JPS57141539A - Spectrometer for multicomponent measurement - Google Patents
Spectrometer for multicomponent measurementInfo
- Publication number
- JPS57141539A JPS57141539A JP9704179A JP9704179A JPS57141539A JP S57141539 A JPS57141539 A JP S57141539A JP 9704179 A JP9704179 A JP 9704179A JP 9704179 A JP9704179 A JP 9704179A JP S57141539 A JPS57141539 A JP S57141539A
- Authority
- JP
- Japan
- Prior art keywords
- optical axis
- spectrometer
- modulator
- regulated
- regulation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005259 measurement Methods 0.000 title abstract 4
- 230000003287 optical effect Effects 0.000 abstract 5
- 230000001105 regulatory effect Effects 0.000 abstract 3
- 230000004907 flux Effects 0.000 abstract 2
- 239000003550 marker Substances 0.000 abstract 2
- 230000008844 regulatory mechanism Effects 0.000 abstract 2
- 238000010521 absorption reaction Methods 0.000 abstract 1
- 230000001678 irradiating effect Effects 0.000 abstract 1
- 239000007788 liquid Substances 0.000 abstract 1
- 238000004452 microanalysis Methods 0.000 abstract 1
- 230000010355 oscillation Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
- G01J3/433—Modulation spectrometry; Derivative spectrometry
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Spectrometry And Color Measurement (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
PURPOSE:To perform a highly stable and accurate measurement, by arranging only one wavelength modulator in a spectrometer and providing a slit for optical axis regulation to a marker for optical axis regulation or an exit slit plate and making a slight regulation mechanism only an exit slit slight regulation mechanism. CONSTITUTION:Light from a light source 5 is made incident to a spectrometer 20 from an exit slit 21 through an absorption cell 6 for microanalysis of gas or liquid, especially for three components measurement of SO2, NO, NO2 in flue exhaust gas. Only one attachable and detachable refraction board twist oscillation type wavelength modulator 29 is provided in the spectrometer 20. At first, the modulator is taken off and a collimator mirror 22 and a diffraction grating 23, are arranged on a attachable and detachable marker 57 at a position irradiating a zero order diffraction light 4 and then, an optical axis is regulated. Or a collector mirror 25 is regulated by an exit slit 26 for optical axis regulation and the optical axis is regulated. Next, the modulator 29 is placed and luminous flux from exit slits 27, 27', 27'' of each component luminous flux are converted into signals by using inexpensive side-on type photoelectric converters 40, 40', 40''. Then, said signal is inputted into a signal processing equipment 100 to obtain the display of each component. In this manner, the measurement of three components is achieved by one apparatus.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9704179A JPS57141539A (en) | 1979-07-30 | 1979-07-30 | Spectrometer for multicomponent measurement |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9704179A JPS57141539A (en) | 1979-07-30 | 1979-07-30 | Spectrometer for multicomponent measurement |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16488284A Division JPS617427A (en) | 1984-08-08 | 1984-08-08 | Wavelength sweeping spectroscope using mirror vibrated by tuning fork |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57141539A true JPS57141539A (en) | 1982-09-01 |
JPS649564B2 JPS649564B2 (en) | 1989-02-17 |
Family
ID=14181485
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9704179A Granted JPS57141539A (en) | 1979-07-30 | 1979-07-30 | Spectrometer for multicomponent measurement |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57141539A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60170746U (en) * | 1984-04-23 | 1985-11-12 | アンリツ株式会社 | Spectrometer exit slit device |
JPS6357531U (en) * | 1986-09-30 | 1988-04-16 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5458182U (en) * | 1977-09-30 | 1979-04-21 | ||
JPS5489573A (en) * | 1977-12-27 | 1979-07-16 | Fujitsu Ltd | Semiconductor device |
-
1979
- 1979-07-30 JP JP9704179A patent/JPS57141539A/en active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5458182U (en) * | 1977-09-30 | 1979-04-21 | ||
JPS5489573A (en) * | 1977-12-27 | 1979-07-16 | Fujitsu Ltd | Semiconductor device |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60170746U (en) * | 1984-04-23 | 1985-11-12 | アンリツ株式会社 | Spectrometer exit slit device |
JPS6357531U (en) * | 1986-09-30 | 1988-04-16 |
Also Published As
Publication number | Publication date |
---|---|
JPS649564B2 (en) | 1989-02-17 |
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