JPS58153300A - メモリ・アドレス・シ−ケンス発生器 - Google Patents

メモリ・アドレス・シ−ケンス発生器

Info

Publication number
JPS58153300A
JPS58153300A JP57222231A JP22223182A JPS58153300A JP S58153300 A JPS58153300 A JP S58153300A JP 57222231 A JP57222231 A JP 57222231A JP 22223182 A JP22223182 A JP 22223182A JP S58153300 A JPS58153300 A JP S58153300A
Authority
JP
Japan
Prior art keywords
address
memory
sequence
away
home
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57222231A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6231440B2 (US20080293856A1-20081127-C00150.png
Inventor
ロバ−ト・エドウイン・ジヨ−ンズ
ドナルド・ヒユバ−ト・ウツド
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of JPS58153300A publication Critical patent/JPS58153300A/ja
Publication of JPS6231440B2 publication Critical patent/JPS6231440B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/31813—Test pattern generators

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
JP57222231A 1982-03-05 1982-12-20 メモリ・アドレス・シ−ケンス発生器 Granted JPS58153300A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US354971 1982-03-05
US06/354,971 US4442519A (en) 1982-03-05 1982-03-05 Memory address sequence generator

Publications (2)

Publication Number Publication Date
JPS58153300A true JPS58153300A (ja) 1983-09-12
JPS6231440B2 JPS6231440B2 (US20080293856A1-20081127-C00150.png) 1987-07-08

Family

ID=23395685

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57222231A Granted JPS58153300A (ja) 1982-03-05 1982-12-20 メモリ・アドレス・シ−ケンス発生器

Country Status (4)

Country Link
US (1) US4442519A (US20080293856A1-20081127-C00150.png)
EP (1) EP0088202B1 (US20080293856A1-20081127-C00150.png)
JP (1) JPS58153300A (US20080293856A1-20081127-C00150.png)
DE (1) DE3380080D1 (US20080293856A1-20081127-C00150.png)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6224500A (ja) * 1985-07-23 1987-02-02 Yokogawa Electric Corp 半導体メモリ検査装置

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3237365A1 (de) * 1982-10-08 1984-04-12 Siemens AG, 1000 Berlin und 8000 München Anordnung zur erzeugung von mustern von pruefsignalen bei einem pruefgeraet
US4751631A (en) * 1983-02-04 1988-06-14 Signal Processing Systems, Inc. Apparatus for fast generation of signal sequences
US4715034A (en) * 1985-03-04 1987-12-22 John Fluke Mfg. Co., Inc. Method of and system for fast functional testing of random access memories
DE3513551A1 (de) * 1985-04-16 1986-10-16 Wandel & Goltermann Gmbh & Co, 7412 Eningen Digitaler wortgenerator zur automatischen erzeugung periodischer dauerzeichen aus n-bit-woertern aller wortgewichte und deren permutationen
CA1259680A (en) * 1986-05-06 1989-09-19 Mosaid Technologies Inc. Digital signal scrambler
JPS633240U (US20080293856A1-20081127-C00150.png) * 1986-06-25 1988-01-11
US4852096A (en) * 1987-08-14 1989-07-25 International Business Machines Corp. CN2 test pattern generator
US5392302A (en) * 1991-03-13 1995-02-21 Quantum Corp. Address error detection technique for increasing the reliability of a storage subsystem
EP0573179A3 (en) * 1992-06-02 1996-06-05 American Telephone & Telegraph Non-fully-decoded test address generator
JPH08305638A (ja) * 1995-05-01 1996-11-22 Nec Corp Ｒｏｍデータ検査方法
US6061815A (en) * 1996-12-09 2000-05-09 Schlumberger Technologies, Inc. Programming utility register to generate addresses in algorithmic pattern generator
JP3235523B2 (ja) * 1997-08-06 2001-12-04 日本電気株式会社 半導体集積回路
US6073263A (en) * 1997-10-29 2000-06-06 Credence Systems Corporation Parallel processing pattern generation system for an integrated circuit tester
US6078637A (en) 1998-06-29 2000-06-20 Cypress Semiconductor Corp. Address counter test mode for memory device
US6934762B1 (en) 2000-04-27 2005-08-23 Redundant Networks, Inc. Method and apparatus for providing backup internet access

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3751649A (en) * 1971-05-17 1973-08-07 Marcrodata Co Memory system exerciser
DE2829709C2 (de) * 1978-07-06 1984-02-23 Ibm Deutschland Gmbh, 7000 Stuttgart Verfahren und Anordnung zur Erzeugung zeitlich unmittelbar aufeinanderfolgender Impulszyklen
JPS5552581A (en) * 1978-10-11 1980-04-17 Advantest Corp Pattern generator
JPS6030973B2 (ja) * 1980-01-18 1985-07-19 日本電気株式会社 高速パタ−ン発生器
US4370746A (en) * 1980-12-24 1983-01-25 International Business Machines Corporation Memory address selector

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6224500A (ja) * 1985-07-23 1987-02-02 Yokogawa Electric Corp 半導体メモリ検査装置

Also Published As

Publication number Publication date
EP0088202B1 (en) 1989-06-14
JPS6231440B2 (US20080293856A1-20081127-C00150.png) 1987-07-08
US4442519A (en) 1984-04-10
DE3380080D1 (en) 1989-07-20
EP0088202A2 (en) 1983-09-14
EP0088202A3 (en) 1987-06-03

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