JPS5760243A - Measuring apparatus for fresnel lens - Google Patents
Measuring apparatus for fresnel lensInfo
- Publication number
- JPS5760243A JPS5760243A JP13636980A JP13636980A JPS5760243A JP S5760243 A JPS5760243 A JP S5760243A JP 13636980 A JP13636980 A JP 13636980A JP 13636980 A JP13636980 A JP 13636980A JP S5760243 A JPS5760243 A JP S5760243A
- Authority
- JP
- Japan
- Prior art keywords
- fresnel lens
- lens
- measured
- photo
- pin hole
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0228—Testing optical properties by measuring refractive power
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Abstract
PURPOSE:To achieve a simultaneous measurement of a focal distance and diffusing property in a handy and accurate manner for a Fresnel lens of a single lens reflex camera. CONSTITUTION:A light from the pin hole of a chart 4 is made parallel with a collimeter lens 5 and enters a Fresnel lens 6 to be measured. The parallel light flux converges on a certain point after passing the Fresnel lens 6. A pinhole plate 7 and a photo dtector 8 are moved together along the optical axis to find such a position of the photo detector 8 that an ammeter 9 rises to the highest value in the reading. At this point, the distance between the Fresnel lens 6 and the photo detection surface of the pin hole plate 7 is measured to obtain the focal distance of the lens 6. When the peak of the measured value is compared with the peak value previously obtained from a sample master having a mat surface arranged to be varied in the roughness, the diffusion peroperty of the Fresnel lens can be determined as well.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13636980A JPS5760243A (en) | 1980-09-30 | 1980-09-30 | Measuring apparatus for fresnel lens |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13636980A JPS5760243A (en) | 1980-09-30 | 1980-09-30 | Measuring apparatus for fresnel lens |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5760243A true JPS5760243A (en) | 1982-04-12 |
Family
ID=15173549
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13636980A Pending JPS5760243A (en) | 1980-09-30 | 1980-09-30 | Measuring apparatus for fresnel lens |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5760243A (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61263509A (en) * | 1985-05-15 | 1986-11-21 | Satoru Imamura | Vibratory transport machine |
JPH03269335A (en) * | 1990-03-20 | 1991-11-29 | Mitsubishi Electric Corp | Lamp emitting type light source |
US5601489A (en) * | 1982-10-13 | 1997-02-11 | Sharp Kabushiki Kaisha | Compact electronic apparatus with removable processing units |
WO2008072709A1 (en) * | 2006-12-14 | 2008-06-19 | Panasonic Corporation | Method for measuring optical characteristics of diffraction optical element and apparatus for measuring optical characteristics of diffraction optical element |
CN103175675A (en) * | 2011-12-22 | 2013-06-26 | 中国计量学院 | Concentration magnification testing device |
WO2013178611A1 (en) * | 2012-05-30 | 2013-12-05 | Fresnel Optics Gmbh | Arrangement for optically characterizing fresnel lenses |
JP2018077461A (en) * | 2016-09-29 | 2018-05-17 | 株式会社ミツトヨ | Variable focal length lens system with focus monitoring and control |
-
1980
- 1980-09-30 JP JP13636980A patent/JPS5760243A/en active Pending
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5601489A (en) * | 1982-10-13 | 1997-02-11 | Sharp Kabushiki Kaisha | Compact electronic apparatus with removable processing units |
JPS61263509A (en) * | 1985-05-15 | 1986-11-21 | Satoru Imamura | Vibratory transport machine |
JPH03269335A (en) * | 1990-03-20 | 1991-11-29 | Mitsubishi Electric Corp | Lamp emitting type light source |
WO2008072709A1 (en) * | 2006-12-14 | 2008-06-19 | Panasonic Corporation | Method for measuring optical characteristics of diffraction optical element and apparatus for measuring optical characteristics of diffraction optical element |
US8089620B2 (en) | 2006-12-14 | 2012-01-03 | Panasonic Corporation | Method for measuring optical characteristics of diffraction optical element and apparatus for measuring optical characteristics of diffraction optical element |
US8284388B2 (en) | 2006-12-14 | 2012-10-09 | Panasonic Corporation | Method for measuring optical characteristics of diffraction optical element and apparatus for measuring optical characteristics of diffraction optical element |
US8390799B2 (en) | 2006-12-14 | 2013-03-05 | Panasonic Corporation | Method for measuring optical characteristics of diffraction optical element and apparatus for measuring optical characteristics of diffraction optical element |
CN103175675A (en) * | 2011-12-22 | 2013-06-26 | 中国计量学院 | Concentration magnification testing device |
WO2013178611A1 (en) * | 2012-05-30 | 2013-12-05 | Fresnel Optics Gmbh | Arrangement for optically characterizing fresnel lenses |
JP2018077461A (en) * | 2016-09-29 | 2018-05-17 | 株式会社ミツトヨ | Variable focal length lens system with focus monitoring and control |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS5760243A (en) | Measuring apparatus for fresnel lens | |
Capstaff et al. | A compact motion picture densitometer | |
JPS5646433A (en) | Measuring device of laser beam diameter | |
US3107298A (en) | Apparatus for the measurement of fluorescent tracer sensitivity | |
FR2425065A1 (en) | Optical system for measuring surface reflectance properties - has optical elements aligned close to surface normal (OE 15.10.79) | |
JPS5719608A (en) | Device for measuring diameter | |
JPS5735760A (en) | Current measuring device | |
JPS5726704A (en) | Measuring instrument for three-dimensional shape | |
JPS57148233A (en) | Testing method and device for hardness | |
JPS5720636A (en) | Measuring device for transmittance of lens | |
JPS57135306A (en) | Measuring method of microsubstance | |
JPS57178134A (en) | Specular surface defect observing device | |
JPS57113311A (en) | Measuring device for surface coarseness of object | |
FR2380601A1 (en) | Optical coin testing appts. - compares image of coin with reference image formed as mask attached to objective lens | |
JPS5735703A (en) | Film surface inspecting method | |
JPS56126741A (en) | Device for projecting and receiving light | |
JPS56146109A (en) | Photometric device | |
JPS54114261A (en) | Measuring apparatus of surface undulations | |
JPS6432151A (en) | Detector | |
JPS6317174B2 (en) | ||
JPS57182604A (en) | Interference measuring device | |
JPS577503A (en) | Measuring device for end surface of light-transmitting member | |
JPS5497469A (en) | Laser speed measuring apparatus | |
JPS5550105A (en) | Moving distance meter for movable body | |
JPS5451863A (en) | Surface roughness measuring apparatus |