JPS58102395A - 半導体記憶装置 - Google Patents

半導体記憶装置

Info

Publication number
JPS58102395A
JPS58102395A JP56199476A JP19947681A JPS58102395A JP S58102395 A JPS58102395 A JP S58102395A JP 56199476 A JP56199476 A JP 56199476A JP 19947681 A JP19947681 A JP 19947681A JP S58102395 A JPS58102395 A JP S58102395A
Authority
JP
Japan
Prior art keywords
memory cell
circuit
defective
block
cell
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56199476A
Other languages
English (en)
Japanese (ja)
Other versions
JPS618520B2 (enrdf_load_stackoverflow
Inventor
Tsuneo Matsumura
常夫 松村
Tsuneo Mano
真野　恒夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP56199476A priority Critical patent/JPS58102395A/ja
Publication of JPS58102395A publication Critical patent/JPS58102395A/ja
Publication of JPS618520B2 publication Critical patent/JPS618520B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices

Landscapes

  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
JP56199476A 1981-12-12 1981-12-12 半導体記憶装置 Granted JPS58102395A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56199476A JPS58102395A (ja) 1981-12-12 1981-12-12 半導体記憶装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56199476A JPS58102395A (ja) 1981-12-12 1981-12-12 半導体記憶装置

Publications (2)

Publication Number Publication Date
JPS58102395A true JPS58102395A (ja) 1983-06-17
JPS618520B2 JPS618520B2 (enrdf_load_stackoverflow) 1986-03-14

Family

ID=16408429

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56199476A Granted JPS58102395A (ja) 1981-12-12 1981-12-12 半導体記憶装置

Country Status (1)

Country Link
JP (1) JPS58102395A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5987852A (ja) * 1982-11-10 1984-05-21 Toshiba Corp 半導体記憶装置
JPH07502361A (ja) * 1992-04-16 1995-03-09 シーメンス アクチエンゲゼルシヤフト 冗長装置を有する集積半導体メモリ

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100281284B1 (ko) * 1998-06-29 2001-02-01 김영환 컬럼 리던던시 회로

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5987852A (ja) * 1982-11-10 1984-05-21 Toshiba Corp 半導体記憶装置
JPH07502361A (ja) * 1992-04-16 1995-03-09 シーメンス アクチエンゲゼルシヤフト 冗長装置を有する集積半導体メモリ

Also Published As

Publication number Publication date
JPS618520B2 (enrdf_load_stackoverflow) 1986-03-14

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