JPS58105006A - 回転物体の回転中心位置検出方法 - Google Patents

回転物体の回転中心位置検出方法

Info

Publication number
JPS58105006A
JPS58105006A JP20426081A JP20426081A JPS58105006A JP S58105006 A JPS58105006 A JP S58105006A JP 20426081 A JP20426081 A JP 20426081A JP 20426081 A JP20426081 A JP 20426081A JP S58105006 A JPS58105006 A JP S58105006A
Authority
JP
Japan
Prior art keywords
interference fringe
measured
center position
rotation center
polarizer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP20426081A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6237325B2 (enExample
Inventor
Joji Matsuda
浄史 松田
Tomoaki Nagatoshi
永寿　伴章
Suketsugu Enomoto
祐嗣 榎本
Yoshitaro Yoshida
嘉太郎 吉田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology filed Critical Agency of Industrial Science and Technology
Priority to JP20426081A priority Critical patent/JPS58105006A/ja
Priority to US06/424,629 priority patent/US4529310A/en
Publication of JPS58105006A publication Critical patent/JPS58105006A/ja
Publication of JPS6237325B2 publication Critical patent/JPS6237325B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G01B11/27—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
    • G01B11/272—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes using photoelectric detection means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Automatic Control Of Machine Tools (AREA)
  • Machine Tool Sensing Apparatuses (AREA)
JP20426081A 1981-12-17 1981-12-17 回転物体の回転中心位置検出方法 Granted JPS58105006A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP20426081A JPS58105006A (ja) 1981-12-17 1981-12-17 回転物体の回転中心位置検出方法
US06/424,629 US4529310A (en) 1981-12-17 1982-09-27 Device for detection of center of rotation of rotating object

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20426081A JPS58105006A (ja) 1981-12-17 1981-12-17 回転物体の回転中心位置検出方法

Publications (2)

Publication Number Publication Date
JPS58105006A true JPS58105006A (ja) 1983-06-22
JPS6237325B2 JPS6237325B2 (enExample) 1987-08-12

Family

ID=16487510

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20426081A Granted JPS58105006A (ja) 1981-12-17 1981-12-17 回転物体の回転中心位置検出方法

Country Status (1)

Country Link
JP (1) JPS58105006A (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6015503A (ja) * 1983-07-08 1985-01-26 Res Dev Corp Of Japan 非接触直径測定方法及び装置
JPS61159104A (ja) * 1984-12-29 1986-07-18 Omron Tateisi Electronics Co 回転中心検出装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6015503A (ja) * 1983-07-08 1985-01-26 Res Dev Corp Of Japan 非接触直径測定方法及び装置
JPS61159104A (ja) * 1984-12-29 1986-07-18 Omron Tateisi Electronics Co 回転中心検出装置

Also Published As

Publication number Publication date
JPS6237325B2 (enExample) 1987-08-12

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