JPS5796582A - Measuring device for characteristic of semiconductor light emitting element - Google Patents
Measuring device for characteristic of semiconductor light emitting elementInfo
- Publication number
- JPS5796582A JPS5796582A JP17259980A JP17259980A JPS5796582A JP S5796582 A JPS5796582 A JP S5796582A JP 17259980 A JP17259980 A JP 17259980A JP 17259980 A JP17259980 A JP 17259980A JP S5796582 A JPS5796582 A JP S5796582A
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor laser
- laser element
- characteristic
- light emitting
- emitting element
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/0014—Measuring characteristics or properties thereof
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Optics & Photonics (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Semiconductor Lasers (AREA)
- Led Devices (AREA)
Abstract
PURPOSE:To inspect and select the characteristics with high efficiency by moving the semiconductor laser element by means of a manipulator mechanism using a vacuum chuck. CONSTITUTION:The semiconductor laser element 1 is placed on a base 10, and electrical signals are supplied to the element 1 by means of the vacuum chuck 12 and an electrode 8. A light reflector 9 is placed on a circumferential section on the base centering around a placing section of the semiconductor laser element 1. A light detector 3 consisting of a PIN diode is arranged being contacted with a lower section of the transparent base 10. Light generated from the semiconductor laser element 1 is reflected downward by means of the light reflector 9 mounted onto the circumference, transmits the transparent base 10 and is detected by means of the light detector 3.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17259980A JPS5796582A (en) | 1980-12-09 | 1980-12-09 | Measuring device for characteristic of semiconductor light emitting element |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17259980A JPS5796582A (en) | 1980-12-09 | 1980-12-09 | Measuring device for characteristic of semiconductor light emitting element |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5796582A true JPS5796582A (en) | 1982-06-15 |
Family
ID=15944835
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17259980A Pending JPS5796582A (en) | 1980-12-09 | 1980-12-09 | Measuring device for characteristic of semiconductor light emitting element |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5796582A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4854659A (en) * | 1988-05-31 | 1989-08-08 | Bt&D Technologies, Ltd. | Optical devices |
JP2005338759A (en) * | 2004-04-27 | 2005-12-08 | Ishikawajima Harima Heavy Ind Co Ltd | Method and device for controlling noise in duct |
-
1980
- 1980-12-09 JP JP17259980A patent/JPS5796582A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4854659A (en) * | 1988-05-31 | 1989-08-08 | Bt&D Technologies, Ltd. | Optical devices |
JP2005338759A (en) * | 2004-04-27 | 2005-12-08 | Ishikawajima Harima Heavy Ind Co Ltd | Method and device for controlling noise in duct |
JP4626299B2 (en) * | 2004-04-27 | 2011-02-02 | 株式会社Ihi | Duct noise control method and apparatus |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
ATE72325T1 (en) | PHOTOELECTRIC MEASUREMENT DEVICE. | |
JPS5433683A (en) | Air seal mounting for light emitting element | |
ES2035028T3 (en) | PHOTOELECTRIC SWITCHING DEVICE OF THE REFLECTION TYPE. | |
JPS5796582A (en) | Measuring device for characteristic of semiconductor light emitting element | |
JPS51114887A (en) | Semiconductor device | |
JPS5717909A (en) | Distance measuring unit | |
JPS56111407A (en) | Shaft torsion detecting method | |
KR101129228B1 (en) | Probe device for investigating light emitting elements | |
JPS6427286A (en) | Semiconductor device | |
JPS56108905A (en) | Rotary-machine centering apparatus | |
JPS57128042A (en) | Inspecting method for semiconductor device | |
JPS57158571A (en) | Measuring socket for small-sized semiconductor device | |
JPS57199931A (en) | Detecting apparatus of disconnected part for optical fiber | |
JPS5327087A (en) | Flaw detector | |
JPS5214477A (en) | Method to detect a defect in a transparent test object | |
JPS5619439A (en) | Photoelectric smoke detector | |
JPS57178134A (en) | Specular surface defect observing device | |
JPS5780731A (en) | Detecting device for improper semiconductor | |
JPS57135305A (en) | Length measuring method and its device | |
JPS5737209A (en) | Distance measuring device | |
JPS5382492A (en) | Surface inspecting method | |
FR2315700A1 (en) | Semiconductor component with high indicator - has integrated circuit and function indicator using light indicator | |
JPS56157028A (en) | Sample exchanger | |
JPS57181434A (en) | Position detector for head in disc storage device | |
JPS543485A (en) | Optical ignition tye semiconductor device |