JPS5654370A - Testing method of semiconductor - Google Patents
Testing method of semiconductorInfo
- Publication number
- JPS5654370A JPS5654370A JP13144179A JP13144179A JPS5654370A JP S5654370 A JPS5654370 A JP S5654370A JP 13144179 A JP13144179 A JP 13144179A JP 13144179 A JP13144179 A JP 13144179A JP S5654370 A JPS5654370 A JP S5654370A
- Authority
- JP
- Japan
- Prior art keywords
- switch
- semiconductor device
- source voltage
- rise
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
PURPOSE: To surely detect the operation unstability of a semiconductor device which is liable to occur when the rise of source voltage is slow by providing a rise delay circuit of source voltage between a switch and the semiconductor device.
CONSTITUTION: A resistor 5 and a capacitor 6 are provided between a semiconductor device 1 and a switch 2. The delay time from the rise point of source voltage of the case when the switch 2 is closed may be set as desired by the product of the resistance 5 and the capacitor 6. It is equally well to provide the resistor 5 between the switch 2 and a DC electric power source 3.
COPYRIGHT: (C)1981,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13144179A JPS5654370A (en) | 1979-10-11 | 1979-10-11 | Testing method of semiconductor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13144179A JPS5654370A (en) | 1979-10-11 | 1979-10-11 | Testing method of semiconductor |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5654370A true JPS5654370A (en) | 1981-05-14 |
Family
ID=15058027
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13144179A Pending JPS5654370A (en) | 1979-10-11 | 1979-10-11 | Testing method of semiconductor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5654370A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03120316A (en) * | 1989-10-02 | 1991-05-22 | Sumitomo Metal Ind Ltd | Production of nonoriented silicon steel sheet |
KR20150108387A (en) | 2013-02-22 | 2015-09-25 | 제이에프이 스틸 가부시키가이샤 | Hot-rolled steel sheet for producing non-oriented electrical steel sheet and method of producing same |
-
1979
- 1979-10-11 JP JP13144179A patent/JPS5654370A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03120316A (en) * | 1989-10-02 | 1991-05-22 | Sumitomo Metal Ind Ltd | Production of nonoriented silicon steel sheet |
KR20150108387A (en) | 2013-02-22 | 2015-09-25 | 제이에프이 스틸 가부시키가이샤 | Hot-rolled steel sheet for producing non-oriented electrical steel sheet and method of producing same |
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