JPS6139628B2 - - Google Patents

Info

Publication number
JPS6139628B2
JPS6139628B2 JP55168615A JP16861580A JPS6139628B2 JP S6139628 B2 JPS6139628 B2 JP S6139628B2 JP 55168615 A JP55168615 A JP 55168615A JP 16861580 A JP16861580 A JP 16861580A JP S6139628 B2 JPS6139628 B2 JP S6139628B2
Authority
JP
Japan
Prior art keywords
transistor
sus
circuit
voltage
collector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55168615A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5793269A (en
Inventor
Shinichi Hanayama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP16861580A priority Critical patent/JPS5793269A/ja
Publication of JPS5793269A publication Critical patent/JPS5793269A/ja
Publication of JPS6139628B2 publication Critical patent/JPS6139628B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP16861580A 1980-11-29 1980-11-29 Transistor tester Granted JPS5793269A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16861580A JPS5793269A (en) 1980-11-29 1980-11-29 Transistor tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16861580A JPS5793269A (en) 1980-11-29 1980-11-29 Transistor tester

Publications (2)

Publication Number Publication Date
JPS5793269A JPS5793269A (en) 1982-06-10
JPS6139628B2 true JPS6139628B2 (enrdf_load_stackoverflow) 1986-09-04

Family

ID=15871335

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16861580A Granted JPS5793269A (en) 1980-11-29 1980-11-29 Transistor tester

Country Status (1)

Country Link
JP (1) JPS5793269A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013257177A (ja) * 2012-06-11 2013-12-26 Sharp Corp 半導体試験装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5136077A (enrdf_load_stackoverflow) * 1974-09-24 1976-03-26 Tokyo Shibaura Electric Co

Also Published As

Publication number Publication date
JPS5793269A (en) 1982-06-10

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