JPS5796582A - Measuring device for characteristic of semiconductor light emitting element - Google Patents

Measuring device for characteristic of semiconductor light emitting element

Info

Publication number
JPS5796582A
JPS5796582A JP17259980A JP17259980A JPS5796582A JP S5796582 A JPS5796582 A JP S5796582A JP 17259980 A JP17259980 A JP 17259980A JP 17259980 A JP17259980 A JP 17259980A JP S5796582 A JPS5796582 A JP S5796582A
Authority
JP
Japan
Prior art keywords
semiconductor laser
laser element
characteristic
light emitting
emitting element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17259980A
Other languages
Japanese (ja)
Inventor
Seiji Iida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP17259980A priority Critical patent/JPS5796582A/en
Publication of JPS5796582A publication Critical patent/JPS5796582A/en
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/0014—Measuring characteristics or properties thereof

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Lasers (AREA)
  • Led Devices (AREA)

Abstract

PURPOSE:To inspect and select the characteristics with high efficiency by moving the semiconductor laser element by means of a manipulator mechanism using a vacuum chuck. CONSTITUTION:The semiconductor laser element 1 is placed on a base 10, and electrical signals are supplied to the element 1 by means of the vacuum chuck 12 and an electrode 8. A light reflector 9 is placed on a circumferential section on the base centering around a placing section of the semiconductor laser element 1. A light detector 3 consisting of a PIN diode is arranged being contacted with a lower section of the transparent base 10. Light generated from the semiconductor laser element 1 is reflected downward by means of the light reflector 9 mounted onto the circumference, transmits the transparent base 10 and is detected by means of the light detector 3.
JP17259980A 1980-12-09 1980-12-09 Measuring device for characteristic of semiconductor light emitting element Pending JPS5796582A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17259980A JPS5796582A (en) 1980-12-09 1980-12-09 Measuring device for characteristic of semiconductor light emitting element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17259980A JPS5796582A (en) 1980-12-09 1980-12-09 Measuring device for characteristic of semiconductor light emitting element

Publications (1)

Publication Number Publication Date
JPS5796582A true JPS5796582A (en) 1982-06-15

Family

ID=15944835

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17259980A Pending JPS5796582A (en) 1980-12-09 1980-12-09 Measuring device for characteristic of semiconductor light emitting element

Country Status (1)

Country Link
JP (1) JPS5796582A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4854659A (en) * 1988-05-31 1989-08-08 Bt&D Technologies, Ltd. Optical devices
JP2005338759A (en) * 2004-04-27 2005-12-08 Ishikawajima Harima Heavy Ind Co Ltd Method and device for controlling noise in duct

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4854659A (en) * 1988-05-31 1989-08-08 Bt&D Technologies, Ltd. Optical devices
JP2005338759A (en) * 2004-04-27 2005-12-08 Ishikawajima Harima Heavy Ind Co Ltd Method and device for controlling noise in duct
JP4626299B2 (en) * 2004-04-27 2011-02-02 株式会社Ｉｈｉ Duct noise control method and apparatus

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