JPS5769736A - Forming method for through hole - Google Patents
Forming method for through holeInfo
- Publication number
- JPS5769736A JPS5769736A JP14433580A JP14433580A JPS5769736A JP S5769736 A JPS5769736 A JP S5769736A JP 14433580 A JP14433580 A JP 14433580A JP 14433580 A JP14433580 A JP 14433580A JP S5769736 A JPS5769736 A JP S5769736A
- Authority
- JP
- Japan
- Prior art keywords
- hole
- recess
- exposure mask
- holes
- mask
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76897—Formation of self-aligned vias or contact plugs, i.e. involving a lithographically uncritical step
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Electrodes Of Semiconductors (AREA)
- Bipolar Transistors (AREA)
Abstract
PURPOSE:To facilitate the mask matching of masks to be treated required to be positioned to the first and second holes by forming recesses corresponding to the first and second holes with the first exposure mask and forming the second hole in the recess with the second exposure mask. CONSTITUTION:An emitter contacting hole 5 and a base contacting hole are formed at the insulating film 4 on an emitter region 3 and at the insulating film on a base region 2 in an N-type Si epitaxial layer 1 with the first exposure mask 7 at the recess 6 to the midway of a shallow film corresponding in size thereto. Then, a hole 11 reaching the base region 2 is formed under the recess 6, the second exposure mask 15 is formed at the recess 12 having large area at the periphery of the hole and two through holes 5, 11 are formed. In this manner, the mask matching at the time of patterning the metallic film to be coated next can be readily performed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14433580A JPS5769736A (en) | 1980-10-17 | 1980-10-17 | Forming method for through hole |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14433580A JPS5769736A (en) | 1980-10-17 | 1980-10-17 | Forming method for through hole |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5769736A true JPS5769736A (en) | 1982-04-28 |
Family
ID=15359711
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14433580A Pending JPS5769736A (en) | 1980-10-17 | 1980-10-17 | Forming method for through hole |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5769736A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60257571A (en) * | 1984-06-04 | 1985-12-19 | Rohm Co Ltd | Manufacture of semiconductor device |
-
1980
- 1980-10-17 JP JP14433580A patent/JPS5769736A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60257571A (en) * | 1984-06-04 | 1985-12-19 | Rohm Co Ltd | Manufacture of semiconductor device |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS5284981A (en) | Production of insulated gate type semiconductor device | |
JPS51147985A (en) | Method of manufacturing a semiconductor light emission device | |
JPS5324277A (en) | Semiconductor devic e and its production | |
JPS5769736A (en) | Forming method for through hole | |
JPS5310265A (en) | Impurity diffusion method | |
JPS5623746A (en) | Manufacture of semiconductor device | |
JPS5420675A (en) | Production of semiconductor device | |
JPS5264285A (en) | Production of compositemetal layer of integrated circuit device | |
JPS55124230A (en) | Forming method of pattern | |
JPS56165320A (en) | Formation of multilayer electrodes of semiconductor device | |
JPS5218169A (en) | Production method of semiconductor | |
JPS5370769A (en) | Production of semiconductor device | |
JPS5412268A (en) | Production of semiconductor device | |
JPS51132085A (en) | Manufacturing method of semiconductor device | |
JPS539488A (en) | Production of semiconductor device | |
JPS5317286A (en) | Production of semiconductor device | |
JPS5333056A (en) | Electrode forming method of semiconductor device | |
JPS5320864A (en) | Film forming method | |
JPS57122570A (en) | Forming method for impurity region in semiconductor | |
JPS5385158A (en) | Electrode forming method of semiconductor device | |
JPS5259565A (en) | Manufacture of shadow mask | |
JPS57181143A (en) | Manufacture of semiconductor device | |
JPS5759321A (en) | Manufacture of semiconductor device | |
JPS52153677A (en) | Sos type semiconductor device | |
JPS57136365A (en) | Transistor |