JPS57108639A - Compensating method of data for evaporated part of sample - Google Patents

Compensating method of data for evaporated part of sample

Info

Publication number
JPS57108639A
JPS57108639A JP18374980A JP18374980A JPS57108639A JP S57108639 A JPS57108639 A JP S57108639A JP 18374980 A JP18374980 A JP 18374980A JP 18374980 A JP18374980 A JP 18374980A JP S57108639 A JPS57108639 A JP S57108639A
Authority
JP
Japan
Prior art keywords
sample
measured
cup
concentration
evaporation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP18374980A
Other languages
Japanese (ja)
Other versions
JPH0226190B2 (en
Inventor
Kazu Nagai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Corp
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Corp, Olympus Optical Co Ltd filed Critical Olympus Corp
Priority to JP18374980A priority Critical patent/JPS57108639A/en
Publication of JPS57108639A publication Critical patent/JPS57108639A/en
Publication of JPH0226190B2 publication Critical patent/JPH0226190B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction

Abstract

PURPOSE:To improve the measuring accuracy by a sample container having no lid in an automatic chemical analyzer, by measuring the variation in concentration due to the evaporation of a reference sample, computing its concentration ratio, and automatically compensating the measured value of the concentration of the sample to be measured. CONSTITUTION:The sample is put in a plurality of cups 12 on a tray 11, and the sample is separately injected into a reacting tube 16 at a sucking position by the rotation of sprockets 13. Then reagent is added to the reacting tube 16 from a reagent cup 17. The tube 16 is moved to a measuring position by the rotation of a turn table 21. Light is irradiated from a light source 12, and the spectral intensity of the transmitted light through the reacting tube 16 is measured by detectors 25-1-25-5 through a diffraction grating 24. At the same time the sample is set in the cup 12, the reference sample is put in a cup 27 on the tray 11, and its absorbance of the light from a light source 28 is measured at a specified wavelength. Then, the variation in concentration due to the evaporation of the reference sample 27 during the time period the sample is moved from the sample cup 12 to the reacting tube 16 is measured. The measured value is memorized 32 and compared and computed 33 with the signal from a wavelength selecting part 26. The measured value of the sample is compensated by the concentration ratio due to the evaporation, and the correct value is recorded 35 through a control device 34.
JP18374980A 1980-12-26 1980-12-26 Compensating method of data for evaporated part of sample Granted JPS57108639A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18374980A JPS57108639A (en) 1980-12-26 1980-12-26 Compensating method of data for evaporated part of sample

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18374980A JPS57108639A (en) 1980-12-26 1980-12-26 Compensating method of data for evaporated part of sample

Publications (2)

Publication Number Publication Date
JPS57108639A true JPS57108639A (en) 1982-07-06
JPH0226190B2 JPH0226190B2 (en) 1990-06-07

Family

ID=16141298

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18374980A Granted JPS57108639A (en) 1980-12-26 1980-12-26 Compensating method of data for evaporated part of sample

Country Status (1)

Country Link
JP (1) JPS57108639A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6443760A (en) * 1987-08-11 1989-02-16 Shimadzu Corp Automatic analysis apparatus
US5554811A (en) * 1993-03-02 1996-09-10 Kabushiki Kaisha Toshiba Automatic chemical analyzers with sampling systems
JP2010169581A (en) * 2009-01-23 2010-08-05 Hitachi High-Technologies Corp Automatic analyzer
JP2015526729A (en) * 2012-08-21 2015-09-10 ホリバ・エービーエックス・エスエーエスＨｏｒｉｂａ Ａｂｘ Ｓａｓ Method for compensating for aging of reagents during fluorescence measurements performed on particles, and biological analyzer implementing the method

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5245234A (en) * 1975-10-08 1977-04-09 Hitachi Ltd Device for testing circuit
JPS54115293A (en) * 1978-02-28 1979-09-07 Shimadzu Corp Data processing method of analytical apparaus

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5245234A (en) * 1975-10-08 1977-04-09 Hitachi Ltd Device for testing circuit
JPS54115293A (en) * 1978-02-28 1979-09-07 Shimadzu Corp Data processing method of analytical apparaus

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6443760A (en) * 1987-08-11 1989-02-16 Shimadzu Corp Automatic analysis apparatus
US5554811A (en) * 1993-03-02 1996-09-10 Kabushiki Kaisha Toshiba Automatic chemical analyzers with sampling systems
JP2010169581A (en) * 2009-01-23 2010-08-05 Hitachi High-Technologies Corp Automatic analyzer
JP2015526729A (en) * 2012-08-21 2015-09-10 ホリバ・エービーエックス・エスエーエスＨｏｒｉｂａ Ａｂｘ Ｓａｓ Method for compensating for aging of reagents during fluorescence measurements performed on particles, and biological analyzer implementing the method

Also Published As

Publication number Publication date
JPH0226190B2 (en) 1990-06-07

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