JPS55442A - Test interchanging device - Google Patents

Test interchanging device

Info

Publication number
JPS55442A
JPS55442A JP7386178A JP7386178A JPS55442A JP S55442 A JPS55442 A JP S55442A JP 7386178 A JP7386178 A JP 7386178A JP 7386178 A JP7386178 A JP 7386178A JP S55442 A JPS55442 A JP S55442A
Authority
JP
Japan
Prior art keywords
test
circuits
time
circuit
bias
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7386178A
Other languages
Japanese (ja)
Inventor
Masahiro Matsushita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP7386178A priority Critical patent/JPS55442A/en
Publication of JPS55442A publication Critical patent/JPS55442A/en
Pending legal-status Critical Current

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  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE: To automatically effect the interchange to an aging test to a bias test of an integrated circuit by accomplishing the interchange through a coincidence detecting circuit including an exclusive OR circuit which is mounted in a counter.
CONSTITUTION: When the bias testing time is set by terminals 231 and 232 to turn on a start switch 11, a transistor 15 is rendered inconductive in response to the low level output of an FF 12 so that a relay coil 16 is demagnetized. As a result, the temperature bias test of the circuit is started, and the reset counters 141 to 146 count the watch pulses so that the elapse time is displayed by LEDs 211 to 224. If the coincidence between the counted time of the counters 141 to 146 and the set time is detected by exclusive OR circuits 241 and 242, the output of the FF 12 is inverted by the detected output of the circuits 241 and 242, which has passed through NAND circuits 251, 252 and 26, so that the test is automatically intercharged to the aging test through the coil 16.
COPYRIGHT: (C)1980,JPO&Japio
JP7386178A 1978-06-19 1978-06-19 Test interchanging device Pending JPS55442A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7386178A JPS55442A (en) 1978-06-19 1978-06-19 Test interchanging device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7386178A JPS55442A (en) 1978-06-19 1978-06-19 Test interchanging device

Publications (1)

Publication Number Publication Date
JPS55442A true JPS55442A (en) 1980-01-05

Family

ID=13530364

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7386178A Pending JPS55442A (en) 1978-06-19 1978-06-19 Test interchanging device

Country Status (1)

Country Link
JP (1) JPS55442A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5923804A (en) * 1982-07-28 1984-02-07 Akebono Brake Ind Co Ltd Method for molding friction material
CN105136255A (en) * 2015-10-19 2015-12-09 蚌埠森瑟尔测控系统工程有限公司 Fuel oil filter water level sensor ageing bedstand

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5923804A (en) * 1982-07-28 1984-02-07 Akebono Brake Ind Co Ltd Method for molding friction material
JPH0221410B2 (en) * 1982-07-28 1990-05-14 Akebono Brake Ind
CN105136255A (en) * 2015-10-19 2015-12-09 蚌埠森瑟尔测控系统工程有限公司 Fuel oil filter water level sensor ageing bedstand

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