JPS5785266A - Zener diode - Google Patents
Zener diodeInfo
- Publication number
- JPS5785266A JPS5785266A JP16080580A JP16080580A JPS5785266A JP S5785266 A JPS5785266 A JP S5785266A JP 16080580 A JP16080580 A JP 16080580A JP 16080580 A JP16080580 A JP 16080580A JP S5785266 A JPS5785266 A JP S5785266A
- Authority
- JP
- Japan
- Prior art keywords
- concentration
- buried layer
- zener diode
- shaped
- junction
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000010410 layer Substances 0.000 abstract 5
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 abstract 1
- 229910052796 boron Inorganic materials 0.000 abstract 1
- 239000012535 impurity Substances 0.000 abstract 1
- 239000004065 semiconductor Substances 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
- 239000002344 surface layer Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/86—Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
- H01L29/861—Diodes
- H01L29/866—Zener diodes
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Bipolar Integrated Circuits (AREA)
Abstract
PURPOSE:To improve a noise characteristic and a characteristic of current-carrying capacity by forming a junction section to a surface layer of a high concentration impurity buried layer formed to semiconductor substrate. CONSTITUTION:A P<+> type anode region 14 having 3X10<20>cm<-3> surface boron concentration, which penetrates an N<-> region 13 from the surface of one part of the N<-> region and is deeply diffused and shaped, reaches the N<+> type buried layer 12 formed in 2X10<2>cm<-3> surface concentration, and a PN junction 124 is shaped to the surface with the buried layer. Since the Zener diode having this structure is formed in 2X10<21>cm<-3> surface concentration higher than the 10<18>- 10<19>cm<-3> surface concentration of the N type buried layer used for a monolithic IC at one stage, the concentration of the PN junction 124 section molded between the buied layer 12 and the anode region 14 is increased together, and the Zener diode having low breadkown voltage can be shaped.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16080580A JPS5785266A (en) | 1980-11-17 | 1980-11-17 | Zener diode |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16080580A JPS5785266A (en) | 1980-11-17 | 1980-11-17 | Zener diode |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5785266A true JPS5785266A (en) | 1982-05-27 |
Family
ID=15722812
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16080580A Pending JPS5785266A (en) | 1980-11-17 | 1980-11-17 | Zener diode |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5785266A (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61120478A (en) * | 1984-11-16 | 1986-06-07 | Fuji Electric Co Ltd | Semiconductor integrated circuit |
US4651178A (en) * | 1985-05-31 | 1987-03-17 | Rca Corporation | Dual inverse zener diode with buried junctions |
JPS63184359A (en) * | 1987-01-27 | 1988-07-29 | Toshiba Corp | Input protective circuit of semiconductor device |
US5055888A (en) * | 1989-06-21 | 1991-10-08 | Texas Instrumenets Incorporated | Zener diodes in a linear semiconductor device |
US5583064A (en) * | 1994-01-28 | 1996-12-10 | Goldstar Electron Co. Ltd. | Semiconductor device and process for formation thereof |
EP1003218A1 (en) * | 1998-11-21 | 2000-05-24 | Micronas Intermetall GmbH | Semiconductor devices comprising a Schottky diode and a diode having a highly doped region and corresponding manufacturing methods |
US7019379B2 (en) * | 2003-01-09 | 2006-03-28 | Matsushita Electric Industrial Co., Ltd. | Semiconductor device comprising voltage regulator element |
-
1980
- 1980-11-17 JP JP16080580A patent/JPS5785266A/en active Pending
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61120478A (en) * | 1984-11-16 | 1986-06-07 | Fuji Electric Co Ltd | Semiconductor integrated circuit |
JPH0568864B2 (en) * | 1984-11-16 | 1993-09-29 | Fuji Electric Co Ltd | |
US4651178A (en) * | 1985-05-31 | 1987-03-17 | Rca Corporation | Dual inverse zener diode with buried junctions |
JPS63184359A (en) * | 1987-01-27 | 1988-07-29 | Toshiba Corp | Input protective circuit of semiconductor device |
JPH0413865B2 (en) * | 1987-01-27 | 1992-03-11 | Tokyo Shibaura Electric Co | |
US5055888A (en) * | 1989-06-21 | 1991-10-08 | Texas Instrumenets Incorporated | Zener diodes in a linear semiconductor device |
US5583064A (en) * | 1994-01-28 | 1996-12-10 | Goldstar Electron Co. Ltd. | Semiconductor device and process for formation thereof |
EP1003218A1 (en) * | 1998-11-21 | 2000-05-24 | Micronas Intermetall GmbH | Semiconductor devices comprising a Schottky diode and a diode having a highly doped region and corresponding manufacturing methods |
US6225653B1 (en) | 1998-11-21 | 2001-05-01 | Micronas Gmbh | Semiconductor components and methods of manufacturing semiconductor components |
US7019379B2 (en) * | 2003-01-09 | 2006-03-28 | Matsushita Electric Industrial Co., Ltd. | Semiconductor device comprising voltage regulator element |
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