JPS5753644A - Photometric device using more than one wavelength - Google Patents

Photometric device using more than one wavelength

Info

Publication number
JPS5753644A
JPS5753644A JP12887780A JP12887780A JPS5753644A JP S5753644 A JPS5753644 A JP S5753644A JP 12887780 A JP12887780 A JP 12887780A JP 12887780 A JP12887780 A JP 12887780A JP S5753644 A JPS5753644 A JP S5753644A
Authority
JP
Japan
Prior art keywords
light
interference
prescribed
passed
interference filters
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12887780A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6321850B2 (enrdf_load_stackoverflow
Inventor
Masahiko Sakurada
Takayuki Aihara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Corp
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Corp, Olympus Optical Co Ltd filed Critical Olympus Corp
Priority to JP12887780A priority Critical patent/JPS5753644A/ja
Publication of JPS5753644A publication Critical patent/JPS5753644A/ja
Publication of JPS6321850B2 publication Critical patent/JPS6321850B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
JP12887780A 1980-09-17 1980-09-17 Photometric device using more than one wavelength Granted JPS5753644A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12887780A JPS5753644A (en) 1980-09-17 1980-09-17 Photometric device using more than one wavelength

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12887780A JPS5753644A (en) 1980-09-17 1980-09-17 Photometric device using more than one wavelength

Publications (2)

Publication Number Publication Date
JPS5753644A true JPS5753644A (en) 1982-03-30
JPS6321850B2 JPS6321850B2 (enrdf_load_stackoverflow) 1988-05-09

Family

ID=14995558

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12887780A Granted JPS5753644A (en) 1980-09-17 1980-09-17 Photometric device using more than one wavelength

Country Status (1)

Country Link
JP (1) JPS5753644A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5961760A (ja) * 1982-09-30 1984-04-09 Shimadzu Corp 光度計
JPH0357942A (ja) * 1989-07-19 1991-03-13 Hartmann & Braun Ag 干渉計形検出装置
JPH0372239A (ja) * 1989-08-03 1991-03-27 Hartmann & Braun Ag 干渉測定分析装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5961760A (ja) * 1982-09-30 1984-04-09 Shimadzu Corp 光度計
JPH0357942A (ja) * 1989-07-19 1991-03-13 Hartmann & Braun Ag 干渉計形検出装置
JPH0372239A (ja) * 1989-08-03 1991-03-27 Hartmann & Braun Ag 干渉測定分析装置

Also Published As

Publication number Publication date
JPS6321850B2 (enrdf_load_stackoverflow) 1988-05-09

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