JPS5769228A - Deterioration detection system for optical transmitting circuit - Google Patents

Deterioration detection system for optical transmitting circuit

Info

Publication number
JPS5769228A
JPS5769228A JP55145077A JP14507780A JPS5769228A JP S5769228 A JPS5769228 A JP S5769228A JP 55145077 A JP55145077 A JP 55145077A JP 14507780 A JP14507780 A JP 14507780A JP S5769228 A JPS5769228 A JP S5769228A
Authority
JP
Japan
Prior art keywords
circuit
deterioration
integrator
mark
space
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55145077A
Other languages
Japanese (ja)
Other versions
JPS6351424B2 (en
Inventor
Fumihiko Takezoe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Fuji Facom Corp
Original Assignee
Fuji Electric Co Ltd
Fuji Facom Corp
Fuji Electric Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd, Fuji Facom Corp, Fuji Electric Manufacturing Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP55145077A priority Critical patent/JPS5769228A/en
Publication of JPS5769228A publication Critical patent/JPS5769228A/en
Publication of JPS6351424B2 publication Critical patent/JPS6351424B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/332—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face using discrete input signals

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Dc Digital Transmission (AREA)
  • Optical Communication System (AREA)

Abstract

PURPOSE:To perform deterioration detection economically and with reliability by inputting trains of pulses with a constant ratio of mark and space and integrating the trains of pulses of the receiving side. CONSTITUTION:An optical transmitting circuit consists of an electricity/light converter 1, optical transmitting channel 3, and light/electricity converter 2, and reference numerals 6, 7 are code converters, and 8 is an optical signal deterioration detecting circuit. The optical signal deterioration detection circuit 8 consists of a buffer amplifier 81, integrator 82, high potential level detecting comparator 83, low potential level detecting comparator 84, and OR-circuit 85. Pulse signals of code with constant ratio of mark and space are transmitted through the optical transmission circuit. If an input to the buffer amplifier 81 is a pulse signal with a ratio of mark and space being a:b (a+b=constant), the output of the integrator 82 is VO= Ea(a+b), when the voltage of the power source is Eo. If (a) is the initial value, the output (VO) of the integrator when the (a) has changed by + or -X% due to deterioration is: VO=EO a (1+ or -X)/(a+b). Deterioration can be detected by setting the reference voltages V1, V2 at this value.
JP55145077A 1980-10-18 1980-10-18 Deterioration detection system for optical transmitting circuit Granted JPS5769228A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55145077A JPS5769228A (en) 1980-10-18 1980-10-18 Deterioration detection system for optical transmitting circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55145077A JPS5769228A (en) 1980-10-18 1980-10-18 Deterioration detection system for optical transmitting circuit

Publications (2)

Publication Number Publication Date
JPS5769228A true JPS5769228A (en) 1982-04-27
JPS6351424B2 JPS6351424B2 (en) 1988-10-13

Family

ID=15376842

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55145077A Granted JPS5769228A (en) 1980-10-18 1980-10-18 Deterioration detection system for optical transmitting circuit

Country Status (1)

Country Link
JP (1) JPS5769228A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5860843A (en) * 1981-10-06 1983-04-11 Natl Aerospace Lab Fault judging circuit
JPS59104531A (en) * 1982-12-07 1984-06-16 Tohoku Electric Power Co Inc Predicting device of break of optical fiber cable
JPS59122031A (en) * 1982-12-28 1984-07-14 Toshiba Corp Optical transmission system
JPH0210242A (en) * 1988-03-03 1990-01-16 American Teleph & Telegr Co <Att> Test in manufacture, operation and maintenance of optical apparatus assembly
JP2011120208A (en) * 2009-11-06 2011-06-16 Toshiba Corp Failure prediction unit
JP2017158152A (en) * 2016-03-04 2017-09-07 ルネサスエレクトロニクス株式会社 Semiconductor device, light source control device, and light source control system

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5319886A (en) * 1976-08-08 1978-02-23 Nippon Soken Deterioration detecting apparatus for oxygen concentration detector
JPS5471502A (en) * 1977-11-18 1979-06-08 Fujitsu Ltd Alarm circuit for photo reception
JPS55110086A (en) * 1979-02-16 1980-08-25 Fujitsu Ltd Light output cut-off detecting system
JPS55127742A (en) * 1979-03-19 1980-10-02 Honeywell Inf Systems Device and method of replacing parallel connection link between computer and peripheral unit in series optical link

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5319886A (en) * 1976-08-08 1978-02-23 Nippon Soken Deterioration detecting apparatus for oxygen concentration detector
JPS5471502A (en) * 1977-11-18 1979-06-08 Fujitsu Ltd Alarm circuit for photo reception
JPS55110086A (en) * 1979-02-16 1980-08-25 Fujitsu Ltd Light output cut-off detecting system
JPS55127742A (en) * 1979-03-19 1980-10-02 Honeywell Inf Systems Device and method of replacing parallel connection link between computer and peripheral unit in series optical link

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5860843A (en) * 1981-10-06 1983-04-11 Natl Aerospace Lab Fault judging circuit
JPS59104531A (en) * 1982-12-07 1984-06-16 Tohoku Electric Power Co Inc Predicting device of break of optical fiber cable
JPH0220049B2 (en) * 1982-12-07 1990-05-08 Tohoku Electric Power Co
JPS59122031A (en) * 1982-12-28 1984-07-14 Toshiba Corp Optical transmission system
JPH0210242A (en) * 1988-03-03 1990-01-16 American Teleph & Telegr Co <Att> Test in manufacture, operation and maintenance of optical apparatus assembly
JP2011120208A (en) * 2009-11-06 2011-06-16 Toshiba Corp Failure prediction unit
JP2017158152A (en) * 2016-03-04 2017-09-07 ルネサスエレクトロニクス株式会社 Semiconductor device, light source control device, and light source control system

Also Published As

Publication number Publication date
JPS6351424B2 (en) 1988-10-13

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