JPS5796528A - Microwave plasma treating device - Google Patents
Microwave plasma treating deviceInfo
- Publication number
- JPS5796528A JPS5796528A JP17268080A JP17268080A JPS5796528A JP S5796528 A JPS5796528 A JP S5796528A JP 17268080 A JP17268080 A JP 17268080A JP 17268080 A JP17268080 A JP 17268080A JP S5796528 A JPS5796528 A JP S5796528A
- Authority
- JP
- Japan
- Prior art keywords
- plasma
- chamber
- reacting chamber
- chambers
- constitution
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32357—Generation remote from the workpiece, e.g. down-stream
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Drying Of Semiconductors (AREA)
Abstract
PURPOSE:To equalize etching operation by providing small holes which communicate a plasma generating chamber and a plasma reacting chamber through a shielding plate which shields both chambers, and eliminating standing waves in microwaves generated in an oven. CONSTITUTION:The small holes 5 are perforated through the microwave shielding plate 4 which separates the microwave oven 1 into the plasma generating chamber 2 and the plasma reacting chamber 3, and said two chambers are communicated. In this constitution, the plasma enters into the reacting chamber through the communicating holes 5, but most of the microwaves are attenuated and scattered. Therefore the degree of further excitation of the plasma in the reacting chamber 3 is small, the reaction is performed at a low temperature in etching, and the temperature can be increased when the resist film is incinerated.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17268080A JPS5796528A (en) | 1980-12-09 | 1980-12-09 | Microwave plasma treating device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17268080A JPS5796528A (en) | 1980-12-09 | 1980-12-09 | Microwave plasma treating device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5796528A true JPS5796528A (en) | 1982-06-15 |
Family
ID=15946368
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17268080A Pending JPS5796528A (en) | 1980-12-09 | 1980-12-09 | Microwave plasma treating device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5796528A (en) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS536239A (en) * | 1976-07-08 | 1978-01-20 | Nippon Electric Co | Plasma etching method |
JPS5424580A (en) * | 1977-07-27 | 1979-02-23 | Toshiba Corp | Etching method |
-
1980
- 1980-12-09 JP JP17268080A patent/JPS5796528A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS536239A (en) * | 1976-07-08 | 1978-01-20 | Nippon Electric Co | Plasma etching method |
JPS5424580A (en) * | 1977-07-27 | 1979-02-23 | Toshiba Corp | Etching method |
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