JPS5793269A - Transistor tester - Google Patents

Transistor tester

Info

Publication number
JPS5793269A
JPS5793269A JP16861580A JP16861580A JPS5793269A JP S5793269 A JPS5793269 A JP S5793269A JP 16861580 A JP16861580 A JP 16861580A JP 16861580 A JP16861580 A JP 16861580A JP S5793269 A JPS5793269 A JP S5793269A
Authority
JP
Japan
Prior art keywords
signal
sus
vce
transistor
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16861580A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6139628B2 (enrdf_load_stackoverflow
Inventor
Shinichi Hanayama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP16861580A priority Critical patent/JPS5793269A/ja
Publication of JPS5793269A publication Critical patent/JPS5793269A/ja
Publication of JPS6139628B2 publication Critical patent/JPS6139628B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP16861580A 1980-11-29 1980-11-29 Transistor tester Granted JPS5793269A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16861580A JPS5793269A (en) 1980-11-29 1980-11-29 Transistor tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16861580A JPS5793269A (en) 1980-11-29 1980-11-29 Transistor tester

Publications (2)

Publication Number Publication Date
JPS5793269A true JPS5793269A (en) 1982-06-10
JPS6139628B2 JPS6139628B2 (enrdf_load_stackoverflow) 1986-09-04

Family

ID=15871335

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16861580A Granted JPS5793269A (en) 1980-11-29 1980-11-29 Transistor tester

Country Status (1)

Country Link
JP (1) JPS5793269A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013257177A (ja) * 2012-06-11 2013-12-26 Sharp Corp 半導体試験装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5136077A (enrdf_load_stackoverflow) * 1974-09-24 1976-03-26 Tokyo Shibaura Electric Co

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5136077A (enrdf_load_stackoverflow) * 1974-09-24 1976-03-26 Tokyo Shibaura Electric Co

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013257177A (ja) * 2012-06-11 2013-12-26 Sharp Corp 半導体試験装置

Also Published As

Publication number Publication date
JPS6139628B2 (enrdf_load_stackoverflow) 1986-09-04

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