JPS58101458U - mass spectrometer - Google Patents

mass spectrometer

Info

Publication number
JPS58101458U
JPS58101458U JP19727481U JP19727481U JPS58101458U JP S58101458 U JPS58101458 U JP S58101458U JP 19727481 U JP19727481 U JP 19727481U JP 19727481 U JP19727481 U JP 19727481U JP S58101458 U JPS58101458 U JP S58101458U
Authority
JP
Japan
Prior art keywords
mass spectrometer
ionization chamber
sample
electric field
magnetic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP19727481U
Other languages
Japanese (ja)
Other versions
JPS6134686Y2 (en
Inventor
正三 大西
誠二 高橋
Original Assignee
株式会社島津製作所
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社島津製作所 filed Critical 株式会社島津製作所
Priority to JP19727481U priority Critical patent/JPS58101458U/en
Publication of JPS58101458U publication Critical patent/JPS58101458U/en
Application granted granted Critical
Publication of JPS6134686Y2 publication Critical patent/JPS6134686Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Electron Tubes For Measurement (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of drawings]

第１図は質量分析装置の概略眸第２甲はイオン源部の一
部拡大断面図、第３図、第４図（一部断面）は本考案の
試料導入機構の概略説明図である。 ５・・・試料導入機構、１２・・・加熱ヒータ、１３゜
１４・・・電源。FIG. 1 is a schematic view of the mass spectrometer, FIG. 2A is a partially enlarged sectional view of the ion source, and FIGS. 3 and 4 (partially in cross section) are schematic explanatory views of the sample introduction mechanism of the present invention. 5... Sample introduction mechanism, 12... Heater, 13°14... Power supply.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] イオン化された試料を磁界あるいは電界の作用のもとに
分離分析する匂のにおいてイオン化室内への試料導入機
構にイオン化室内面に付着した試料の焼き出し、あるい
はイオン化室内面への金属蒸着用の加熱機構を具備した
ことを特徴とする質量分析装置。When an ionized sample is separated and analyzed under the action of a magnetic or electric field, the sample introduction mechanism into the ionization chamber is used to bake out the sample adhered to the inside of the ionization chamber, or to heat the inside of the ionization chamber for metal deposition. A mass spectrometer characterized by comprising a mechanism.
JP19727481U 1981-12-29 1981-12-29 mass spectrometer Granted JPS58101458U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19727481U JPS58101458U (en) 1981-12-29 1981-12-29 mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19727481U JPS58101458U (en) 1981-12-29 1981-12-29 mass spectrometer

Publications (2)

Publication Number Publication Date
JPS58101458U true JPS58101458U (en) 1983-07-09
JPS6134686Y2 JPS6134686Y2 (en) 1986-10-08

Family

ID=30110486

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19727481U Granted JPS58101458U (en) 1981-12-29 1981-12-29 mass spectrometer

Country Status (1)

Country Link
JP (1) JPS58101458U (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6066174A (en) * 1983-09-21 1985-04-16 Hitachi Ltd Method and device for detecting electron and ion superposed beam
JPS61140046A (en) * 1984-12-12 1986-06-27 Fumio Watanabe Method of degassing by heating in mass spectrometer type residual gas analyzer
JP2015068678A (en) * 2013-09-27 2015-04-13 日本電子株式会社 Mass spectroscope

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6066174A (en) * 1983-09-21 1985-04-16 Hitachi Ltd Method and device for detecting electron and ion superposed beam
JPS61140046A (en) * 1984-12-12 1986-06-27 Fumio Watanabe Method of degassing by heating in mass spectrometer type residual gas analyzer
JP2015068678A (en) * 2013-09-27 2015-04-13 日本電子株式会社 Mass spectroscope

Also Published As

Publication number Publication date
JPS6134686Y2 (en) 1986-10-08

Similar Documents

Publication Publication Date Title
JPS58101458U (en) mass spectrometer
JPS5878557U (en) Field emission ion source
JPS5957850U (en) quadrupole mass spectrometer
JPS58101459U (en) Ion source for mass spectrometer
JPS58120556U (en) Mass spectrometer ion source
JPS60114958U (en) Gas chromatograph mass spectrometer
JPS59187070U (en) collision activation chamber
JPS60121252U (en) Ion source for mass spectrometer
JPS5926859U (en) Mass spectrometer ion source device
JPS5998566U (en) Mass spectrometer sample introduction device
JPS60140355U (en) mass spectrometer
JPS6011062U (en) Gas chromatograph/mass spectrometer
JPS5883145U (en) Sample heating mechanism
JPH01100362U (en)
JPS6130069U (en) Film forming device
JPS5985573U (en) mass spectrometer
JPS6122554U (en) Insulator heating device for electrostatic precipitator
JPS5861461U (en) sputtering equipment
JPS60163643U (en) limit switch
JPS58145549U (en) Torch for plasma emission analysis
JPS59148506U (en) microwave oven
JPS6171255U (en)
JPS59103756U (en) Electrode for high frequency plasma excitation
JPS60154854U (en) Liquid chromatograph mass spectrometer
JPS59174505U (en) electric oven