JPS5753898A - Semiconductor storage device - Google Patents

Semiconductor storage device

Info

Publication number
JPS5753898A
JPS5753898A JP55126816A JP12681680A JPS5753898A JP S5753898 A JPS5753898 A JP S5753898A JP 55126816 A JP55126816 A JP 55126816A JP 12681680 A JP12681680 A JP 12681680A JP S5753898 A JPS5753898 A JP S5753898A
Authority
JP
Japan
Prior art keywords
data
reg
region
ram
flag signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55126816A
Other languages
English (en)
Other versions
JPS6325439B2 (ja
Inventor
Nobuo Tsuda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP55126816A priority Critical patent/JPS5753898A/ja
Publication of JPS5753898A publication Critical patent/JPS5753898A/ja
Publication of JPS6325439B2 publication Critical patent/JPS6325439B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Static Random-Access Memory (AREA)
JP55126816A 1980-09-12 1980-09-12 Semiconductor storage device Granted JPS5753898A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55126816A JPS5753898A (en) 1980-09-12 1980-09-12 Semiconductor storage device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55126816A JPS5753898A (en) 1980-09-12 1980-09-12 Semiconductor storage device

Publications (2)

Publication Number Publication Date
JPS5753898A true JPS5753898A (en) 1982-03-31
JPS6325439B2 JPS6325439B2 (ja) 1988-05-25

Family

ID=14944659

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55126816A Granted JPS5753898A (en) 1980-09-12 1980-09-12 Semiconductor storage device

Country Status (1)

Country Link
JP (1) JPS5753898A (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5982695A (ja) * 1982-11-02 1984-05-12 Hitachi Ltd 半導体記憶素子
JPH02108299A (ja) * 1988-10-18 1990-04-20 Toshiba Corp 半導体メモリ装置
JPH02203499A (ja) * 1989-02-02 1990-08-13 Toshiba Corp 半導体記憶装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5982695A (ja) * 1982-11-02 1984-05-12 Hitachi Ltd 半導体記憶素子
JPH0585988B2 (ja) * 1982-11-02 1993-12-09 Hitachi Ltd
JPH02108299A (ja) * 1988-10-18 1990-04-20 Toshiba Corp 半導体メモリ装置
JPH02203499A (ja) * 1989-02-02 1990-08-13 Toshiba Corp 半導体記憶装置

Also Published As

Publication number Publication date
JPS6325439B2 (ja) 1988-05-25

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