriomi Miyoshi
紀臣 三好
Yukimasa Tachibana
橘　幸正
Tetsuji Kawasaki
哲治 川崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Fuji Electric Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd, Fuji Electric Manufacturing Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP4018382A priority Critical patent/JPS58158544A/ja
Publication of JPS58158544A publication Critical patent/JPS58158544A/ja
Publication of JPH0142371B2 publication Critical patent/JPH0142371B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9508—Capsules; Tablets

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP4018382A 1982-03-16 1982-03-16 光学的検査器 Granted JPS58158544A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4018382A JPS58158544A (ja) 1982-03-16 1982-03-16 光学的検査器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4018382A JPS58158544A (ja) 1982-03-16 1982-03-16 光学的検査器

Publications (2)

Publication Number Publication Date
JPS58158544A true JPS58158544A (ja) 1983-09-20
JPH0142371B2 JPH0142371B2 (enExample) 1989-09-12

Family

ID=12573663

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4018382A Granted JPS58158544A (ja) 1982-03-16 1982-03-16 光学的検査器

Country Status (1)

Country Link
JP (1) JPS58158544A (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60178910U (ja) * 1984-05-09 1985-11-28 林薬品機械株式会社 欠け錠剤検査装置
US10571244B2 (en) 2017-11-13 2020-02-25 Rolls-Royce Plc Measuring surface roughness

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5539001A (en) * 1978-09-13 1980-03-18 Hayashi Yakuhin Kikai Kk Defective capsule detector

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5539001A (en) * 1978-09-13 1980-03-18 Hayashi Yakuhin Kikai Kk Defective capsule detector

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60178910U (ja) * 1984-05-09 1985-11-28 林薬品機械株式会社 欠け錠剤検査装置
US10571244B2 (en) 2017-11-13 2020-02-25 Rolls-Royce Plc Measuring surface roughness

Also Published As

Publication number Publication date
JPH0142371B2 (enExample) 1989-09-12

Similar Documents

Publication Publication Date Title
US8228493B2 (en) Carrying device and appearance inspection device for test objects
US9329135B2 (en) Means for inspecting glass containers for defects
US4483615A (en) Method and apparatus for detecting checks in glass tubes
US3709598A (en) Optical system for capsule inspection
JPH0711494B2 (ja) 透光性容器の検査方法
GB2036301A (en) Foreign matter detecting device
JPS58219441A (ja) 凸面体の表面欠陥検査装置
JP2985160B2 (ja) Ｏリング検査装置
JP3205511B2 (ja) シール検査装置
JP2015040835A (ja) 透明板状体の欠点検査装置及び欠点検査方法
JPH01272947A (ja) ブラッシング装置
US4593190A (en) Apparatus for inspecting capsules
JP2521090Y2 (ja) 綾落ち検査装置
JPH0634573A (ja) 瓶検査装置
JPS58158544A (ja) 光学的検査器
JPS5576942A (en) Foreign matter detector at bottle
JP3007849B2 (ja) 物体表面の形状検出方法及び形状検出装置
JPS59128438A (ja) カプセル検査装置
JPS6222095B2 (enExample)
JPS5834348A (ja) ビン口欠陥検査装置
JP2012132752A (ja) ガラス壜の検査装置
JP2895773B2 (ja) 透明物品の検査装置
JP3184287B2 (ja) 光拡散体の検査装置
JP3720269B2 (ja) 検査装置および検査用レンズ
JPH07104289B2 (ja) びん口検査装置