JPS58101458U - 質量分析装置 - Google Patents

質量分析装置

Info

Publication number
JPS58101458U
JPS58101458U JP19727481U JP19727481U JPS58101458U JP S58101458 U JPS58101458 U JP S58101458U JP 19727481 U JP19727481 U JP 19727481U JP 19727481 U JP19727481 U JP 19727481U JP S58101458 U JPS58101458 U JP S58101458U
Authority
JP
Japan
Prior art keywords
mass spectrometer
ionization chamber
sample
electric field
magnetic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP19727481U
Other languages
English (en)
Japanese (ja)
Other versions
JPS6134686Y2 (enrdf_load_stackoverflow
Inventor
正三 大西
誠二 高橋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP19727481U priority Critical patent/JPS58101458U/ja
Publication of JPS58101458U publication Critical patent/JPS58101458U/ja
Application granted granted Critical
Publication of JPS6134686Y2 publication Critical patent/JPS6134686Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Electron Tubes For Measurement (AREA)
JP19727481U 1981-12-29 1981-12-29 質量分析装置 Granted JPS58101458U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19727481U JPS58101458U (ja) 1981-12-29 1981-12-29 質量分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19727481U JPS58101458U (ja) 1981-12-29 1981-12-29 質量分析装置

Publications (2)

Publication Number Publication Date
JPS58101458U true JPS58101458U (ja) 1983-07-09
JPS6134686Y2 JPS6134686Y2 (enrdf_load_stackoverflow) 1986-10-08

Family

ID=30110486

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19727481U Granted JPS58101458U (ja) 1981-12-29 1981-12-29 質量分析装置

Country Status (1)

Country Link
JP (1) JPS58101458U (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6066174A (ja) * 1983-09-21 1985-04-16 Hitachi Ltd 試料分析装置
JPS61140046A (ja) * 1984-12-12 1986-06-27 Fumio Watanabe 質量分析型残留ガス分析計における加熱脱ガス方法
JP2015068678A (ja) * 2013-09-27 2015-04-13 日本電子株式会社 質量分析装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6066174A (ja) * 1983-09-21 1985-04-16 Hitachi Ltd 試料分析装置
JPS61140046A (ja) * 1984-12-12 1986-06-27 Fumio Watanabe 質量分析型残留ガス分析計における加熱脱ガス方法
JP2015068678A (ja) * 2013-09-27 2015-04-13 日本電子株式会社 質量分析装置

Also Published As

Publication number Publication date
JPS6134686Y2 (enrdf_load_stackoverflow) 1986-10-08

Similar Documents

Publication Publication Date Title
JPS58101458U (ja) 質量分析装置
JPS5878557U (ja) 電界放出型イオン源
JPS5957850U (ja) 四重極質量分析計
JPS60114958U (ja) ガスクロマトグラフ質量分析装置
JPS59187070U (ja) 衝突活性化室
JPS60121252U (ja) 質量分析装置用イオン源
JPS5998566U (ja) 質量分析計の試料導入装置
JPS60140355U (ja) 質量分析装置
JPS6011062U (ja) ガスクロマトグラフ・質量分析装置
JPS5883145U (ja) 試料加熱機構
JPH01100362U (enrdf_load_stackoverflow)
JPS6130069U (ja) 被膜形成装置
JPS58125353U (ja) 負イオン検出装置
JPS59152555U (ja) イオン源装置
JPS60162924U (ja) コンパウンド溶解装置
JPS5985573U (ja) 質量分析装置
JPS6122554U (ja) 電気集じん装置用碍子の加熱装置
JPS61172456U (enrdf_load_stackoverflow)
JPS5861461U (ja) スパツタリング装置
JPS58145549U (ja) プラズマ発光分析用ト−チ
JPS60184257U (ja) イオン衝撃銃
JPS60126966U (ja) ウイ−ンフイルタ装置
JPS59103756U (ja) 高周波プラズマ励起用電極
JPS60154854U (ja) 液体クロマトグラフ質量分析装置
JPS58103606U (ja) 電気調理器